Hans-Joachim Wunderlich
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
163
Venues
16
Active years
1985–2026
Best venue rank
A*
Where they publish
Papers
163 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | DDECS | Reliability Assessment in Approximate Accelerator Synthesis. | Somayeh Sadeghi Kohan, Muhammad Awais, Qazi Arbab Ahmed, Marco Platzner, Sybille Hellebrand, Thorsten Jungeblut, Hans-Joachim Wunderlich |
| 2025 | ETS | Robust Pattern Generation for Small Delay Faults under the Impact of Variations. | Hanieh Jafarzadeh, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2024 | ETS | Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. | Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2024 | ITC | Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing. | Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2023 | DATE | Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. | Zahra Paria Najafi-Haghi, Florian Klemme, Hanieh Jafarzadeh, Hussam Amrouch, Hans-Joachim Wunderlich |
| 2023 | DSN | Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication. | Somayeh Sadeghi Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2023 | DSN | Guardband Optimization for the Preconditioned Conjugate Gradient Algorithm. | Natalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich |
| 2023 | ETS | Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips. | Payam Habiby, Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich, Sebastian Huhn, Rolf Drechsler |
| 2023 | IOLTS | Exploiting the Error Resilience of the Preconditioned Conjugate Gradient Method for Energy and Delay Optimization. | Natalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich |
| 2023 | ITC | Robust Pattern Generation for Small Delay Faults Under Process Variations. | Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2022 | DATE | Intelligent Methods for Test and Reliability. | Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, Andr van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Ksters, Andrs Lalama, Raphal Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann |
| 2022 | DATE | Robust Reconfigurable Scan Networks. | Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich |
| 2022 | ETS | On Extracting Reliability Information from Speed Binning. | Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich |
| 2022 | ITC | Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning. | Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich, Bin Yang |
| 2021 | IOLTS | Concurrent Test of Reconfigurable Scan Networks for Self-Aware Systems. | Chih-Hao Wang, Natalia Lylina, Ahmed Atteya, Tong-Yu Hsieh, Hans-Joachim Wunderlich |
| 2021 | ITC | Testability-Enhancing Resynthesis of Reconfigurable Scan Networks. | Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich |
| 2021 | VTS | A Hybrid Protection Scheme for Reconfigurable Scan Networks. | Natalia Lylina, Ahmed Atteya, Hans-Joachim Wunderlich |
| 2020 | DATE | Using Programmable Delay Monitors for Wear-Out and Early Life Failure Prediction. | Chang Liu, Eric Schneider, Hans-Joachim Wunderlich |
| 2020 | DATE | Synthesis of Fault-Tolerant Reconfigurable Scan Networks. | Sebastian Brandhofer, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2020 | DATE | GPU-accelerated Time Simulation of Systems with Adaptive Voltage and Frequency Scaling. | Eric Schneider, Hans-Joachim Wunderlich |
| 2020 | ETS | Variation-Aware Defect Characterization at Cell Level. | Zahra Paria Najafi-Haghi, Marzieh Hashemipour-Nazari, Hans-Joachim Wunderlich |
| 2020 | ITC | Logic Fault Diagnosis of Hidden Delay Defects. | Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen |
| 2020 | ITC | Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks. | Natalia Lylina, Ahmed Atteya, Chih-Hao Wang, Hans-Joachim Wunderlich |
| 2020 | VTS | Switch Level Time Simulation of CMOS Circuits with Adaptive Voltage and Frequency Scaling. | Eric Schneider, Hans-Joachim Wunderlich |
