Said Hamdioui
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
184
Venues
19
Active years
1998–2026
Best venue rank
A*
Where they publish
Papers
184 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ASPDAC | SABCIM: Self-Adaptive Biasing Scheme for Accurate and Efficient Analog Compute-in-Memory. | Yashvardhan Biyani, Abhairaj Singh, Rajendra Bishnoi, Said Hamdioui |
| 2026 | DATE | Analysis and Mitigation of IR Drop in Memristor-based AI Hardware Accelerators. | Emmanouil Arapidis, Theofilos Spyrou, Konstantinos Stavrakakis, Emmanouil Anastasios Serlis, Moritz Fieback, Said Hamdioui, Anteneh Gebregiorgis |
| 2026 | DATE | Multi-Partner Project: Efficient Deep Learning Platforms for Next-Generation Embedded Edge-AI Systems. | Rajendra Bishnoi, Mohammad Amin Yaldagard, Konstantinos Stavrakakis, Said Hamdioui, Kanishkan Vadivel, Pankaj Upadhyay, Nicolas Daniel Rodriguez, Teresa van Dam, Sander Steeghs-Turchina, Agathe Archet, Prathamesh Satish Deshpande, Giovanni Grandi, Hana Krichene, William Fabre, Fabian Chersi |
| 2026 | DATE | The PMP Snapshot Engine: Fast and Fault-Resilient PMP Reconfiguration for RISC-V. | Christian Larmann, Abdullah Aljuffri, Adrian Marotzke, Alejandro Garza, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | DATE | Make it Darker: A Gray Code Popcounter to Protect BNN CIM Against Power Attacks. | Fouwad Jamil Mir, Asmae El Arrassi, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | DATE | Multi-Partner Project: Scalable, Ferroelectric-based Accelerators for Energy Efficient Edge AI (Ferro4EdgeAI). | Theofilos Spyrou, Yashvardhan Biyani, Konstantinos Stavrakakis, Rajendra Bishnoi, Said Hamdioui, Joel Minguet Lopez, Louise Dumas, Jean Coignus, Denys Ly, Hugo Chazot-Ranquet, Laurent Grenouillet, Fabien Grimaud, Simon Martin, Olivier Billoint, Franois Andrieu, Ruben Alcala, Stefan Slesazeck, Athira Sunil, Chong Peng, Antoine Cauquil, Rosario Pronsat, Damien Deleruyelle, Cdric Marchand, Alberto Bosio, Ian O'Connor, Giulio Urlini, Simon Jeannot, Mohammad Sajedi Alvar, Nima Akbari Moghaddam, Thilo Werner, Tony Schenk, Bojun Cheng, Mina Khoei, Luca Prez Ramrez, EunJin Koh, Somnath Kale, Nicholas Barrett |
| 2026 | DATE | X-Sim: An Accurate and Scalable Simulator for Memristive Computing-in-Memory Accelerators. | Konstantinos Stavrakakis, Bas Smeele, Emmanouil Arapidis, Theofilos Spyrou, Anteneh Gebregiorgis, Stephan Wong, Georgi Gaydadjiev, Said Hamdioui |
| 2026 | DDECS | Periphery-Aware Power Side-Channel Hardening for Digital CIM-BNN Accelerators. | Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | ETS | Reliability, Test, and Security of Compute-In-Memories. | Soyed Tuhin Ahmed, Krishnendu Chakrabarty, Jin-Fu Li, Mottaqiallah Taouil, Fouwad Jamil Mir, Said Hamdioui, Mehdi B. Tahoori, Martin Keim, Jongsin Yun |
| 2026 | ETS | Bridging the Speed-Accuracy Gap: Layout-Aware Pre-Silicon Side-Channel Analysis. | Asmaa Kassimi, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | ETS | A CIM-based Gaussian Random Number Generator for Edge Devices as Security Primitive. | Fouwad Jamil Mir, Asmae El Arrassi, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | ETS | SWEET-DREAM: Side-Channel Weakness Evaluation and Enhanced Mitigation for DREAM-CIM. | Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | ETS | Structural Testing Methodology for Deep Neural Networks based on RRAM. | Emmanouil Anastasios Serlis, Emmanouil Arapidis, Theofilos Spyrou, Anteneh Gebregiorgis, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2026 | ETS | Gremlins in the Silicon: Why Faulty Chips are Escaping the Fab and Crashing in the Field. | Mottaqiallah Taouil, R. D. Shawn Blanton, Phil Nigh, Adit D. Singh, Said Hamdioui |
| 2026 | IOLTS | CIM-FI: A HW-Aware Fault Injection Framework for Digital Compute-In-Memory DNN Accelerators. | Panagiotis Chaidos, Alexis Maras, Theofilos Spyrou, Anteneh Gebregiorgis, Said Hamdioui, Dimitrios Soudris, Sotirios Xydis |
| 2025 | ASPDAC | Device-Aware Test for Anomalous Charge Trapping in FeFETs. | Sicong Yuan, Changhao Wang, Moritz Fieback, Hanzhi Xun, Mottaqiallah Taouil, Xiuyan Li, Danyang Chen, Lin Wang, Nicol Bellarmino, Riccardo Cantoro, Said Hamdioui |
| 2025 | DAC | Device-Aware Test: A Means to Attack Unmodelled Defects (Invited). | Said Hamdioui, Mottaqiallah Taouil |
