Mottaqiallah Taouil
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
95
Venues
12
Active years
2010–2026
Best venue rank
A*
Where they publish
Papers
95 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | DATE | The PMP Snapshot Engine: Fast and Fault-Resilient PMP Reconfiguration for RISC-V. | Christian Larmann, Abdullah Aljuffri, Adrian Marotzke, Alejandro Garza, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | DATE | Make it Darker: A Gray Code Popcounter to Protect BNN CIM Against Power Attacks. | Fouwad Jamil Mir, Asmae El Arrassi, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | DDECS | Periphery-Aware Power Side-Channel Hardening for Digital CIM-BNN Accelerators. | Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | ETS | Reliability, Test, and Security of Compute-In-Memories. | Soyed Tuhin Ahmed, Krishnendu Chakrabarty, Jin-Fu Li, Mottaqiallah Taouil, Fouwad Jamil Mir, Said Hamdioui, Mehdi B. Tahoori, Martin Keim, Jongsin Yun |
| 2026 | ETS | Bridging the Speed-Accuracy Gap: Layout-Aware Pre-Silicon Side-Channel Analysis. | Asmaa Kassimi, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | ETS | A CIM-based Gaussian Random Number Generator for Edge Devices as Security Primitive. | Fouwad Jamil Mir, Asmae El Arrassi, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | ETS | SWEET-DREAM: Side-Channel Weakness Evaluation and Enhanced Mitigation for DREAM-CIM. | Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | ETS | Structural Testing Methodology for Deep Neural Networks based on RRAM. | Emmanouil Anastasios Serlis, Emmanouil Arapidis, Theofilos Spyrou, Anteneh Gebregiorgis, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2026 | ETS | Gremlins in the Silicon: Why Faulty Chips are Escaping the Fab and Crashing in the Field. | Mottaqiallah Taouil, R. D. Shawn Blanton, Phil Nigh, Adit D. Singh, Said Hamdioui |
| 2025 | ASPDAC | Device-Aware Test for Anomalous Charge Trapping in FeFETs. | Sicong Yuan, Changhao Wang, Moritz Fieback, Hanzhi Xun, Mottaqiallah Taouil, Xiuyan Li, Danyang Chen, Lin Wang, Nicol Bellarmino, Riccardo Cantoro, Said Hamdioui |
| 2025 | DAC | Device-Aware Test: A Means to Attack Unmodelled Defects (Invited). | Said Hamdioui, Mottaqiallah Taouil |
| 2025 | DATE | Multi-Partner Project: Securing Future Edge-AI Processors in Practice (CONVOLVE). | Sven Argo, Henk Corporaal, Alejandro Garza, Marc Geilen, Manil Dev Gomony, Tim Gneysu, Adrian Marotzke, Fouwad Jamil Mir, Jan Richter-Brockmann, Jeffrey Smith, Mottaqiallah Taouil, Said Hamdioui |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2025 | ETS | Modeling and Analysis of Aging Impact on SRAM PUFs for Advanced FinFET Technology Nodes. | Shayesteh Masoumian, Roel Maes, Noemie Beringuier-Boher, Karthik Keni Yerriswamy, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil |
| 2025 | ETS | Dependable Neuromorphic Computing-in-Memory Architectures. | Farhad Merchant, Ankit Bende, Markus Fritscher, Shahar Kvatinsky, Simranjeet Singh, Vikas Rana, Regina Dittmann, Keerthi Dorai Swamy Reddy, Christian Wenger, Fouwad Jamil Mir, Mottaqiallah Taouil, Manil Dev Gomony, Said Hamdioui, Henk Corporaal |
| 2025 | ETS | Structural Testing of a RRAM-based AI Accelerator Core. | Emmanouil Anastasios Serlis, Hanzhi Xun, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2025 | ETS | In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Changhao Wang, Erbing Hua, Hassen Aziza, Leticia Bolzani Poehls, Riccardo Cantoro, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui |
| 2025 | ITC | Glitter PUF: A Passive Anti-Tamper PUF Based On Images Of Glitter Reflections. | Noel Moeskops, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2025 | ITC | Combined Array and ADC Structural Test for RRAM-based Multiply-and-Accumulate Circuits. | Emmanouil Anastasios Serlis, Hanzhi Xun, Emmanouil Arapidis, Anteneh Gebregiorgis, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2025 | ITC | Device-Aware Test for Threshold Voltage Shifting in FeFET. | Changhao Wang, Sicong Yuan, Nima Kolahimahmoudi, Hanzhi Xun, Nicol Bellarmino, Danyang Chen, Chujun Yin, Mottaqiallah Taouil, Moritz Fieback, Xiuyan Li, Lin Wang, Chaobo Li, Riccardo Cantoro, Said Hamdioui |
| 2024 | DATE | Device-Aware Diagnosis for Yield Learning in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | DSD | Trusted SMEs for Sustainable Growth of Europeans Economical Backbone to Strengthen the Digital Sovereignty: The KDT Resilient Trust Project. | Hassan Aboushady, Noemie Beringuier-Boher, Kelly Burke, Philippe Dallemagne, Mario De Biase, Manuel Di Frangia, Virginie Deniau, Enrico Ferrari, Christophe Gaquire, Dominique Morche, Fabio Patrone, Stefano Pesci, Luigi Pomante, Andries Stam, Vincenzo Stornelli, Haralampos-G. Stratigopoulos, Mottaqiallah Taouil, Emmanuel Vaumorin, Jonathan Villain, Sander Steeghs |
