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Maksim Jenihhin

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

48

Venues

10

Active years

2007–2026

Best venue rank

C

Where they publish

Papers

48 indexed papers, newest first.

YearVenueTitleAuthors
2026ETSNURSE: A Distributed Architecture for Runtime Fault Management in Processor Designs.Ashwin Santhosh, Artur Jutman, Endri Kaja, Wolfgang Ecker, Maksim Jenihhin
2026IOLTSScalable Reliability Assessment of Vision Transformers on Systolic Arrays via Fault Propagation Analysis.Natalia Cherezova, Artur Jutman, Maksim Jenihhin
2026VTSSpecial Session: Reliability Assessment of DNN Models and Inference on Systolic Arrays.Natalia Cherezova, Salvatore Pappalardo, Annachiara Ruospo, Bastien Deveautour, Lorenzo Fezza, Artur Jutman, Ernesto Snchez, Alberto Bosio, Matteo Sonza Reorda, Maksim Jenihhin
2026VTSFT-Sparse: Algorithm-Based Fault Tolerance for Sparse CNNs Using Structured Sparsity in GPUs.Josie E. Rodriguez Condia, Mohammad Hasan Ahmadilivani, Jaan Raik, Maksim Jenihhin, Matteo Sonza Reorda
2025DDECSRL-Agent-based Early-Exit DNN Architecture Search Framework.Mahdi Taheri, Parth Patne, Natalia Cherezova, Ali Mahani, Christian Herglotz, Maksim Jenihhin
2025DSNXMULT: An Energy-Efficient Design of Approximate Multiplier.Ahsan Rafiq, Maksim Jenihhin
2025ETSEuropean Test Symposium Teams: an Anniversary Snapshot.Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025IOLTSSHIELD: PSO-Based Hardware Trojan Detection for Efficient and Low-Cost Defense.Mostafa Hosseini, Ali Azarpeyvand, Mahdi Taheri, Tara Ghasempouri, Maksim Jenihhin
2024DDECSSAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators.Mahdi Taheri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin, Salvatore Pappalardo, Paul Jimnez, Bastien Deveautour, Alberto Bosio
2024ETSAdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators.Mahdi Taheri, Natalia Cherezova, Samira Nazari, Ahsan Rafiq, Ali Azarpeyvand, Tara Ghasempouri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin
2024IOLTSCost-Effective Fault Tolerance for CNNs Using Parameter Vulnerability Based Hardening and Pruning.Mohammad Hasan Ahmadilivani, Seyedhamidreza Mousavi, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin
2024VTSSpecial Session: Reliability Assessment Recipes for DNN Accelerators.Mohammad Hasan Ahmadilivani, Alberto Bosio, Bastien Deveautour, Fernando Fernandes dos Santos, Juan-David Guerrero-Balaguera, Maksim Jenihhin, Angeliki Kritikakou, Robert Limas Sierra, Salvatore Pappalardo, Jaan Raik, Josie E. Rodriguez Condia, Matteo Sonza Reorda, Mahdi Taheri, Marcello Traiola
2023DDECSAPPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors.Mahdi Taheri, Mohammad Hasan Ahmadilivani, Maksim Jenihhin, Masoud Daneshtalab, Jaan Raik
2023ETSDeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs' Reliability Assessment.Mohammad Hasan Ahmadilivani, Mahdi Taheri, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin
2023IOLTSML-Based Online Design Error Localization for RISC-V Implementations.Hardi Selg, Maksim Jenihhin, Peeter Ellervee, Jaan Raik
2023VTSSpecial Session: Approximation and Fault Resiliency of DNN Accelerators.Mohammad Hasan Ahmadilivani, Mario Barbareschi, Salvatore Barone, Alberto Bosio, Masoud Daneshtalab, Salvatore Della Torca, Gabriele Gavarini, Maksim Jenihhin, Jaan Raik, Annachiara Ruospo, Ernesto Snchez, Mahdi Taheri
2022IOLTSMLC: A Machine Learning Based Checker For Soft Error Detection In Embedded Processors.Nooshin Nosrati, Maksim Jenihhin, Zainalabedin Navabi
2022IOLTSA Novel Fault-Tolerant Logic Style with Self-Checking Capability.Mahdi Taheri, Saeideh Sheikhpour, Ali Mahani, Maksim Jenihhin
2021DSDImplementation-Independent Test Generation for a Large Class of Faults in RISC Processor Modules.Maksim Jenihhin, Adeboye Stephen Oyeniran, Jaan Raik, Raimund Ubar
2021MEDIEdge-to-Fog Collaborative Computing in a Swarm of Drones.Dadmehr Rahbari, Muhammad Mahtab Alam, Yannick Le Moullec, Maksim Jenihhin
2020DATERESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems.Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendrfer, Christian Sauer, Anton Klotz, Michael Hbner, Jrg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka
2020DATEA DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs.Guilherme Cardoso Medeiros, Cemil Cem Grsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