| 2025 | DATE | Multi-Partner Project: Securing Future Edge-AI Processors in Practice (CONVOLVE). | Sven Argo, Henk Corporaal, Alejandro Garza, Marc Geilen, Manil Dev Gomony, Tim Gneysu, Adrian Marotzke, Fouwad Jamil Mir, Jan Richter-Brockmann, Jeffrey Smith, Mottaqiallah Taouil, Said Hamdioui |
| 2025 | DATE | Multi-Partner Project: A Deep Learning Platform Targeting Embedded Hardware for Edge-AI Applications (NEUROKIT2E). | Rajendra Bishnoi, Mohammad Amin Yaldagard, Said Hamdioui, Kanishkan Vadivel, Manolis Sifalakis, Nicolas Daniel Rodriguez, Pedro Julin, Lothar Ratschbacher, Maen Mallah, Yogesh Ramesh Patil, Rashid Ali, Fabian Chersi |
| 2025 | DATE | C3CIM: Constant Column Current Memristor-Based Computation-in-Memory Micro-Architecture. | Yashvardhan Biyani, Rajendra Bishnoi, Theofilos Spyrou, Said Hamdioui |
| 2025 | DATE | Adaptive Multi-Threshold Encoding for Energy-Efficient ECG Classification Architecture Using Spiking Neural Network. | Sumit Diware, Yingzhou Dong, Mohammad Amin Yaldagard, Said Hamdioui, Rajendra Bishnoi |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2025 | ETS | Modeling and Analysis of Aging Impact on SRAM PUFs for Advanced FinFET Technology Nodes. | Shayesteh Masoumian, Roel Maes, Noemie Beringuier-Boher, Karthik Keni Yerriswamy, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil |
| 2025 | ETS | Dependable Neuromorphic Computing-in-Memory Architectures. | Farhad Merchant, Ankit Bende, Markus Fritscher, Shahar Kvatinsky, Simranjeet Singh, Vikas Rana, Regina Dittmann, Keerthi Dorai Swamy Reddy, Christian Wenger, Fouwad Jamil Mir, Mottaqiallah Taouil, Manil Dev Gomony, Said Hamdioui, Henk Corporaal |
| 2025 | ETS | Structural Testing of a RRAM-based AI Accelerator Core. | Emmanouil Anastasios Serlis, Hanzhi Xun, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2025 | ETS | On the Trustworthiness of Spiking Neural Networks and Neuromorphic Systems. | Theofilos Spyrou, Haralampos-G. Stratigopoulos, Ihsen Alouani, Said Hamdioui, Anteneh Gebregiorgis |
| 2025 | ETS | In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Changhao Wang, Erbing Hua, Hassen Aziza, Leticia Bolzani Poehls, Riccardo Cantoro, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui |
| 2025 | ICCAD | Energy-Efficient Multi-Operand XOR Logic-Based CIM Accelerator using RRAM technology. | Abhairaj Singh, Konstantinos Stavrakakis, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui |
| 2025 | ISCAS | A Convoluted Journey from CMOS to Spin Waves. | Pantazis Anagnostou, Arne Van Zegbroeck, Said Hamdioui, Christoph Adelmann, Florin Ciubotaru, Sorin Cotofana |
| 2025 | ITC | Glitter PUF: A Passive Anti-Tamper PUF Based On Images Of Glitter Reflections. | Noel Moeskops, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2025 | ITC | Combined Array and ADC Structural Test for RRAM-based Multiply-and-Accumulate Circuits. | Emmanouil Anastasios Serlis, Hanzhi Xun, Emmanouil Arapidis, Anteneh Gebregiorgis, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback |
| 2025 | ITC | Stress Aware Quiescent Current Test Optimization. | Shubhendu Shrivastava, Jo Gunnes, Anteneh Gebregiorgis, Said Hamdioui |
| 2025 | ITC | Device-Aware Test for Threshold Voltage Shifting in FeFET. | Changhao Wang, Sicong Yuan, Nima Kolahimahmoudi, Hanzhi Xun, Nicol Bellarmino, Danyang Chen, Chujun Yin, Mottaqiallah Taouil, Moritz Fieback, Xiuyan Li, Lin Wang, Chaobo Li, Riccardo Cantoro, Said Hamdioui |
| 2024 | DAC | Invited: Achieving PetaOps/W Edge-AI Processing. | Manil Dev Gomony, Bas Ahn, Rick Luiken, Yashvardhan Biyani, Anteneh Gebregiorgis, Axel Laborieux, Friedemann Zenke, Said Hamdioui, Henk Corporaal |
| 2024 | DAC | Energy-efficient SNN Architecture using 3nm FinFET Multiport SRAM-based CIM with Online Learning. | Lucas Huijbregts, Hsiao-Hsuan Liu, Paul Detterer, Said Hamdioui, Amirreza Yousefzadeh, Rajendra Bishnoi |
| 2024 | DATE | High-Performance Data Mapping for BNNs on PCM-Based Integrated Photonics. | Taha Shahroodi, Raphael Cardoso, Stephan Wong, Alberto Bosio, Ian O'Connor, Said Hamdioui |
| 2024 | DATE | Device-Aware Diagnosis for Yield Learning in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ETS | Counteracting Rowhammer by Data Alternation. | Stefan A. Lung, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil |
| 2024 | ETS | Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees. | Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2024 | ETS | Online Detection of Unique Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ETS | Design-for-Test for Intermittent Faults in STT-MRAMs. | Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Defects, Fault Modeling, and Test Development Framework for FeFETs. | Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui |
| 2024 | ITC | Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? | Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | DATE | PetaOps/W edge-AI $\mu$ Processors: Myth or reality? | Manil Dev Gomony, Floran de Putter, Anteneh Gebregiorgis, Gianna Paulin, Linyan Mei, Vikram Jain, Said Hamdioui, Victor Sanchez, Tobias Grosser, Marc Geilen, Marian Verhelst, Friedemann Zenke, Frank K. Grkaynak, Barry de Bruin, Sander Stuijk, Simon Davidson, Sayandip De, Mounir Ghogho, Alexandra Jimborean, Sherif Eissa, Luca Benini, Dimitrios Soudris, Rajendra Bishnoi, Sam Ainsworth, Federico Corradi, Ouassim Karrakchou, Tim Gneysu, Henk Corporaal |
| 2023 | DATE | Lightspeed Binary Neural Networks using Optical Phase-Change Materials. | Taha Shahroodi, Raphael Cardoso, Mahdi Zahedi, Stephan Wong, Alberto Bosio, Ian O'Connor, Said Hamdioui |
| 2023 | DATE | Device-Aware Test for Back-Hopping Defects in STT-MRAMs. | Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui |
| 2023 | DATE | SparseMEM: Energy-efficient Design for In-memory Sparse-based Graph Processing. | Mahdi Zahedi, Geert Custers, Taha Shahroodi, Georgi Gaydadjiev, Stephan Wong, Said Hamdioui |
| 2023 | DSD | A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks. | Abdullah Aljuffri, Mudit Saxena, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2023 | DSD | Memristor-Based Lightweight Encryption. | Muhammad Ali Siddiqi, Jan Andrs Galvan Hernndez, Anteneh Gebregiorgis, Rajendra Bishnoi, Christos Strydis, Said Hamdioui, Mottaqiallah Taouil |
| 2023 | ETS | Online Fault Detection and Diagnosis in RRAM. | Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ETS | Dependability of Future Edge-AI Processors: Pandora's Box. | Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Gneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui |
| 2023 | ETS | Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ITC | Device-Aware Test for Ion Depletion Defects in RRAMs. | Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ITC | Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. | Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | MICRO | Swordfish: A Framework for Evaluating Deep Neural Network-based Basecalling using Computation-In-Memory with Non-Ideal Memristors. | Taha Shahroodi, Gagandeep Singh, Mahdi Zahedi, Haiyu Mao, Jol Lindegger, Can Firtina, Stephan Wong, Onur Mutlu, Said Hamdioui |
| 2023 | TrustCom | Securing an Efficient Lightweight AES Accelerator. | Ruoyu Huang, Abdullah Aljuffri, Said Hamdioui, Kezheng Ma, Mottaqiallah Taouil |
| 2022 | DATE | Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes. | Shayesteh Masoumian, Georgios N. Selimis, Rui Wang, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil |
| 2022 | DATE | Referencing-in-Array Scheme for RRAM-based CIM Architecture. | Abhairaj Singh, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui |
| 2022 | DDECS | Exploiting PUF Variation to Detect Fault Injection Attacks. | Troya agil Kyl, Luza C. Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil |
| 2022 | ETS | PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. | Moritz Fieback, Christopher Mnch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori |
| 2022 | ETS | RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs). | Anteneh Gebregiorgis, Artemis Zografou, Said Hamdioui |
| 2022 | ETS | Smart Redundancy Schemes for ANNs Against Fault Attacks. | Troya agil Kyl, Said Hamdioui, Mottaqiallah Taouil |
| 2022 | ETS | Hierarchical Memory Diagnosis. | Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letcia Maria Veiras Bolzani, Said Hamdioui |
| 2022 | IOLTS | Recent Trends and Perspectives on Defect-Oriented Testing. | Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu |
