RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems.

Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendrfer, Christian Sauer, Anton Klotz, Michael Hbner, Jrg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka

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