Fault Model-Driven Formal Verification of Cryptographic Hardware Against Fault Attacks.
Daniel Thirion, George-Cristian Sercaianu, Valentin Egloff, Jean-Marc Daveau, Vincent Beroulle, David Hly, Philippe Roche
Browse the full ETS paper archive.
Daniel Thirion, George-Cristian Sercaianu, Valentin Egloff, Jean-Marc Daveau, Vincent Beroulle, David Hly, Philippe Roche
Browse the full ETS paper archive.