| 2026 | DATE | Adaptive Testing of Compute-in-Memory GANs Using Backpropagation-Guided Test Compaction. | Anurup Saha, Ashiqur Rasul, Thomas Walton, Amirali Aghazadeh, Abhijit Chatterjee |
| 2026 | ETS | CODA: Confidence-Driven Adaptive Testing of Analog/Mixed-Signal Circuits Using Gaussian Mixture Models. | Ankush, Ashiqur Rasul, Anurup Saha, Abhijit Chatterjee |
| 2026 | IOLTS | Error-Resilient State-Space Networks Using Low-Precision Recovery Models. | Jackson Isenberg, Mohamed Mejri, Abhijit Chatterjee |
| 2026 | IOLTS | Variation-Aware Training and Post-Manufacture Tuning of ReRAM Crossbar-Based Hyperdimensional Computing Systems. | Sai Pranav Komaragiri, Anurup Saha, Mohamed Mejri, Abhijit Chatterjee |
| 2026 | IOLTS | Efficient Multiple Error Correction in Binary HDC Systems Using Majority-Encoded Hypervector Matrices. | Mohamed Mejri, Abhijit Chatterjee |
| 2025 | DATE | EGIS: Entropy Guided Image Synthesis for Dataset-Agnostic Testing of RRAM-Based DNNs. | Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2025 | ETS | Confidence Driven Compact Testing of Compute-in-Memory Based Language Models. | Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee |
| 2025 | HiPC | On-the-Fly Machine Learning Interatomic Potential for Bulk PdH: Assessing Accuracy and Efficiency. | Poonam Parkar, Sudarshan Vijay, Abhijit Chatterjee |
| 2025 | IOLTS | Adaptive Testing of Compute-in-Memory Based CNNs Using Probabilistic Test Acceptance Limits. | Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Moinuddin Qureshi, Abhijit Chatterjee |
| 2025 | ITC | Efficient Delay Fault Characterization of Resistive Open Defects in Standard Cells Using Resistive Fault Dominance. | Gowsika Dharmaraj, Abhijit Chatterjee, Adit D. Singh, Arani Sinha |
| 2024 | ASPDAC | Signature Driven Post-Manufacture Testing and Tuning of RRAM Spiking Neural Networks for Yield Recovery. | Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee |
| 2024 | DATE | Learning Assisted Post-Manufacture Testing and Tuning of RRAM-Based DNNs for Yield Recovery. | Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2024 | ETS | AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate. | Suhasini Komarraju, Mohamed Mejri, Akhil Tammana, Gowsika Dharmaraj, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2024 | ETS | Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery. | Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2024 | IOLTS | Efficient Optimized Testing of Resistive RAM Based Convolutional Neural Networks. | Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2024 | ITC | TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering. | Suhasini Komarraju, Mohamed Mejri, Abhijit Chatterjee, Suriyaprakash Natarajan, Prashant Goteti |
| 2024 | VTS | Error Resilient Hyperdimensional Computing Using Hypervector Encoding and Cross-Clustering. | Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2023 | ETS | Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression. | Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2023 | ETS | A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks. | Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2023 | IOLTS | A Novel Approach to Error Resilience in Online Reinforcement Learning. | Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2023 | ITC | OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems. | Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2022 | DATE | Self-Aware MIMO Beamforming Systems: Dynamic Adaptation to Channel Conditions and Manufacturing Variability. | Suhasini Komarraju, Abhijit Chatterjee |
| 2022 | IOLTS | Soft Error Resilient Deep Learning Systems Using Neuron Gradient Statistics. | Chandramouli N. Amarnath, Mohamed Mejri, Kwondo Ma, Abhijit Chatterjee |
| 2022 | ITC | ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug of AMS Circuits. | Jun-Yang Lei, Abhijit Chatterjee |
| 2022 | ITC | Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for Deep Neural Networks. | Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2021 | ASPDAC | Automatic Surrogate Model Generation and Debugging of Analog/Mixed-Signal Designs Via Collaborative Stimulus Generation and Machine Learning. | Jun-Yang Lei, Abhijit Chatterjee |
| 2021 | ICRA | Safety Uncertainty in Control Barrier Functions using Gaussian Processes. | Mouhyemen Khan, Tatsuya Ibuki, Abhijit Chatterjee |
| 2021 | IOLTS | Addressing Soft Error and Security Threats in DNNs Using Learning Driven Algorithmic Checks. | Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee |
| 2021 | IOLTS | Online Fast Detection and Diagnosis of Power Grid Security Attacks Using State Checksums. | Suvadeep Banerjee, Abhijit Chatterjee |
| 2021 | ITC | Hierarchical Failure Modeling and Machine Learning Assisted Correction of Electro-Mechanical Subsystem Failures in Autonomous Vehicles. | Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee |
| 2021 | VTS | Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. | Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
| 2020 | IJCAI | Diagnosing Software Faults Using Multiverse Analysis. | Prantik Chatterjee, Abhijit Chatterjee, Jos Campos, Rui Abreu, Subhajit Roy |
| 2020 | IOLTS | Encoded Check Driven Concurrent Error Detection in Particle Filters for Nonlinear State Estimation. | Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee |
| 2020 | IROS | Multi-Sparse Gaussian Process: Learning based Semi-Parametric Control. | Mouhyemen Khan, Akash Patel, Abhijit Chatterjee |
| 2020 | ITC | Fast EVM Tuning of MIMO Wireless Systems Using Collaborative Parallel Testing and Implicit Reward Driven Learning. | Suhasini Komarraju, Abhijit Chatterjee |
| 2020 | ITC | Concurrent Error Detection in Embedded Digital Control of Nonlinear Autonomous Systems Using Adaptive State Space Checks. | Md Imran Momtaz, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2020 | ITC | SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. | Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
| 2019 | FUSION | Closed-Loop Multi-Satellite Scheduling Based on Hierarchical MDP. | Ratnasingham Tharmarasa, Abhijit Chatterjee, Yinghui Wang, Thia Kirubarajan, Jean Berger, Mihai Cristian Florea |
| 2019 | IOLTS | Hierarchical Check Based Detection and Diagnosis of Sensor-Actuator Malfunction in Autonomous Systems: A Quadcopter Study. | Md Imran Momtaz, Abhijit Chatterjee |
| 2019 | ITC | Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology. | Sujay Pandey, Sanya Gupta, Madhu Sudhan L., Suriya Natarajan, Arani Sinha, Abhijit Chatterjee |
| 2019 | VTS | Mixed Signal Design Validation Using Reinforcement Learning Guided Stimulus Generation for Behavior Discovery. | Barry John Muldrey, Suvadeep Banerjee, Abhijit Chatterjee |
| 2018 | ETS | Device aging: A reliability and security concern. | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi |
| 2018 | ETS | ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks. | Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee |
| 2018 | IOLTS | Cross-Layer Control Adaptation for Autonomous System Resilience. | Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee |
| 2018 | IOLTS | Error Resilient Neuromorphic Networks Using Checker Neurons. | Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee |
| 2017 | DATE | BISCC: Efficient pre through post silicon validation of mixed-signal/RF systems using built in state consistency checking. | Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee |
| 2017 | ETS | Real-time self-learning for control law adaptation in nonlinear systems using encoded check states. | Suvadeep Banerjee, Abhijit Chatterjee |
| 2017 | IOLTS | Design of efficient error resilience in signal processing and control systems: From algorithms to circuits. | Jacob A. Abraham, Suvadeep Banerjee, Abhijit Chatterjee |
| 2017 | IOLTS | Probabilistic error detection and correction in switched capacitor circuits using checksum codes. | Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee |
| 2017 | ITC | Concurrent built in test and tuning of beamforming MIMO systems using learning assisted performance optimization. | Sabyasachi Deyati, Barry J. Muldrey, Byunghoo Jung, Abhijit Chatterjee |
| 2017 | VLSID | Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware. | Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee |
| 2017 | VTS | On-line diagnosis and compensation for parametric failures in linear state variable circuits and systems using time-domain checksum observers. | Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee |
| 2016 | IOLTS | Concurrent error detection and tolerance in Kalman filters using encoded state and statistical covariance checks. | Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee |
| 2016 | ITC | Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states. | Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham |
| 2016 | ITC | DE-LOC: Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems. | Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee |
| 2016 | VLSID | Design of Self Calibrating and Error Resilient Mixed-Signal Systems for Signal Processing, Communications and Control. | Jacob A. Abraham, Abhijit Chatterjee |
| 2016 | VLSID | TRAP: Test Generation Driven Classification of Analog/RF ICs Using Adaptive Probabilistic Clustering Algorithm. | Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee |
| 2016 | VTS | Adaptive testing of analog/RF circuits using hardware extracted FSM models. | Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee |
| 2016 | VTS | Real-time DC motor error detection and control compensation using linear checksums. | Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee |
| 2015 | ETS | An FPGA-based ATE extension module for low-cost multi-GHz memory test. | David C. Keezer, Te-Hui Chen, Thomas Moon, D. T. Stonecypher, Abhijit Chatterjee, Hyun Woo Choi, Sungyeol Kim, Hosun Yoo |