| 2022 | ICS | KrakenOnMem: a memristor-augmented HW/SW framework for taxonomic profiling. | Taha Shahroodi, Mahdi Zahedi, Abhairaj Singh, Stephan Wong, Said Hamdioui |
| 2022 | ITC | Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. | Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui |
| 2022 | VTS | Special Session: STT-MRAMs: Technology, Design and Test. | Anteneh Gebregiorgis, Lizhou Wu, Christopher Mnch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui |
| 2021 | DATE | Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. | Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau |
| 2021 | DATE | Fan-out of 2 Triangle Shape Spin Wave Logic Gates. | Abdulqader Nael Mahmoud, Christoph Adelmann, Frederic Vanderveken, Sorin Cotofana, Florin Ciubotaru, Said Hamdioui |
| 2021 | DATE | Perspectives on Emerging Computation-in-Memory Paradigms. | Shubham Rai, Mengyun Liu, Anteneh Gebregiorgis, Debjyoti Bhattacharjee, Krishnendu Chakrabarty, Said Hamdioui, Anupam Chattopadhyay, Jens Trommer, Akash Kumar |
| 2021 | DATE | GRINCH: A Cache Attack against GIFT Lightweight Cipher. | Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Johanna Seplveda |
| 2021 | DATE | Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2021 | DSD | Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron. | Luza C. Garaffa, Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Johanna Seplveda |
| 2021 | DSD | Protecting IoT Devices through a Hardware-driven Memory Verification. | Troya agil Kyl, Hans Okkerman, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2021 | ETS | Emerging Computing Devices: Challenges and Opportunities for Test and Reliability | Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jrgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, Arnaud Virazel, Koen Bertels |
| 2021 | ETS | Intermittent Undefined State Fault in RRAMs. | Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2021 | ETS | Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. | Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui |
| 2021 | IOLTS | Flip Flop Weighting: A technique for estimation of safety metrics in Automotive Designs. | Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer |
| 2021 | ISCAS | Spin Wave Based Full Adder. | Abdulqader Nael Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui |
| 2021 | ISCAS | Low-Power Memristor-Based Computing for Edge-AI Applications. | Abhairaj Singh, Sumit Diware, Anteneh Gebregiorgis, Rajendra Bishnoi, Francky Catthoor, Rajiv V. Joshi, Said Hamdioui |
| 2021 | ITC | An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs. | Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer |
| 2021 | ITC | Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2021 | PST | Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks. | Troya agil Kyl, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2021 | VTS | Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks. | Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ASPDAC | The Power of Computation-in-Memory Based on Memristive Devices. | Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | DATE | RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. | Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendrfer, Christian Sauer, Anton Klotz, Michael Hbner, Jrg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka |
| 2020 | DATE | Mitigation of Sense Amplifier Degradation Using Skewed Design. | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2020 | DATE | n-bit Data Parallel Spin Wave Logic Gate. | Abdulqader Nael Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui |
| 2020 | DATE | A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. | Guilherme Cardoso Medeiros, Cemil Cem Grsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | DATE | Impact of Magnetic Coupling and Density on STT-MRAM Performance. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2020 | DDECS | A Security Verification Template to Assess Cache Architecture Vulnerabilities. | Tara Ghasempouri, Jaan Raik, Kolin Paul, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ETS | Testing Scouting Logic-Based Computation-in-Memory Architectures. | Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | ETS | G-PUF: An Intrinsic PUF Based on GPU Error Signatures. | Bruno Endres Forlin, Ronaldo Husemann, Luigi Carro, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ETS | Modeling Static Noise Margin for FinFET based SRAM PUFs. | Shayesteh Masoumian, Georgios N. Selimis, Roel Maes, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ETS | LiD-CAT: A Lightweight Detector for Cache ATtacks. | Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Seplveda |