| 2024 | ETS | Counteracting Rowhammer by Data Alternation. | Stefan A. Lung, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil |
| 2024 | ETS | Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees. | Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2024 | ETS | Online Detection of Unique Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ETS | Design-for-Test for Intermittent Faults in STT-MRAMs. | Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Defects, Fault Modeling, and Test Development Framework for FeFETs. | Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui |
| 2024 | ITC | Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? | Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | DATE | Device-Aware Test for Back-Hopping Defects in STT-MRAMs. | Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui |
| 2023 | DSD | A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks. | Abdullah Aljuffri, Mudit Saxena, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2023 | DSD | Memristor-Based Lightweight Encryption. | Muhammad Ali Siddiqi, Jan Andrs Galvan Hernndez, Anteneh Gebregiorgis, Rajendra Bishnoi, Christos Strydis, Said Hamdioui, Mottaqiallah Taouil |
| 2023 | ETS | Online Fault Detection and Diagnosis in RRAM. | Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ETS | Dependability of Future Edge-AI Processors: Pandora's Box. | Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Gneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui |
| 2023 | ETS | Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ITC | Device-Aware Test for Ion Depletion Defects in RRAMs. | Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ITC | Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. | Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | TrustCom | Securing an Efficient Lightweight AES Accelerator. | Ruoyu Huang, Abdullah Aljuffri, Said Hamdioui, Kezheng Ma, Mottaqiallah Taouil |
| 2022 | DATE | Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes. | Shayesteh Masoumian, Georgios N. Selimis, Rui Wang, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil |
| 2022 | DDECS | Exploiting PUF Variation to Detect Fault Injection Attacks. | Troya agil Kyl, Luza C. Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil |
| 2022 | ETS | PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. | Moritz Fieback, Christopher Mnch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori |
| 2022 | ETS | Smart Redundancy Schemes for ANNs Against Fault Attacks. | Troya agil Kyl, Said Hamdioui, Mottaqiallah Taouil |
| 2022 | ETS | Hierarchical Memory Diagnosis. | Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letcia Maria Veiras Bolzani, Said Hamdioui |
| 2021 | DATE | Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. | Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau |
| 2021 | DATE | GRINCH: A Cache Attack against GIFT Lightweight Cipher. | Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Johanna Seplveda |
| 2021 | DATE | Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2021 | DSD | Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron. | Luza C. Garaffa, Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Johanna Seplveda |
| 2021 | DSD | Protecting IoT Devices through a Hardware-driven Memory Verification. | Troya agil Kyl, Hans Okkerman, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2021 | ETS | Intermittent Undefined State Fault in RRAMs. | Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2021 | ETS | Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. | Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui |
| 2021 | ITC | Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2021 | PST | Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks. | Troya agil Kyl, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2021 | VTS | Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks. | Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ASPDAC | The Power of Computation-in-Memory Based on Memristive Devices. | Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | DATE | RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. | Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendrfer, Christian Sauer, Anton Klotz, Michael Hbner, Jrg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka |
| 2020 | DATE | Mitigation of Sense Amplifier Degradation Using Skewed Design. | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2020 | DATE | A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. | Guilherme Cardoso Medeiros, Cemil Cem Grsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | DATE | Impact of Magnetic Coupling and Density on STT-MRAM Performance. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2020 | DDECS | A Security Verification Template to Assess Cache Architecture Vulnerabilities. | Tara Ghasempouri, Jaan Raik, Kolin Paul, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ETS | Testing Scouting Logic-Based Computation-in-Memory Architectures. | Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | ETS | G-PUF: An Intrinsic PUF Based on GPU Error Signatures. | Bruno Endres Forlin, Ronaldo Husemann, Luigi Carro, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ETS | Modeling Static Noise Margin for FinFET based SRAM PUFs. | Shayesteh Masoumian, Georgios N. Selimis, Roel Maes, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ETS | LiD-CAT: A Lightweight Detector for Cache ATtacks. | Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Seplveda |
