Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
ITC
/
Paper
Multiple Distributions for Biased Random Test Patterns.
Hans-Joachim Wunderlich
Venue
A
ITC
Year
1988
Proceedings
ITC
DBLP record
conf/itc/Wunderlich88 ↗
Browse the full
ITC paper archive
.