| 2020 | ETS | Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs. | Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer |
| 2020 | ETS | Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. | Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2020 | ICCD | 4-output Programmable Spin Wave Logic Gate. | Abdulqader Nael Mahmoud, Frederic Vanderveken, Christoph Adelmann, Florin Ciubotaru, Said Hamdioui, Sorin Cotofana |
| 2020 | IOLTS | Yield Estimation of a Memristive Sensor Array. | Vishal Gupta, Saurabh Khandelwal, Giulio Panunzi, Eugenio Martinelli, Said Hamdioui, Abusaleh M. Jabir, Marco Ottavi |
| 2020 | ISCAS | RNN-Based Detection of Fault Attacks on RSA. | Troya agil Kyl, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil |
| 2020 | ITC | Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2020 | VTS | Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. | Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Mnch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui |
| 2020 | VTS | Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks. | Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Ernesto Snchez, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer |
| 2019 | DATE | Applications of Computation-In-Memory Architectures based on Memristive Devices. | Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando Garca-Redondo, Geethan Karunaratne, Abbas Rahimi, Luca Benini |
| 2019 | DATE | Methodology for Application-Dependent Degradation Analysis of Memory Timing. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2019 | DATE | Time-division Multiplexing Automata Processor. | Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui |
| 2019 | ETS | Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2019 | ETS | DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. | Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui |
| 2019 | ETS | Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. | Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar |
| 2019 | IOLTS | Efficient Methodology for ISO26262 Functional Safety Verification. | Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer |
| 2019 | ISCAS | Memristive Device Based Circuits for Computation-in-Memory Architectures. | Muath Abu Lebdeh, Uljana Reinsalu, Hoang Anh Du Nguyen, Stephan Wong, Said Hamdioui |
| 2019 | ISCAS | Memristive Device Modeling and Circuit Design Exploration for Computation-in-Memory. | Anne Siemon, Dirk J. Wouters, Said Hamdioui, Stephan Menzel |
| 2019 | ITC | Reliability Modeling and Mitigation for Embedded Memories. | Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui |
| 2019 | ITC | IEEE European Test Symposium (ETS). | Stephan Eggersgl, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Baradaran Tahoori, Elena-Ioana Vatajelu |
| 2019 | ITC | Device-Aware Test: A New Test Approach Towards DPPB Level. | Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui |
| 2019 | ITC | Testing Computation-in-Memory Architectures Based on Emerging Memories. | Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil |
| 2019 | SCOPES | CIM-SIM: Computation In Memory SIMuIator. | Ali BanaGozar, Kanishkan Vadivel, Sander Stuijk, Henk Corporaal, Stephan Wong, Muath Abu Lebdeh, Jintao Yu, Said Hamdioui |
| 2018 | DATE | Degradation analysis of high performance 14nm FinFET SRAM. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2018 | DATE | Memristive devices for computation-in-memory. | Jintao Yu, Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui |
| 2018 | ETS | Device aging: A reliability and security concern. | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi |
| 2018 | ITC | Testing Resistive Memories: Where are We and What is Missing? | Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2018 | ITC | Electrical Modeling of STT-MRAM Defects. | Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui |
| 2017 | DATE | Memristor for computing: Myth or reality? | Said Hamdioui, Shahar Kvatinsky, Gert Cauwenberghs, Lei Xie, Nimrod Wald, Siddharth Joshi, Hesham Mostafa Elsayed, Henk Corporaal, Koen Bertels |
| 2017 | DATE | Mitigation of sense amplifier degradation using input switching. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene |
| 2017 | DDECS | On the robustness of memristor based logic gates. | Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Mottaqiallah Taouil, Said Hamdioui |
| 2017 | EDUCON | Standards-based tools and services for building lifelong learning pathways. | Cleo Sgouropoulou, Ioannis Voyiatzis, Anastasios Koutoumanos, Said Hamdioui, Peyman Pouyan, M. Comte, Paolo Prinetto, Giuseppe Airo Farulla, Peeter Ellervee, Carlos Delgado Kloos, Raquel M. Crespo Garca |
| 2016 | DDECS | Comparative BTI analysis for various sense amplifier designs. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor |
| 2016 | ETS | Read path degradation analysis in SRAM. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene |
| 2016 | ETS | ETS 2016 foreword. | Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos |
| 2015 | ASPDAC | Aging mitigation in memory arrays using self-controlled bit-flipping technique. | Anteneh Gebregiorgis, Mojtaba Ebrahimi, Saman Kiamehr, Fabian Oboril, Said Hamdioui, Mehdi Baradaran Tahoori |
| 2015 | DATE | Memristor based computation-in-memory architecture for data-intensive applications. | Said Hamdioui, Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Henk Corporaal, Hailong Jiao, Francky Catthoor, Dirk J. Wouters, Eike Linn, Jan van Lunteren |
| 2015 | ETS | On resistive open defect detection in DRAMs: The charge accumulation effect. | Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui |
| 2015 | ICCD | Fast boolean logic mapped on memristor crossbar. | Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Said Hamdioui |
| 2015 | VTS | Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor |
| 2015 | SCOPES | Computation in Memory for Data-Intensive Applications: Beyond CMOS and beyond Von- Neumann. | Said Hamdioui |
| 2014 | DATE | Testing PUF-based secure key storage circuits. | Mafalda Cortez, Gijs Roelofs, Said Hamdioui, Giorgio Di Natale |
| 2014 | DATE | Hacking and protecting IC hardware. | Said Hamdioui, Jean-Luc Danger, Giorgio Di Natale, Fethulah Smailbegovic, Gerard van Battum, Mark Tehranipoor |
| 2014 | DATE | Bias Temperature Instability analysis of FinFET based SRAM cells. | Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor |
| 2014 | DATE | Interconnect test for 3D stacked memory-on-logic. | Mottaqiallah Taouil, Mahmoud Masadeh, Said Hamdioui, Erik Jan Marinissen |
| 2014 | HPSR | Line graph based fast rerouting and reconfiguration for handling transient and permanent node failures. | Prashant D. Joshi, Said Hamdioui |
| 2014 | ITC | Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. | Erik Jan Marinissen, Bart De Wachter, Ken Smith, Jorg Kiesewetter, Mottaqiallah Taouil, Said Hamdioui |
| 2014 | VTS | Quality versus cost analysis for 3D Stacked ICs. | Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen |
| 2013 | DATE | Reliability challenges of real-time systems in forthcoming technology nodes. | Said Hamdioui, Michael Nicolaidis, Dimitris Gizopoulos, Arnaud Grasset, Guido Groeseneken, Philippe Bonnot |
| 2013 | DATE | Is TSV-based 3D integration suitable for inter-die memory repair? | Mihai Lefter, George Razvan Voicu, Mottaqiallah Taouil, Marius Enachescu, Said Hamdioui, Sorin Dan Cotofana |
| 2013 | ETS | Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? | Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman |
| 2013 | ETS | Bias temperature instability analysis in SRAM decoder. | Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor |
| 2013 | ETS | Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers. | Christos Papameletis, Brion L. Keller, Vivek Chickermane, Erik Jan Marinissen, Said Hamdioui |
| 2012 | DATE | DfT schemes for resistive open defects in RRAMs. | Nor Zaidi Haron, Said Hamdioui |
| 2012 | DDECS | TSV based 3D stacked ICs: Opportunities and challenges. | Said Hamdioui |