| 2019 | DATE | On Secure Data Flow in Reconfigurable Scan Networks. | Pascal Raiola, Benjamin Thiemann, Jan Burchard, Ahmed Atteya, Natalia Lylina, Hans-Joachim Wunderlich, Bernd Becker, Matthias Sauer |
| 2019 | ITC | Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses. | Stefan Holst, Eric Schneider, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich |
| 2019 | ITC | Security Compliance Analysis of Reconfigurable Scan Networks. | Natalia Lylina, Ahmed Atteya, Pascal Raiola, Matthias Sauer, Bernd Becker, Hans-Joachim Wunderlich |
| 2018 | ASPDAC | Multi-level timing simulation on GPUs. | Eric Schneider, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2018 | ETS | Online prevention of security violations in reconfigurable scan networks. | Ahmed Atteya, Michael A. Kochte, Matthias Sauer, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich |
| 2018 | ETS | Device aging: A reliability and security concern. | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi |
| 2018 | IOLTS | Detecting and Resolving Security Violations in Reconfigurable Scan Networks. | Pascal Raiola, Michael A. Kochte, Ahmed Atteya, Laura Rodrguez Gmez, Hans-Joachim Wunderlich, Bernd Becker, Matthias Sauer |
| 2017 | ETS | Specification and verification of security in reconfigurable scan networks. | Michael A. Kochte, Matthias Sauer, Laura Rodrguez Gmez, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich |
| 2017 | ETS | Probabilistic sensitization analysis for variation-aware path delay fault test evaluation. | Marcus Wagner, Hans-Joachim Wunderlich |
| 2017 | IOLTS | Energy-efficient and error-resilient iterative solvers for approximate computing. | Alexander Schll, Claus Braun, Hans-Joachim Wunderlich |
| 2017 | ITC | Analysis and mitigation or IR-Drop induced scan shift-errors. | Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen |
| 2017 | VTS | Special session on early life failures. | Jyotirmoy V. Deshmukh, Wolfgang Kunz, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2017 | VTS | Aging monitor reuse for small delay fault testing. | Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2016 | ASPDAC | Mixed 01X-RSL-Encoding for fast and accurate ATPG with unknowns. | Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker |
| 2016 | DSN | Efficient Algorithm-Based Fault Tolerance for Sparse Matrix Operations. | Alexander Schll, Claus Braun, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2016 | ETS | Formal verification of secure reconfigurable scan network infrastructure. | Michael A. Kochte, Rafal Baranowski, Matthias Sauer, Bernd Becker, Hans-Joachim Wunderlich |
| 2016 | ETS | ETS 2015 best paper. | Hans-Joachim Wunderlich, Peter C. Maxwell |
| 2016 | IOLTS | Pushing the limits: How fault tolerance extends the scope of approximate computing. | Hans-Joachim Wunderlich, Claus Braun, Alexander Schll |
| 2016 | VTS | Fault tolerance of approximate compute algorithms. | Hans-Joachim Wunderlich, Claus Braun, Alexander Schll |
| 2015 | DATE | On-line prediction of NBTI-induced aging rates. | Rafal Baranowski, Farshad Firouzi, Saman Kiamehr, Chang Liu, Mehdi Baradaran Tahoori, Hans-Joachim Wunderlich |
| 2015 | DATE | GPU-accelerated small delay fault simulation. | Eric Schneider, Stefan Holst, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich |
| 2015 | ETS | Testing visions. | Hans-Joachim Wunderlich |
| 2015 | ICCAD | STRAP: Stress-Aware Placement for Aging Mitigation in Runtime Reconfigurable Architectures. | Hongyan Zhang, Michael A. Kochte, Eric Schneider, Lars Bauer, Hans-Joachim Wunderlich, Jrg Henkel |
| 2015 | IOLTS | Efficient observation point selection for aging monitoring. | Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2015 | IOLTS | Efficient on-line fault-tolerance for the preconditioned conjugate gradient method. | Alexander Schll, Claus Braun, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2014 | DAC | Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures. | Felix Reimann, Michael Gla, Jrgen Teich, Alejandro Cook, Laura Rodrguez Gmez, Dominik Ull, Hans-Joachim Wunderlich, Piet Engelke, Ulrich Abelein |
