Sicong Yuan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
13
Venues
4
Active years
2023–2025
Best venue rank
A
Where they publish
Papers
13 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ASPDAC | Device-Aware Test for Anomalous Charge Trapping in FeFETs. | Sicong Yuan, Changhao Wang, Moritz Fieback, Hanzhi Xun, Mottaqiallah Taouil, Xiuyan Li, Danyang Chen, Lin Wang, Nicol Bellarmino, Riccardo Cantoro, Said Hamdioui |
| 2025 | ETS | In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Changhao Wang, Erbing Hua, Hassen Aziza, Leticia Bolzani Poehls, Riccardo Cantoro, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui |
| 2025 | ITC | Device-Aware Test for Threshold Voltage Shifting in FeFET. | Changhao Wang, Sicong Yuan, Nima Kolahimahmoudi, Hanzhi Xun, Nicol Bellarmino, Danyang Chen, Chujun Yin, Mottaqiallah Taouil, Moritz Fieback, Xiuyan Li, Lin Wang, Chaobo Li, Riccardo Cantoro, Said Hamdioui |
| 2024 | DATE | Device-Aware Diagnosis for Yield Learning in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ETS | Online Detection of Unique Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ETS | Design-for-Test for Intermittent Faults in STT-MRAMs. | Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Defects, Fault Modeling, and Test Development Framework for FeFETs. | Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui |
| 2024 | ITC | Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | ITC | Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? | Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | DATE | Device-Aware Test for Back-Hopping Defects in STT-MRAMs. | Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui |
| 2023 | ETS | Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ITC | Device-Aware Test for Ion Depletion Defects in RRAMs. | Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2023 | ITC | Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. | Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |