Siddharth Rao
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
13
Venues
6
Active years
2017–2025
Best venue rank
A
Where they publish
Papers
13 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | DATE | InterA-ECC: Interconnect-Aware Error Correction in STT-MRAM. | Surendra Hemaram, Mahta Mayahinia, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Tommaso Marinelli, Anita Farokhnejad, Gouri Sankar Kar |
| 2024 | ASPDAC | Hard Error Correction in STT-MRAM. | Surendra Hemaram, Mehdi B. Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Gouri Sankar Kar |
| 2024 | ETS | Design-for-Test for Intermittent Faults in STT-MRAMs. | Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? | Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2022 | VTS | Special Session: STT-MRAMs: Technology, Design and Test. | Anteneh Gebregiorgis, Lizhou Wu, Christopher Mnch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui |
| 2021 | DATE | Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2021 | ITC | Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2020 | DATE | Impact of Magnetic Coupling and Density on STT-MRAM Performance. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2020 | ITC | Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. | Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui |
| 2019 | ETS | Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. | Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar |
| 2019 | ITC | Device-Aware Test: A New Test Approach Towards DPPB Level. | Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui |
| 2018 | ITC | Electrical Modeling of STT-MRAM Defects. | Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui |
| 2017 | ISCAS | Cross-layer design and analysis of a low power, high density STT-MRAM for embedded systems. | Manu Komalan, Sushil Sakhare, Trong Huynh Bao, Siddharth Rao, Woojin Kim, Christian Tenllado, Jos Ignacio Gmez, Gouri Sankar Kar, Arnaud Furnmont, Francky Catthoor |