| 2020 | ETS | Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. | Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | ISCAS | RNN-Based Detection of Fault Attacks on RSA. | Troya agil Kyl, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ITC | Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2019 | DATE | Applications of Computation-In-Memory Architectures based on Memristive Devices. | Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando Garca-Redondo, Geethan Karunaratne, Abbas Rahimi, Luca Benini |
| 2019 | DATE | Methodology for Application-Dependent Degradation Analysis of Memory Timing. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2019 | DATE | Time-division Multiplexing Automata Processor. | Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui |
| 2019 | ETS | Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2019 | ETS | DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. | Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui |
| 2019 | ETS | Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. | Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar |
| 2019 | ITC | Reliability Modeling and Mitigation for Embedded Memories. | Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui |
| 2019 | ITC | Device-Aware Test: A New Test Approach Towards DPPB Level. | Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui |
| 2019 | ITC | Testing Computation-in-Memory Architectures Based on Emerging Memories. | Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil |
| 2018 | DATE | Degradation analysis of high performance 14nm FinFET SRAM. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2018 | DATE | Memristive devices for computation-in-memory. | Jintao Yu, Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui |
| 2018 | ETS | Device aging: A reliability and security concern. | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi |
| 2018 | ITC | Testing Resistive Memories: Where are We and What is Missing? | Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2018 | ITC | Electrical Modeling of STT-MRAM Defects. | Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui |
| 2017 | DATE | Mitigation of sense amplifier degradation using input switching. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene |
| 2017 | DDECS | On the robustness of memristor based logic gates. | Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Mottaqiallah Taouil, Said Hamdioui |
| 2016 | DDECS | Comparative BTI analysis for various sense amplifier designs. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor |
| 2016 | ETS | Read path degradation analysis in SRAM. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene |
| 2015 | DATE | Memristor based computation-in-memory architecture for data-intensive applications. | Said Hamdioui, Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Henk Corporaal, Hailong Jiao, Francky Catthoor, Dirk J. Wouters, Eike Linn, Jan van Lunteren |
| 2015 | ETS | On resistive open defect detection in DRAMs: The charge accumulation effect. | Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui |
| 2015 | ICCD | Fast boolean logic mapped on memristor crossbar. | Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Said Hamdioui |
| 2015 | VTS | Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor |
| 2014 | DATE | Interconnect test for 3D stacked memory-on-logic. | Mottaqiallah Taouil, Mahmoud Masadeh, Said Hamdioui, Erik Jan Marinissen |
| 2014 | ITC | Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. | Erik Jan Marinissen, Bart De Wachter, Ken Smith, Jorg Kiesewetter, Mottaqiallah Taouil, Said Hamdioui |
| 2014 | VTS | Quality versus cost analysis for 3D Stacked ICs. | Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen |
| 2013 | DATE | Is TSV-based 3D integration suitable for inter-die memory repair? | Mihai Lefter, George Razvan Voicu, Mottaqiallah Taouil, Marius Enachescu, Said Hamdioui, Sorin Dan Cotofana |
| 2011 | DDECS | Stacking order impact on overall 3D die-to-wafer Stacked-IC cost. | Mottaqiallah Taouil, Said Hamdioui |
| 2011 | ETS | Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. | Mottaqiallah Taouil, Said Hamdioui |
| 2010 | ITC | On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs. | Mottaqiallah Taouil, Said Hamdioui, Jouke Verbree, Erik Jan Marinissen |