2020DSDImplementation-Independent Functional Test for Transition Delay Faults in Microprocessors.Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
2020IOLTSRepresenting Gate-Level SET Faults by Multiple SEU Faults at RTL.Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer
2020VTSSpecial Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks.Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Ernesto Snchez, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer
2019DDECSNew categories of Safe Faults in a processor-based Embedded System.Cemil Cem Grsoy, Maksim Jenihhin, Adeboye Stephen Oyeniran, Davide Piumatti, Jaan Raik, Matteo Sonza Reorda, Raimund Ubar
2019DSDTrue Path Tracing in Structurally Synthesized BDDs for Testability Analysis of Digital Circuits.Raimund Ubar, Lembit Jrimgi, Adeniyi Olanrewaju Adekoya, Maksim Jenihhin
2019ETSHigh-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors.Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Grsoy, Jaan Raik
2019IOLTSEfficient Fault Injection based on Dynamic HDL Slicing Technique.Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer
2019IOLTSApplication Specific True Critical Paths Identification in Sequential Circuits.Lembit Jrimgi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Adeboye Stephen Oyeniran
2019IOLTSPASCAL: Timing SCA Resistant Design and Verification Flow.Xinhui Lai, Maksim Jenihhin, Jaan Raik, Kolin Paul
2018DDECSQoSinNoC: Analysis of QoS-Aware NoC Architectures for Mixed-Criticality Applications.Serhiy Avramenko, Siavoosh Payandeh Azad, Stefano Esposito, Behrad Niazmand, Massimo Violante, Jaan Raik, Maksim Jenihhin
2018DDECSSoftware-Level TMR Approach for On-Board Data Processing in Space Applications.Karl Janson, Carl Johann Treudler, Thomas Hollstein, Jaan Raik, Maksim Jenihhin, Grschwin Fey
2017DATEBASTION: Board and SoC test instrumentation for ageing and no failure found.Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke
2017DDECSA scalable technique to identify true critical paths in sequential circuits.Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik
2017ICTERIMulti-Fragment Markov Model Guided Online Test Generation for MPSoC.Jri Vain, Leonidas Tsiopoulos, Vyacheslav S. Kharchenko, Apneet Kaur, Maksim Jenihhin, Jaan Raik
2016FDLDesigning reliable cyber-physical systems overview associated to the special session at FDL'16.Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Grschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Knighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Rck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
2015DDECSSystemC-Based Loose Models for Simulation Speed-Up by Abstraction of RTL IP Cores.Syed Saif Abrar, Maksim Jenihhin, Jaan Raik
2015DDECSSPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic.Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letcia Maria Bolzani Phls
2013DDECSExtensible open-source framework for translating RTL VHDL IP cores to SystemC.Syed Saif Abrar, Maksim Jenihhin, Jaan Raik
2013DSDIdentifying NBTI-Critical Paths in Nanoscale Logic.Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letcia Maria Bolzani Poehls
2012ETSCombining dynamic slicing and mutation operators for ESL correction.Urmas Repinski, Hanno Hantson, Maksim Jenihhin, Jaan Raik, Raimund Ubar, Giuseppe Di Guglielmo, Graziano Pravadelli, Franco Fummi
2011ETSConstraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits.Jaan Raik, Anna Rannaste, Maksim Jenihhin, Taavi Viilukas, Raimund Ubar, Hideo Fujiwara
2010DDECSConstraint-based test pattern generation at the Register-Transfer Level.Taavi Viilukas, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Anna Krivenko
2008DDECSCode Coverage Analysis using High-Level Decision Diagrams.Jaan Raik, Uljana Reinsalu, Raimund Ubar, Maksim Jenihhin, Peeter Ellervee
2008DSDHierarchical Analysis of Short Defects between Metal Lines in CMOS IC.Witold A. Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz
2008ETSTemporally Extended High-Level Decision Diagrams for PSL Assertions Simulation.Maksim Jenihhin, Jaan Raik, Anton Chepurov, Raimund Ubar
2007DDECSLayout to Logic Defect Analysis for Hierarchical Test Generation.Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A. Pleskacz, Michal Rakowski