Design-for-Test for Intermittent Faults in STT-MRAMs.

Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

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