| 2015 | ICCAD | Self Learning Analog/Mixed-Signal/RF Systems: Dynamic Adaptation to Workload and Environmental Uncertainties. | Debashis Banerjee, Shreyas Sen, Abhijit Chatterjee |
| 2015 | IOLTS | Concurrent error detection in nonlinear digital filters using checksum linearization and residue prediction. | Suvadeep Banerjee, Md Imran Momtaz, Abhijit Chatterjee |
| 2015 | IOLTS | Self-awareness and self-learning for resiliency in real-time systems. | Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee |
| 2015 | VLSID | Tutorial T3: Error Resilient Real-Time Embedded Systems: Computing, Communications and Control. | Jacob A. Abraham, Abhijit Chatterjee |
| 2015 | VLSID | A Noise Aware CML Latch Modelling for Large System Simulation. | Debesh Bhatta, Suvadeep Banerjee, Abhijit Chatterjee |
| 2015 | VTS | Low cost high frequency signal synthesis: Application to RF channel interference testing. | Xian Wang, Debashis Banerjee, Abhijit Chatterjee |
| 2014 | ETS | Design of low cost fault tolerant analog circuits using real-time learned error compensation. | Suvadeep Banerjee, lvaro Gmez-Pau, Abhijit Chatterjee |
| 2014 | ICCAD | Self-learning MIMO-RF receiver systems: process resilient real-time adaptation to channel conditions for low power operation. | Debashis Banerjee, Barry John Muldrey, Shreyas Sen, Xian Wang, Abhijit Chatterjee |
| 2014 | IOLTS | Real-time transient error and induced noise cancellation in linear analog filters using learning-assisted adaptive analog checksums. | lvaro Gmez-Pau, Suvadeep Banerjee, Abhijit Chatterjee |
| 2014 | ITC | Low cost back end signal processing driven bandwidth interleaved signal acquisition using free running undersampling clocks and mixing signals. | Nicholas Tzou, Debesh Bhatta, Abhijit Chatterjee |
| 2014 | ITC | A self-tuning architecture for buck converters based on alternative test. | Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee |
| 2014 | VLSID | Timing Variation Adaptive Pipeline Design: Using Probabilistic Activity Completion Sensing with Backup Error Resilience. | Jayaram Natarajan, Sahil Kapoor, Debesh Bhatta, Abhijit Chatterjee, Adit D. Singh |
| 2014 | VTS | Atomic model learning: A machine learning paradigm for post silicon debug of RF/analog circuits. | Sabyasachi Deyati, Barry John Muldrey, Aritra Banerjee, Abhijit Chatterjee |
| 2014 | VTS | Phase-locked loop design with SPO detection and charge pump trimming for reference spur suppression. | Sen-Wen Hsiao, Chung-Chun Chen, Randy Caplan, Jeff Galloway, Blake Gray, Abhijit Chatterjee |
| 2014 | VTS | Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms. | Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee |
| 2014 | VTS | Alternative "safe" test of hysteretic power converters. | Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee |
| 2013 | DAC | Real-time use-aware adaptive MIMO RF receiver systems for energy efficiency under BER constraints. | Debashis Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee |
| 2013 | DATE | Periodic jitter and bounded uncorrelated jitter decomposition using incoherent undersampling. | Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Abhijit Chatterjee |
| 2013 | ETS | Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters. | Shyam Kumar Devarakond, Debashis Banerjee, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee |
| 2013 | IOLTS | Real-time checking of linear control systems using analog checksums. | Suvadeep Banerjee, Aritra Banerjee, Abhijit Chatterjee, Jacob A. Abraham |
| 2013 | ISCAS | An adaptive class-E power amplifier with improvement in efficiency, reliability and process variation tolerance. | Aritra Banerjee, Abhijit Chatterjee |
| 2013 | VLSID | Adaptive RF Front-end Design via Self-discovery: Using Real-time Data to Optimize Adaptation Control. | Debashis Banerjee, Aritra Banerjee, Abhijit Chatterjee |
| 2013 | VLSID | VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests. | Sabyasachi Deyati, Aritra Banerjee, Barry John Muldrey, Abhijit Chatterjee |
| 2013 | VLSID | A High Throughput Multiplier Design Exploiting Input Based Statistical Distribution in Completion Delays. | Ravi Tej Uppu, Ravi Kanth Uppu, Adit D. Singh, Abhijit Chatterjee |
| 2013 | VTS | A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection. | Sen-Wen Hsiao, Nicholas Tzou, Abhijit Chatterjee |
| 2013 | VTS | Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling. | Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee |
| 2013 | VTS | RAVAGE: Post-silicon validation of mixed signal systems using genetic stimulus evolution and model tuning. | Barry John Muldrey, Sabyasachi Deyati, Michael Giardino, Abhijit Chatterjee |
| 2012 | ETS | Testing of digitally assisted adaptive analog/RF systems using tuning knob - Performance space estimation. | Aritra Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Debashis Banerjee, Abhijit Chatterjee |
