| 2026 | Memory ECC Logic Testing using MBIST. | Wei Zou, Artur Pogiel, Martin Keim, Albert Au, Jongsin Yun, Luc Romain |
| 2026 | TDDB Stress Test Coverage Quantification using Cell-aware Transistor State Stress Model. | Vladimir A. Zivkovic, Stephan Eggersgl, Andreas Glowatz, Daniel Tille |
| 2026 | An interpretable data-driven framework for variable group selection in high-dimensional manufacturing test data. | Yang Yang, Bin Yang, Yiwen Liao Data |
| 2026 | Iterative LLM-Based Assertion Generation Using Syntax-Semantic Representations for Functional Coverage-Guided Verification. | Yonghao Wang, Jiaxin Zhou, Yang Yin, Hongqin Lyu, Zhiteng Chao, Wenchao Ding, Jing Ye, Tiancheng Wang, Huawei Li |
| 2026 | A Chosen-Ciphertext Side-Channel Attack on Protected ML-KEM Using Pairwise Bit-Flipping. | Ruize Wang, Linus Backlund, Elena Dubrova |
| 2026 | Machine Learning Approach for Cross-Technology Prediction of the Generated Single Event Transient. | Konstantinos Varakliotis, Nikolaos Zazatis, Marko S. Andjelkovic, Nikolaos Chatzivangelis, Fabian Vargas, Milos Krstic, Christos P. Sotiriou |
| 2026 | Towards Resilient Transformer-Encoders: Fault Injection and Hardware Agnostic Error Mitigation. | Vishal Thomas, Ussama Zahid, Giulio Gambardella, Sumeet Sapkal, Haralampos-G. Stratigopoulos, Brian Clerkin |
| 2026 | Fault Model-Driven Formal Verification of Cryptographic Hardware Against Fault Attacks. | Daniel Thirion, George-Cristian Sercaianu, Valentin Egloff, Jean-Marc Daveau, Vincent Beroulle, David Hly, Philippe Roche |
| 2026 | Gremlins in the Silicon: Why Faulty Chips are Escaping the Fab and Crashing in the Field. | Mottaqiallah Taouil, R. D. Shawn Blanton, Phil Nigh, Adit D. Singh, Said Hamdioui |
| 2026 | Sample-efficient Performance Tuning of mixed-signal ASICs via Probabilistic Surrogates. | Tim Strobel, Nima Shahpari, Sarah Rottacker, Roland Rsslhuber, Jens Anders |
| 2026 | On Evaluating the Security of TRNG-driven SRAM Scrambling Architecture. | Manan Kumar Singh, Gaurav Kumar, Kashvi Bansal, Yamuna Prasad, Satyadev Ahlawat |
| 2026 | A Single-Cycle, Area-Efficient Calibration Method for TDC-based Timing Monitors. | Madiha A. Sheikh, Marco Ottavi |
| 2026 | An Elmore Delay Model Based Test Method for Post-Bond TSVs. | Zhicheng Shao, Xiaole Cui, Xiaoxin Cui |
| 2026 | Hierarchical EMFI Analysis on a RISC-V SoC. | Dillibabu Shanmugam, Zhenyuan Liu, Patrick Schaumont |
| 2026 | Structural Testing Methodology for Deep Neural Networks based on RRAM. | Emmanouil Anastasios Serlis, Emmanouil Arapidis, Theofilos Spyrou, Anteneh Gebregiorgis, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2026 | FAT-SNN: Fault-Aware Training of Flexible Analog Spiking Neural Networks Using Robust Surrogates. | Simon Schupp, Tara Gheshlaghi, Priyanjana Pal, Mehdi B. Tahoori |
| 2026 | Path Delay Fault Testable KFDD Circuits with Polynomial Test Pattern Generation. | Martha Schnieber, Rolf Drechsler |
| 2026 | Scalable Design-for-Calibration of Programmable Silicon Photonics. | Lawrence M. Schlitt, Priyank Kalla, Steve Blair |
| 2026 | NURSE: A Distributed Architecture for Runtime Fault Management in Processor Designs. | Ashwin Santhosh, Artur Jutman, Endri Kaja, Wolfgang Ecker, Maksim Jenihhin |
| 2026 | An Enhanced, Self-Adapting Asynchronous Interface for High-Frequency IJTAG Instruments In Clock Mesh Environments. | Luc Romain, Katarzyna Wojnowska, Roger Mah, Albert Au, Wei Zou, Martin Keim |
| 2026 | A Ferroelectric nvSRAM PUF with Built-In Grey Bit Masking based on FeCAP-SRAM Interactions. | Lucas Rhetat, Jean-Philippe Noel, Bastien Giraud, Laurent Grenouillet, Cdric Marchand, Ian O'Connor |
| 2026 | Using Analog IJTAG to Measure ISO 26262 Metrics. | Bartlomiej Praselski, Stephen Sunter |
| 2026 | Exploring Hybrid Brain-Inspired Architectures and Technology Heterogeneity for High Performance AI Applications: Challenges & Solutions. | Letcia Maria Bolzani Phls |
| 2026 | Special Session: Hardware Security at the Circuit and Layout Levels. | Sajjad Parvin, Carl Riehm, Nan Du, Ralf Brederlow, Frank Sill Torres, Rolf Drechsler |
| 2026 | Radiation Hardened and Self-Recoverable Latch Design for Quad-Node Upset Mitigation. | Evangelos Paparsenos, Yiorgos Tsiatouhas |