| 2012 | DDECS | BTI impact on logical gates in nano-scale CMOS technology. | Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor |
| 2012 | ETS | VLSI Test technology: Why is the field not sexy enough? | Said Hamdioui, Rob Aitken |
| 2011 | DATE | Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories. | Nor Zaidi Haron, Said Hamdioui |
| 2011 | DDECS | Influence of parasitic memory effect on single-cell faults in SRAMs. | Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Michel Renovell |
| 2011 | DDECS | Stacking order impact on overall 3D die-to-wafer Stacked-IC cost. | Mottaqiallah Taouil, Said Hamdioui |
| 2011 | ETS | Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs. | Sandra Irobi, Zaid Al-Ars, Said Hamdioui |
| 2011 | ETS | Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. | Mottaqiallah Taouil, Said Hamdioui |
| 2011 | IOLTS | Modeling and mitigating NBTI in nanoscale circuits. | Seyab Khan, Said Hamdioui |
| 2011 | ITC | Generic, orthogonal and low-cost March Element based memory BIST. | Ad J. van de Goor, Said Hamdioui, Halil Kukner |
| 2010 | DATE | Memory testing with a RISC microcontroller. | Ad J. van de Goor, Georgi Gaydadjiev, Said Hamdioui |
| 2010 | DATE | NBTI modeling in the framework of temperature variation. | Seyab, Said Hamdioui |
| 2010 | DDECS | Using a CISC microcontroller to test embedded memories. | Ad J. van de Goor, Said Hamdioui, Georgi Gaydadjiev |
| 2010 | DDECS | Low-cost, customized and flexible SRAM MBIST engine. | Ad J. van de Goor, Christian Jung, Said Hamdioui, Georgi Gaydadjiev |
| 2010 | DDECS | Advanced embedded memory testing: Reducing the defect per million level at lower test cost. | Said Hamdioui, Ad J. van de Goor |
| 2010 | IOLTS | Temperature dependence of NBTI induced delay. | Seyab Khan, Said Hamdioui |
| 2010 | ITC | Detecting memory faults in the presence of bit line coupling in SRAM devices. | Sandra Irobi, Zaid Al-Ars, Said Hamdioui |
| 2010 | ITC | On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs. | Mottaqiallah Taouil, Said Hamdioui, Jouke Verbree, Erik Jan Marinissen |
| 2010 | VTS | Bit line coupling memory tests for single-cell fails in SRAMs. | Sandra Irobi, Zaid Al-Ars, Said Hamdioui |
| 2008 | ITC | Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs. | Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Georg Mueller |
| 2007 | DDECS | Manifestation of Precharge Faults in High Speed DRAM Devices. | Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev |
| 2007 | ETS | PPM Reduction on Embedded Memories in System on Chip. | Said Hamdioui, Zaid Al-Ars, Javier Jimnez, Jose Calero |
| 2007 | VTS | Optimizing Test Length for Soft Faults in DRAM Devices. | Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev |
| 2006 | DATE | Space of DRAM fault models and corresponding testing. | Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor |
| 2006 | ITC | DRAM-Specific Space of Memory Tests. | Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Georgi Gaydadjiev, Jrg E. Vollrath |
| 2005 | DATE | Framework for Fault Analysis and Test Generation in DRAMs. | Zaid Al-Ars, Said Hamdioui, Georg Mueller, Ad J. van de Goor |
| 2004 | ETS | Tests for address decoder delay faults in RAMs due to inter-gate opens. | Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars |
| 2004 | ITC | Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests. | Ad J. van de Goor, Said Hamdioui, Rob Wadsworth |
| 2004 | VTS | Effects of Bit Line Coupling on the Faulty Behavior of DRAMs. | Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor |
| 2003 | ETS | Importance of dynamic faults for new SRAM technologies. | Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor |
| 2003 | VTS | Detecting Intra-Word Faults in Word-Oriented Memories. | Said Hamdioui, Ad J. van de Goor, Mike Rodgers |
| 2002 | VTS | Testing Static and Dynamic Faults in Random Access Memories. | Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor |
| 1999 | ITC | Port interference faults in two-port memories. | Said Hamdioui, Ad J. van de Goor |
| 1998 | ITC | Consequences of port restrictions on testing two-port memories. | Said Hamdioui, Ad J. van de Goor |
| 1998 | VTS | Fault Models and Tests for Two-Port Memories. | Ad J. van de Goor, Said Hamdioui |