| 2012 | ICCAD | Validation signature testing: A methodology for post-silicon validation of analog/mixed-signal circuits. | Abhijit Chatterjee, Sabyasachi Deyati, Barry John Muldrey, Shyam Kumar Devarakond, Aritra Banerjee |
| 2012 | IOLTS | Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis. | Sabyasachi Deyati, Aritra Banerjee, Abhijit Chatterjee |
| 2012 | ISLPED | Low-power adaptive RF system design using real-time fuzzy noise-distortion control. | Debashis Banerjee, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee |
| 2012 | ITC | Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling. | Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee |
| 2012 | ITC | Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization. | Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Hyun Woo Choi, Abhijit Chatterjee |
| 2012 | ITC | Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters. | Xian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee |
| 2012 | VLSID | Power Aware Post-Manufacture Tuning of MIMO Receiver Systems. | Debashis Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee |
| 2012 | VLSID | Real-Time, Content Aware Camera - Algorithm - Hardware Co-Adaptation for Minimal Power Video Encoding. | Joshua W. Wells, Jayaram Natarajan, Abhijit Chatterjee, Irtaza Barlas |
| 2012 | VTS | Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise. | Thomas Moon, Nicholas Tzou, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee |
| 2012 | VTS | Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution. | Nicholas Tzou, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee |
| 2011 | ETS | Power Aware Post-manufacture Tuning of Analog Nanocircuits. | Aritra Banerjee, Subho Chatterjee, Azad Naeemi, Abhijit Chatterjee |
| 2011 | ETS | Signature Testing and Diagnosis of High Precision S? ADC Dynamic Specifications Using Model Parameter Estimation. | Sehun Kook, Aritra Banerjee, Abhijit Chatterjee |
| 2011 | IOLTS | Real time cross-layer adaptation for minimum energy wireless image transport using bit error rate control. | Jayaram Natarajan, Shreyas Sen, Abhijit Chatterjee |
| 2011 | ISCAS | Orthogonally tunable inductorless RF LNA for adaptive wireless systems. | Shreyas Sen, Marian Verhelst, Abhijit Chatterjee |
| 2011 | ITC | Accurate signature driven power conscious tuning of RF systems using hierarchical performance models. | Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee |
| 2011 | VLSID | Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. | Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya |
| 2011 | VTS | Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. | Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee |
| 2010 | ETS | Invited talk: Self-aware wireless communication and signal processing systems: Real-time adaptation for error resilience, low power and performance. | Abhijit Chatterjee |
| 2010 | IOLTS | Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation. | Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Abhijit Chatterjee |
| 2010 | IOLTS | Error resilient video encoding using Block-Frame Checksums. | Joshua W. Wells, Jayaram Natarajan, Abhijit Chatterjee |
| 2010 | VTS | Low cost test and tuning of RF circuits and systems. | Abhijit Chatterjee, Friedrich Taenzler |
| 2010 | VTS | Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. | Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2010 | VTS | A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations. | Vishwanath Natarajan, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee |
| 2009 | DATE | A novel self-healing methodology for RF Amplifier circuits based on oscillation principles. | Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee |
| 2009 | DDECS | Cognitive self-adaptive computing and communication systems: Test, control and adaptation. | Abhijit Chatterjee |
| 2009 | DDECS | BIST assisted wideband digital compensation for MB-UWB transmitters. | Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee |
| 2009 | ETS | Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. | Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin |
| 2009 | ICCD | Iterative built-in testing and tuning of mixed-signal/RF systems. | Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan |
| 2009 | IOLTS | Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. | Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Christos A. Papachristou |
| 2009 | IOLTS | Aggressively voltage overscaled adaptive RF systems using error control at the bit and symbol levels. | Jayaram Natarajan, Gokul Kumar, Shreyas Sen, Muhammad Mudassar Nisar, Deuk Lee, Abhijit Chatterjee |
| 2009 | ITC | Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations. | Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee |
| 2009 | VLSID | Environment and Process Adaptive Low Power Wireless Baseband Signal Processing Using Dual Real-Time Feedback. | Muhammad Mudassar Nisar, Abhijit Chatterjee |
| 2008 | DAC | Pro-VIZOR: process tunable virtually zero margin low power adaptive RF for wireless systems. | Shreyas Sen, Vishwanath Natarajan, Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2008 | DATE | Digital bit stream jitter testing using jitter expansion. | Hyun Woo Choi, Abhijit Chatterjee |
| 2008 | ETS | Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters. | Rajarajan Senguttuvan, Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee |
| 2008 | IOLTS | Guided Probabilistic Checksums for Error Control in Low Power Digital-Filters. | Muhammad Mudassar Nisar, Abhijit Chatterjee |
| 2008 | ISCAS | Design of process variation tolerant radio frequency low noise amplifier. | Shreyas Sen, Abhijit Chatterjee |
| 2008 | ITC | EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms. | Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2008 | VLSID | Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS. | Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee |
| 2008 | VLSID | Adaptive Signal Scaling Driven Critical Path Modulation for Low Power Baseband OFDM Processors. | Muhammad Mudassar Nisar, Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2008 | VLSID | Concurrent Multi-Dimensional Adaptation for Low-Power Operation in Wireless Devices. | Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee |
| 2008 | VTS | ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends. | Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee |
| 2008 | VTS | Test Enabled Process Tuning for Adaptive Baseband OFDM Processor. | Muhammad Mudassar Nisar, Abhijit Chatterjee |
| 2008 | VTS | Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. | Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2007 | ICCD | Fault-based alternate test of RF components. | Selim Sermet Akbay, Abhijit Chatterjee |
| 2007 | ICCD | VIZOR: Virtually zero margin adaptive RF for ultra low power wireless communication. | Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee |
| 2007 | IOLTS | Probabilistic Concurrent Error Compensation in Nonlinear Digital Filters Using Linearized Checksums. | Muhammad Mudassar Nisar, Maryam Ashouei, Abhijit Chatterjee |
| 2007 | VLSID | Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations. | Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit Chatterjee, Adit D. Singh, Abdulkadir Utku Diril |
| 2007 | VTS | Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. | Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2007 | VTS | Enhanced Resolution Jitter Testing Using Jitter Expansion. | Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee |
| 2007 | VTS | Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios. | Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee, Craig Force |
| 2007 | VTS | Alternate Diagnostic Testing and Compensation of RF Transmitter Performance Using Response Detection. | Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2006 | DATE | Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. | Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee |
| 2006 | ETS | Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. | Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | ETS | Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. | Shalabh Goyal, Abhijit Chatterjee, Mike Atia |
| 2006 | ETS | Low Cost Parametric Failure Diagnosis of RF Transceivers. | Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | ICCS | Application of the Reactivity Index to Propose Intra and Intermolecular Reactivity in Catalytic Materials. | Abhijit Chatterjee |
| 2006 | IOLTS | On-Line Error Detection in Wireless RF Transmitters Using Real-time Streaming Data. | Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee |
| 2006 | ITC | Alternate Test of RF Front Ends with IP Constraints: Frequency Domain Test Generation and Validation. | Selim Sermet Akbay, Jose L. Torres, Julie M. Rumer, Abhijit Chatterjee, Joel Amtsfield |
| 2006 | VLSID | Statistical Estimation of Correlated Leakage Power Variation and Its Application to Leakage-Aware Design. | Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh, Vivek De, T. M. Mak |
| 2006 | VLSID | Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. | Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair |
| 2006 | VLSID | Low-Cost Production Testing of Wireless Transmitters. | Achintya Halder, Abhijit Chatterjee |
| 2006 | VTS | Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. | Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | VTS | Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. | Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | VTS | Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. | Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler |
| 2005 | ASPDAC | Low-power domino circuits using NMOS pull-up on off-critical paths. | Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh |
| 2005 | CATA | Prototyping an Embedded Bus-Based Parallel System. | Chung-Seok (Andy) Seo, Abhijit Chatterjee, Timothy J. Drabik, Behnam S. Arad, Reena Patel |
| 2005 | DATE | Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits. | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee |
| 2005 | ETS | Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. | Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee |
| 2005 | ICCD | A Dual-Vt Layout Approach for Statistical Leakage Variability Minimization in Nanometer CMOS. | Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh, Vivek De |
| 2005 | IOLTS | On Transistor Level Gate Sizing for Increased Robustness to Transient Faults. | Jos Manuel Cazeaux, Daniele Rossi, Martin Omaa, Cecilia Metra, Abhijit Chatterjee |
| 2005 | IOLTS | Load and Logic Co-Optimization for Design of Soft-Error Resistant Nanometer CMOS Circuits. | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Cecilia Metra |
| 2005 | IOLTS | On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). | Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt |
| 2005 | ITC | Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. | Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2005 | ITC | Test time reduction of successive approximation register A/D converter by selective code measurement. | Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag |
| 2005 | ITC | Panel synopsis: reducing high-speed/RF test cost: guaranteed by design or guaranteed to fail? | Hosam Haggag, Abhijit Chatterjee |
| 2005 | VLSID | Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF. | Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay |
| 2005 | VLSID | Level-Shifter Free Design of Low Power Dual Supply Voltage CMOS Circuits Using Dual Threshold Voltages. | Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh |
| 2005 | VLSID | A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. | Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee |
| 2005 | VTS | Built-In Test of RF Components Using Mapped Feature Extraction Sensors. | Selim Sermet Akbay, Abhijit Chatterjee |
| 2005 | VTS | Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. | Soumendu Bhattacharya, Abhijit Chatterjee |
| 2005 | VTS | Design of Adaptive Nanometer Digital Systems for Effective Control of Soft Error Tolerance. | Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh |
| 2005 | VTS | Low-Cost Alternate EVM Test for Wireless Receiver Systems. | Achintya Halder, Abhijit Chatterjee |
| 2004 | CATA | Optically Interconnected Intelligent RAM Multiprocessor: Gigascale Opto-IRAM. | Chung-Seok (Andy) Seo, Abhijit Chatterjee, Timothy J. Drabik |
| 2004 | DATE | Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. | Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee |
| 2004 | ETS | Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits. | Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh |
| 2004 | IOLTS | Sizing CMOS Circuits for Increased Transient Error Tolerance. | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh |
| 2004 | ITC | Use of Embedded Sensors for Built-In-Test of RF Circuits. | Soumendu Bhattacharya, Abhijit Chatterjee |
| 2004 | ITC | Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters. | Ashwin Raghunathan, Ji Hwan (Paul) Chun, Jacob A. Abraham, Abhijit Chatterjee |
| 2004 | VLSID | Concurrent RF Test Using Optimized Modulated RF Stimuli. | Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik |
| 2004 | VTS | Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference. | Selim Sermet Akbay, Abhijit Chatterjee |
| 2004 | VTS | System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. | Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee |
| 2004 | VTS | Prediction of Analog Performance Parameters Using Oscillation Based Test. | Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee |
| 2003 | ICCAD | Algorithm for Achieving Minimum Energy Consumption in CMOS Circuits Using Multiple Supply and Threshold Voltages at the Module Level. | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Hsien-Hsin S. Lee |
| 2003 | ISLPED | UDSM (ultra-deep sub-micron)-aware post-layout power optimization for ultra low-power CMOS VLSI. | Kyu-won Choi, Abhijit Chatterjee |
| 2003 | ITC | Seamless Research Between Academia And Industry To Facilitate Test Of Integrated High-Speed Wireless Systems: Is This An Illusion? | Abhijit Chatterjee |
| 2003 | ITC | Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. | Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2003 | ITC | Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. | Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee |
| 2003 | VTS | High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. | Soumendu Bhattacharya, Abhijit Chatterjee |