| 2014 | DAC | GUARD: GUAranteed Reliability in Dynamically Reconfigurable Systems. | Hongyan Zhang, Michael A. Kochte, Michael E. Imhof, Lars Bauer, Hans-Joachim Wunderlich, Jrg Henkel |
| 2014 | DATE | Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures. | Ulrich Abelein, Alejandro Cook, Piet Engelke, Michael Gla, Felix Reimann, Laura Rodrguez Gmez, Thomas Russ, Jrgen Teich, Dominik Ull, Hans-Joachim Wunderlich |
| 2014 | DATE | Bit-Flipping Scan - A unified architecture for fault tolerance and offline test. | Michael E. Imhof, Hans-Joachim Wunderlich |
| 2014 | DSN | A-ABFT: Autonomous Algorithm-Based Fault Tolerance for Matrix Multiplications on Graphics Processing Units. | Claus Braun, Sebastian Halder, Hans-Joachim Wunderlich |
| 2014 | ETS | Diagnosis of multiple faults with highly compacted test responses. | Alejandro Cook, Hans-Joachim Wunderlich |
| 2014 | ETS | Variation-aware deterministic ATPG. | Matthias Sauer, Ilia Polian, Michael E. Imhof, Abdullah Mumtaz, Eric Schneider, Alexander Czutro, Hans-Joachim Wunderlich, Bernd Becker |
| 2014 | ETS | Incremental computation of delay fault detection probability for variation-aware test generation. | Marcus Wagner, Hans-Joachim Wunderlich |
| 2014 | ICCAD | Data-parallel simulation for fast and accurate timing validation of CMOS circuits. | Eric Schneider, Stefan Holst, Xiaoqing Wen, Hans-Joachim Wunderlich |
| 2014 | IOLTS | Area-efficient synthesis of fault-secure NoC switches. | Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2014 | ITC | Test pattern generation in presence of unknown values based on restricted symbolic logic. | Dominik Erb, Karsten Scheibler, Michael A. Kochte, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker |
| 2014 | ITC | FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. | Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich |
| 2014 | VTS | Structural Software-Based Self-Test of Network-on-Chip. | Atefe Dalirsani, Michael E. Imhof, Hans-Joachim Wunderlich |
| 2013 | DATE | Accurate QBF-based test pattern generation in presence of unknown values. | Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker |
| 2013 | DATE | Efficient variation-aware statistical dynamic timing analysis for delay test applications. | Marcus Wagner, Hans-Joachim Wunderlich |
| 2013 | ETS | Scan pattern retargeting and merging with reduced access time. | Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2013 | IOLTS | Efficacy and efficiency of algorithm-based fault-tolerance on GPUs. | Hans-Joachim Wunderlich, Claus Braun, Sebastian Halder |
| 2013 | ITC | Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures. | Hongyan Zhang, Lars Bauer, Michael A. Kochte, Eric Schneider, Claus Braun, Michael E. Imhof, Hans-Joachim Wunderlich, Jrg Henkel |
| 2012 | ETS | Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test. | Alejandro Cook, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2012 | ETS | Efficient system-level aging prediction. | Nadereh Hatami, Rafal Baranowski, Paolo Prinetto, Hans-Joachim Wunderlich |
| 2012 | ETS | Exact stuck-at fault classification in presence of unknowns. | Stefan Hillebrecht, Michael A. Kochte, Hans-Joachim Wunderlich, Bernd Becker |
| 2012 | ICCD | Acceleration of Monte-Carlo molecular simulations on hybrid computing architectures. | Claus Braun, Stefan Holst, Hans-Joachim Wunderlich, Juan Manuel Castillo-Sanchez, Joachim Gross |
| 2012 | IOLTS | Transparent structural online test for reconfigurable systems. | Mohamed Abdelfattah, Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang, Jrg Henkel, Hans-Joachim Wunderlich |
