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Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results.

Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee

VenueAITC
Year2003
ProceedingsITC

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