| 2002 | DATE | A Signature Test Framework for Rapid Production Testing of RF Circuits. | Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee |
| 2002 | ICCD | A CAD Tool for System-on-Chip Placement and Routing with Free-Space Optical Interconnect. | Chung-Seok (Andy) Seo, Abhijit Chatterjee |
| 2002 | IOLTS | Design of Real-Number Checksum Codes Using Shared Partial Computation for CED in Linear DSP Systems. | Huy Nguyen, Abhijit Chatterjee |
| 2002 | ISLPED | HA | Kyu-won Choi, Abhijit Chatterjee |
| 2002 | VTS | Measuring Stray Capacitance on Tester Hardware. | Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley |
| 2001 | DATE | Test generation based diagnosis of device parameters for analog circuits. | Sasikumar Cherubal, Abhijit Chatterjee |
| 2001 | ITC | A high-resolution jitter measurement technique using ADC sampling. | Sasikumar Cherubal, Abhijit Chatterjee |
| 2000 | ICCAD | Partial Simulation-Driven ATPG for Detection and Diagnosis of Faults in Analog Circuits. | Sudip Chakrabarti, Abhijit Chatterjee |
| 2000 | ICCD | Analog Transient Concurrent Fault Simulation with Dynamic Fault Grouping. | Junwei Hou, Abhijit Chatterjee |
| 2000 | ITC | Optimal INL/DNL testing of A/D converters using a linear model. | Sasikumar Cherubal, Abhijit Chatterjee |
| 2000 | ITC | Path-delay fault diagnosis in non-scan sequential circuits with at-speed test application. | Pankaj Pant, Abhijit Chatterjee |
| 2000 | VLSID | An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards. | Sasikumar Cherubal, Abhijit Chatterjee |
| 2000 | VTS | Test Generation for Accurate Prediction of Analog Specifications. | Ramakrishna Voorakaranam, Abhijit Chatterjee |
| 1999 | DATE | Parametric Fault Diagnosis for Analog Systems Using Functional Mapping. | Sasikumar Cherubal, Abhijit Chatterjee |
| 1999 | DATE | Minimal Length Diagnostic Tests for Analog Circuits using Test History. | Alfred V. Gomes, Abhijit Chatterjee |
| 1999 | ICCAD | Robust optimization based backtrace method for analog circuits. | Alfred V. Gomes, Abhijit Chatterjee |
| 1999 | ICCAD | Efficient diagnosis of path delay faults in digital logic circuits. | Pankaj Pant, Abhijit Chatterjee |
| 1999 | ISCAS | Fault modeling and fault sampling for isolating faults in analog and mixed-signal circuits. | Sudip Chakrabarti, Abhijit Chatterjee |
| 1999 | ISCAS | A novel concurrent fault simulation method for mixed-signal circuits. | Junwei Hou, William H. Kao, Abhijit Chatterjee |
| 1999 | ITC | On-line fault detection in DSP circuits using extrapolated checksums with minimal test points. | Sudip Chakrabarti, Abhijit Chatterjee |
| 1999 | VLSID | Manufacturability of Mixed Signal Systems. | Manuel d'Arbreu, Abhijit Chatterjee |
| 1999 | VLSID | Diagnostic Test Pattern Generation for Analog Circuits Using Hierarchical Models. | Sudip Chakrabarti, Abhijit Chatterjee |
| 1999 | VLSID | Test Generation for Analog Circuits Using Partial Numerical Simulation. | Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee |
| 1999 | VTS | Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation. | Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee |
| 1999 | VTS | Hierarchical Test Generation for Analog Circuits Using Incremental Test Development. | Ramakrishna Voorakaranam, Abhijit Chatterjee |
| 1998 | ICCAD | CONCERT: a concurrent transient fault simulator for nonlinear analog circuits. | Junwei Hou, Abhijit Chatterjee |
| 1998 | ICCAD | Synthesis of BIST hardware for performance testing of MCM interconnections. | Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian |
| 1998 | ICCD | Fault detection and automated fault diagnosis for embedded integrated electrical passives. | Heebyung Yoon, Junwei Hou, Abhijit Chatterjee, Madhavan Swaminathan |
| 1998 | ITC | A high throughput test methodology for MCM substrates. | Bruce C. Kim, David C. Keezer, Abhijit Chatterjee |
| 1998 | ITC | A distributed BIST technique for diagnosis of MCM interconnections. | Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian |
| 1998 | VLSID | Partial Reset Methodologies for Improving Random-Pattern Testability and BIST of Sequential Circuits. | Huy Nguyen, Rabindra K. Roy, Abhijit Chatterjee |
| 1998 | VTS | Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements. | Pramodchandran N. Variyam, Abhijit Chatterjee |
| 1998 | VTS | Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. | Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi |
| 1997 | DAC | Device-Circuit Optimization for Minimal Energy and Power Consumption in CMOS Random Logic Networks. | Pankaj Pant, Vivek De, Abhijit Chatterjee |
| 1997 | ICCAD | Test generation for comprehensive testing of linear analog circuits using transient response sampling. | Pramodchandran N. Variyam, Abhijit Chatterjee |
| 1997 | ITC | Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. | Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao |
| 1997 | VLSID | Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial. | Abhijit Chatterjee, Naveena Nagi |
| 1997 | VLSID | Impact of Partial Reset on Fault Independent Testing and BIST. | Huy Nguyen, Abhijit Chatterjee, Rabindra K. Roy |
| 1997 | VLSID | FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation. | Pramodchandran N. Variyam, Abhijit Chatterjee |
| 1997 | VLSID | Optimal Design of Checksum-Based Checkers for Fault Detection in Linear Analog Circuits. | Heebyung Yoon, Abhijit Chatterjee, Joseph L. A. Hughes |
| 1997 | VTS | Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. | Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi |
| 1996 | DATE | Relay Propagation Scheme for Testing of MCMs on Large Area Substrates. | Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian |
| 1996 | ICCD | Optimal single probe traversal algorithm for testing of MCM substrat. | Rajesh Pendurkar, Abhijit Chatterjee, Craig A. Tovey |
| 1996 | ITC | Optimal Multiple Chain Relay Testing Scheme for MCMs on Large Area Substrates. | Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian |
| 1996 | VLSID | Low-cost DC built-in self-test of linear analog circuits using checksums. | Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi |
| 1996 | VLSID | Hierarchical Probablistic Diagnosis of MCMs on Large-Area Substrates. | Koppolu Sasidhar, Abhijit Chatterjee |
| 1996 | VTS | Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages. | Abhijit Chatterjee, Rathish Jayabharathi, Pankaj Pant, Jacob A. Abraham |
| 1996 | VTS | Low-cost diagnosis of defects in MCM substrate interconnections. | Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan |
| 1995 | ITC | A Novel Low-Cost Approach to MCM Interconnect Test. | Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel |
| 1995 | ITC | Distributed Probabilistic Diagnosis of MCMs on Large Area. | Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes |
| 1995 | VLSID | Efficient multisine testing of analog circuits. | Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham |
| 1994 | ICCAD | RAFT191486: a novel program for rapid-fire test and diagnosis of digital logic for marginal delays and delay faults. | Abhijit Chatterjee, Jacob A. Abraham |
| 1994 | ICCD | A Signature Analyzer for Analog and Mixed-signal Circuits. | Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham |
| 1994 | VLSID | Synthesis of Low Power Linear DSP Circuits Using Activity Metrics. | Abhijit Chatterjee, Rabindra K. Roy |
| 1994 | VTS | Design for diagnosability of linear digital filters using time-space expansion. | Abhijit Chatterjee, Rabindra K. Roy |
| 1993 | DAC | An Architectural Transformation Program for Optimization of Digital Systems by Multi-Level Decomposition. | Abhijit Chatterjee, Rabindra K. Roy |
| 1993 | DAC | DRAFTS: Discretized Analog Circuit Fault Simulator. | Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham |
| 1993 | ICCAD | Fault-based automatic test generator for linear analog circuits. | Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham |
| 1993 | ICCD | Concurrent Error Detection in Nonlinear Digital Circuits with Applications to Adaptive Filters. | Abhijit Chatterjee, Rabindra K. Roy |
| 1993 | ICCD | MIXER: Mixed-Signal Fault Simulator. | Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham |
| 1993 | VLSID | Greedy Hardware Optimization for Linear Digital Systems Using Number Splitting. | Abhijit Chatterjee, Rabindra K. Roy, Manuel A. d'Abreu |
| 1992 | ICCAD | Automatic test generation for linear digital systems with bi-level search using matrix transform methods. | Rabindra K. Roy, Abhijit Chatterjee, Janak H. Patel, Jacob A. Abraham, Manuel A. d'Abreu |
| 1992 | ICCD | A New Approach to Fault-Tolerance in Linear Analog Systems Based on Checksum-Coded State Space Representations. | Abhijit Chatterjee |
| 1992 | VTS | Checksum-based concurrent error detection in linear analog systems with second and higher order stages. | Abhijit Chatterjee |
| 1992 | VTS | Delay fault testing of iterative arithmetic arrays. | Rabindra K. Roy, Naveena Nagi, Abhijit Chatterjee, Manuel A. d'Abreu |
| 1991 | ICCD | Syndrome-Based Functional Delay Fault Location in Linear Digital Data-Flow Graphs. | Abhijit Chatterjee, Manuel A. d'Abreu |
| 1991 | ITC | Concurrent Error Detection in Linear Analog and Switched-Capacitor State Variable Systems Using Continuous Checksums. | Abhijit Chatterjee |
| 1990 | DAC | A New Simultaneous Circuit Partitioning and Chip Placement Approach Based on Simulated Annealing. | Abhijit Chatterjee, Richard I. Hartley |
| 1988 | ICCAD | NCUBE: an automatic test generation program for iterative logic arrays. | Abhijit Chatterjee, Jacob A. Abraham |
| 1988 | ICCAD | A submicron MOSFET model for simulation of analog circuits. | Abhijit Chatterjee, Charles F. Machala III, Ping Yang |