| 2012 | ITC | Modeling, verification and pattern generation for reconfigurable scan networks. | Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2012 | VTS | A pseudo-dynamic comparator for error detection in fault tolerant architectures. | D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Michael E. Imhof, Hans-Joachim Wunderlich |
| 2011 | DATE | SAT-based fault coverage evaluation in the presence of unknown values. | Michael A. Kochte, Hans-Joachim Wunderlich |
| 2011 | ETS | Structural In-Field Diagnosis for Random Logic Circuits. | Alejandro Cook, Melanie Elm, Hans-Joachim Wunderlich, Ulrich Abelein |
| 2011 | ETS | Structural Test for Graceful Degradation of NoC Switches. | Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich |
| 2011 | ETS | Towards Variation-Aware Test Methods. | Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell |
| 2011 | IOLTS | Fail-safety in core-based system design. | Rafal Baranowski, Hans-Joachim Wunderlich |
| 2011 | IOLTS | Soft error correction in embedded storage elements. | Michael E. Imhof, Hans-Joachim Wunderlich |
| 2011 | ISLPED | SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. | Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich |
| 2011 | ITC | P-PET: Partial pseudo-exhaustive test for high defect coverage. | Abdullah Mumtaz, Michael E. Imhof, Hans-Joachim Wunderlich |
| 2010 | DAC | Efficient fault simulation on many-core processors. | Michael A. Kochte, Marcel Schaal, Hans-Joachim Wunderlich, Christian G. Zoellin |
| 2010 | DATE | BISD: Scan-based Built-In self-diagnosis. | Melanie Elm, Hans-Joachim Wunderlich |
| 2010 | DSN | Massive statistical process variations: A grand challenge for testing nanoelectronic circuits. | Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich |
| 2010 | ETS | Algorithm-based fault tolerance for many-core architectures. | Claus Braun, Hans-Joachim Wunderlich |
| 2010 | ITC | System reliability evaluation using concurrent multi-level simulation of structural faults. | Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto |
| 2010 | ITC | Parity prediction synthesis for nano-electronic gate designs. | D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich |
| 2010 | VTS | Low-power test planning for arbitrary at-speed delay-test clock schemes. | Christian G. Zoellin, Hans-Joachim Wunderlich |
| 2009 | DATE | A diagnosis algorithm for extreme space compaction. | Stefan Holst, Hans-Joachim Wunderlich |
| 2009 | DATE | Test exploration and validation using transaction level models. | Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Rauf Salimi Khaligh, Martin Radetzki, Hans-Joachim Wunderlich, Stefano Di Carlo, Paolo Prinetto |
| 2009 | ETS | Test Encoding for Extreme Response Compaction. | Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich |
| 2009 | ETS | Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead. | Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich |
| 2009 | VTS | Restrict Encoding for Mixed-Mode BIST. | Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jrgen Schlffel, Friedrich Hapke, Andreas Glowatz |
| 2008 | DAC | Scan chain clustering for test power reduction. | Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mding |
| 2008 | DATE | Scan Chain Organization for Embedded Diagnosis. | Melanie Elm, Hans-Joachim Wunderlich |
| 2008 | ETS | Adaptive Debug and Diagnosis without Fault Dictionaries. | Stefan Holst, Hans-Joachim Wunderlich |
| 2008 | ETS | Selective Hardening in Early Design Steps. | Christian G. Zoellin, Hans-Joachim Wunderlich, Ilia Polian, Bernd Becker |
| 2008 | IOLTS | Integrating Scan Design and Soft Error Correction in Low-Power Applications. | Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin |
| 2008 | VTS | Signature Rollback - A Technique for Testing Robust Circuits. | Uranmandakh Amgalan, Christian Hachmann, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2007 | DAC | Scan Test Planning for Power Reduction. | Michael E. Imhof, Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mding, Jens Leenstra |
