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On-Line Testing and Robust System Design

IOLTS

C

CORE rank

CORE rank (raw)

C

Fields of research

Computer Systems Engineering · Software Engineering

Papers indexed

1,346

2000–2026

Best Software Engineering conferencesBest Computer Systems Engineering conferences

Papers per year

200069 peak2026

Most published authors

IOLTS papers

1,346 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2026Sandbox-Enabled Digital Twin for Cyber-Physical Systems.Meet Udeshi, Md Raz, Prashanth Krishnamurthy, Ramesh Karri, Farshad Khorrami
2026Evaluating Runtime Protection Opportunities in AI Inference through Microarchitectural Fault Injection.Maria Trakosa, Odysseas Chatzopoulos, Dimitris Gizopoulos
2026Reducing Safety False-Positives in Parity-Based Security AES Using a Hardware Fault Classifier.Daniel Thirion, Jean-Marc Daveau, Valentin Egloff, Vincent Beroulle, Philippe Roche, David Hly
2026Evaluation of FPGA Delay Injection Mechanisms for Small Delay Fault Analysis.Tijmen T. Smit, David Postema, Pieter Paasman, Marco Ottavi
2026Early-Stage Reliability Assessment of Tensor-Based Deep Learning Accelerators.Robert Limas Sierra, Alessandro Veronesi, Josie E. Rodriguez Condia, Letcia Maria Bolzani Phls, Matteo Sonza Reorda
2026LOFT: Latent-Fault Optimization Training for Yield Boost in Resistive Crossbar AI Accelerators.Shanmukha Mangadahalli Siddaramu, Mehdi B. Tahoori
2026Reliability of Multilevel Cell Phase-Change Memories for AI Implementations.G. Settegrani, R. Gattoni, Sara Cret, Matteo Naldi, Martin Omaa, Cecilia Metra, I. S. Troja
2026PATCH-FFT: Unmasking Dormant Hardware Trojans with Patch-Based Frequency-Domain Transformers.Hasala Senevirathne, Amin Rezaei
2026GINx4TL: Fine-grained Hardware Trojan Localization and Extraction Using Feature Explainable Graph Isomorphism Network.Afjal Hossan Sarower, Rozhin Yasaei
2026When AI Designs AI Hardware: Reliability Lessons from Accelerator Architectures.Anton Rozen, Freddy Gabbay
2026Efficiently Mitigating Model Extraction Attacks against Neural Networks on Edge Devices.Antonio Porsia, Giuseppe Monteasi, Annachiara Ruospo, Domenico Galdiero, Ernesto Snchez
2026Thermal Laser Stimulation of Bulk Built-In Current Sensors in Silicon Devices.Hugo Perrin, Jean-Baptiste Rigaud, Raphael Viera
2026Vectorized in-Place CRC: a Zero Memory-Overhead Fault Detection Scheme for QNNs on RISC-V.Giacomo Perlo, Annachiara Ruospo, Ernesto Snchez
2026Trust, but Verify: Reliable Compute-in-Memory via Double-Reference Sensing and Selective Recompute.Ali Nezhadi, Odysseas Chatzopoulos, Dimitris Gizopoulos, Mehdi B. Tahoori
2026Statistical Analysis of Architectural Vulnerability Factor for Soft Errors.Alessandra Nardi, David Kingston, Ghani Kanawati, Gourav Goyal, Mouadh Ayache, David Johnson, Jean-Marc Forey
2026Functional Self-Test for Deep Neural Networks.Dina A. Moussa, Michael Hefenbrock, Mehdi B. Tahoori
2026Hybrid Hardening for Robust DNNs Under Adversarial Attacks.Leonardo Alexandrino De Melo, Manar Gani, Alberto Bosio, Ovidiu Stan, Vlad-Cristian Miclea, Liviu Miclea, Rodrigo Possamai Bastos, David Novo, Bastien Deveautour
2026Efficient Multiple Error Correction in Binary HDC Systems Using Majority-Encoded Hypervector Matrices.Mohamed Mejri, Abhijit Chatterjee
2026Trustworthy Neuromorphic and Quantum Machine Learning: Challenges and Emerging Directions.Alberto Marchisio, Muhammad Shafique
2026TroPUF: Evaluating Hardware Trojan Insertion in Delay-Based Physical Unclonable Functions.Marissa Marcarelli, Amin Rezaei
2026FD-SOI rather than Bulk - Experimental investigation of laser induced fault mechanisms in FD-SOI.Loc Mangin, Krishna Pradeep, Romain Wacquez, Laurent Maingault, Philippe Flatresse, Adri Calvo Bellocq, Rainer Lutz
2026Impact of Locations of Circuit Components on Multiple Cell Upset Mitigation in a 22 nm Bulk Process.Shuhei Mandai, Ryuichi Nakajima, Arata Matsumoto, Yusaku Nakaoka, Hikaru Nakamoto, Sotaro Taniguchi, Shinobu Onoda, Jun Furuta, Kazutoshi Kobayashi
2026Progressive Error-Aware ECC Techniques for Enhancing Flash Memory Reliability.Shyue-Kung Lu, Jie-Xin Shi, Shi-Yu Huang, Kohei Miyase
2026InjectV: Modeling Fault Injection Attacks in RISC-V Simulation Environment.Niccol Lentini, Giorgio Fardo, Stefano Di Carlo, Alessandro Savino
2026Reality Check for RISC-V: Assessing Software Maturity, Performance and Security.Elia Lazzeri, Gianluca Furano, Luca Cassano
1–25 of 1,346← PreviousNext →

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