| 2007 | DDECS | Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. | Philipp hler, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2007 | ETS | Adaptive Debug and Diagnosis without Fault Dictionaries. | Stefan Holst, Hans-Joachim Wunderlich |
| 2007 | ETS | An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. | Philipp hler, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2007 | ITC | Programmable deterministic Built-In Self-Test. | Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jrgen Schlffel, Laurent Souef |
| 2006 | DATE | Software-based self-test of processors under power constraints. | Jun Zhou, Hans-Joachim Wunderlich |
| 2006 | ETS | Deterministic Logic BIST for Transition Fault Testing. | Valentin Gherman, Hans-Joachim Wunderlich, Jrgen Schlffel, Michael Garbers |
| 2006 | ITC | BIST Power Reduction Using Scan-Chain Disable in the Cell Processor. | Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mding, Jens Leenstra |
| 2005 | ETS | From embedded test to embedded diagnosis. | Hans-Joachim Wunderlich |
| 2005 | FPL | On the Reliability Evaluation of SRAM-Based FPGA Designs. | Olivier Hron, Talal Arnaout, Hans-Joachim Wunderlich |
| 2005 | GI | Software-basierender Selbsttest von Prozessorkernen unter Verlustleistungsbeschrnkung. | Jun Zhou, Hans-Joachim Wunderlich |
| 2005 | ISCAS | Development of an audio player as system-on-a-chip using an open source platform. | Pattara Kiatisevi, Luis Leonardo Azuara-Gomez, Rainer Dorsch, Hans-Joachim Wunderlich |
| 2005 | VTS | Implementing a Scheme for External Deterministic Self-Test. | Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Valentin Gherman, Michael Garbers, Jrgen Schlffel |
| 2004 | DATE | Impact of Test Point Insertion on Silicon Area and Timing during Layout. | Harald P. E. Vranken, Ferry Syafei Sapei, Hans-Joachim Wunderlich |
| 2004 | ITC | Efficient Pattern Mapping for Deterministic Logic BIST. | Valentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers |
| 2004 | ITC | X-Masking During Logic BIST and Its Impact on Defect Coverage. | Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker |
| 2002 | ETS | RESPIN++ - deterministic embedded test. | Lars Schfer, Rainer Dorsch, Hans-Joachim Wunderlich |
| 2002 | ETS | Combining deterministic logic BIST with test point insertion. | Harald P. E. Vranken, Florian Meister, Hans-Joachim Wunderlich |
| 2002 | ITC | Adapting an SoC to ATE Concurrent Test Capabilities. | Rainer Dorsch, Ramn Huerta Rivera, Hans-Joachim Wunderlich, Martin Fischer |
| 2001 | DATE | On applying the set covering model to reseeding. | Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto, Hans-Joachim Wunderlich |
| 2001 | DATE | Using mission logic for embedded testing. | Rainer Dorsch, Hans-Joachim Wunderlich |
| 2001 | DATE | Circuit partitioning for efficient logic BIST synthesis. | Alexander Irion, Gundolf Kiefer, Harald P. E. Vranken, Hans-Joachim Wunderlich |
| 2001 | ETS | Reusing scan chains for test pattern decompression. | Rainer Dorsch, Hans-Joachim Wunderlich |
| 2001 | ITC | Tailoring ATPG for embedded testing. | Rainer Dorsch, Hans-Joachim Wunderlich |
| 2001 | ITC | Using a hierarchical DfT methodology in high frequency processor designs for improved delay fault testability. | Michael Kessler, Gundolf Kiefer, Jens Leenstra, Knut Schnemann, Thomas Schwarz, Hans-Joachim Wunderlich |
| 2001 | ITC | Two-dimensional test data compression for scan-based deterministic BIST. | Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2001 | VTS | A Modified Clock Scheme for a Low Power BIST Test Pattern Generator. | Patrick Girard, Los Guiller, Christian Landrault, Serge Pravossoudovitch, Hans-Joachim Wunderlich |
| 2000 | DATE | Optimal Hardware Pattern Generation for Functional BIST. | Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wunderlich |
| 2000 | ITC | Non-intrusive BIST for systems-on-a-chip. | Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wunderlich |
| 2000 | ITC | A mixed mode BIST scheme based on reseeding of folding counters. | Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang |
| 2000 | ITC | Application of deterministic logic BIST on industrial circuits. | Gundolf Kiefer, Hans-Joachim Wunderlich, Harald P. E. Vranken, Erik Jan Marinissen |
| 1999 | DATE | Symmetric Transparent BIST for RAMs. | Sybille Hellebrand, Hans-Joachim Wunderlich, Vyacheslav N. Yarmolik |
| 1999 | EDCC | Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms. | Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 1999 | ETS | Deterministic BIST with partial scan. | Gundolf Kiefer, Hans-Joachim Wunderlich |
| 1999 | ITC | Minimized power consumption for scan-based BIST. | Stefan Gerstendrfer, Hans-Joachim Wunderlich |
| 1999 | VTS | Error Detecting Refreshment for Embedded DRAMs. | Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik |
| 1998 | DATE | Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs. | Vyacheslav N. Yarmolik, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 1998 | ITC | Accumulator based deterministic BIST. | Rainer Dorsch, Hans-Joachim Wunderlich |
| 1998 | ITC | Deterministic BIST with multiple scan chains. | Gundolf Kiefer, Hans-Joachim Wunderlich |
| 1998 | VTS | Fast Self-Recovering Controllers. | Andre Hertwig, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 1997 | DATE | Fast controllers for data dominated applications. | Andre Hertwig, Hans-Joachim Wunderlich |
| 1997 | ITC | Using BIST Control for Pattern Generation. | Gundolf Kiefer, Hans-Joachim Wunderlich |
| 1997 | VTS | Power Dissipation During Testing: Should We Worry About it? | Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian |
| 1996 | DATE | Deterministic Pattern Generation for Weighted Random Pattern Testing. | Birgit Reeb, Hans-Joachim Wunderlich |
| 1996 | ICCAD | Bit-flipping BIST. | Hans-Joachim Wunderlich, Gundolf Kiefer |
| 1996 | ITC | Mixed-Mode BIST Using Embedded Processors. | Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig |
| 1995 | DATE | Synthesis of I | Hans-Joachim Wunderlich, M. Herzog, Joan Figueras, Juan A. Carrasco, Angel Caldern |
| 1995 | ICCAD | Pattern generation for a deterministic BIST scheme. | Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, Hans-Joachim Wunderlich |
| 1995 | ICCAD | Test register insertion with minimum hardware cost. | Albrecht P. Stroele, Hans-Joachim Wunderlich |
| 1994 | ICCAD | An efficient procedure for the synthesis of fast self-testable controller structures. | Sybille Hellebrand, Hans-Joachim Wunderlich |
| 1994 | ITC | Simulation Results of an Efficient Defect-Analysis Procedure. | Olaf Stern, Hans-Joachim Wunderlich |
| 1994 | ITC | Configuring Flip-Flops to BIST Registers. | Albrecht P. Stroele, Hans-Joachim Wunderlich |
| 1991 | DAC | A Unified Approach for the Synthesis of Self-Testable Finite State Machines. | Bernhard Eschermann, Hans-Joachim Wunderlich |
| 1991 | ITC | A Common Approach to Test Generation and Hardware Verification Based on Temporal Logic. | Thomas Kropf, Hans-Joachim Wunderlich |
| 1990 | ITC | Generating pseudo-exhaustive vectors for external testing. | Sybille Hellebrand, Hans-Joachim Wunderlich, Oliver F. Haberl |
| 1990 | ITC | Error masking in self-testable circuits. | Albrecht P. Stroele, Hans-Joachim Wunderlich |
| 1989 | ITC | The Pseudo-Exhaustive Test of Sequential Circuits. | Sybille Hellebrand, Hans-Joachim Wunderlich |
| 1988 | GI | Automatisierung des Entwurfs vollstndig testbarer Schaltungen. | Sybille Hellebrand, Hans-Joachim Wunderlich |
| 1988 | ITC | Multiple Distributions for Biased Random Test Patterns. | Hans-Joachim Wunderlich |
| 1987 | DAC | On Computing Optimized Input Probabilities for Random Tests. | Hans-Joachim Wunderlich |
| 1986 | DAC | On fault modeling for dynamic MOS circuits. | Hans-Joachim Wunderlich, Wolfgang Rosenstiel |
| 1985 | DAC | PROTEST: a tool for probabilistic testability analysis. | Hans-Joachim Wunderlich |