Philippe Roche
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
19
Venues
7
Active years
2006–2026
Best venue rank
C
Where they publish
Papers
19 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | DDECS | A Framework for Chiplet Authentication During Post-Stacking Test. | Juan Suzano, Anthony Philippe, Fady Abouzeid, Philippe Roche, Giorgio Di Natale |
| 2026 | ETS | Fault Model-Driven Formal Verification of Cryptographic Hardware Against Fault Attacks. | Daniel Thirion, George-Cristian Sercaianu, Valentin Egloff, Jean-Marc Daveau, Vincent Beroulle, David Hly, Philippe Roche |
| 2026 | IOLTS | Reducing Safety False-Positives in Parity-Based Security AES Using a Hardware Fault Classifier. | Daniel Thirion, Jean-Marc Daveau, Valentin Egloff, Vincent Beroulle, Philippe Roche, David Hly |
| 2025 | DDECS | Comparative Study of Safety and Security-Protected AES Designs. | Daniel Thirion, Jean-Marc Daveau, Valentin Egloff, David Hly, Vincent Beroulle, Philippe Roche |
| 2025 | IOLTS | Dose Effects and Mitigation in 28nm FD-SOI Advanced Interface Bus Chiplet Interconnect. | Antoine Rouget, Fady Abouzeid, Adrian Evans, Victor Malherbe, Aleksandra Chumakova, Philippe Roche, Fabien Clermidy |
| 2025 | MEMOCODE | Formal Analysis of Fault Propagation in Complex Digital Systems. | Damiano Zuccal, Samuel Hon, Mohammad Reza Heidari Iman, Jean-Marc Daveau, Philippe Roche, Katell Morin-Allory |
| 2024 | ETS | IEEE 1838 compliant scan encryption and integrity for 2.5/3D ICs. | Juan Suzano, Antoine Chastand, Emanuele Valea, Giorgio Di Natale, Anthony Philippe, Fady Abouzeid, Philippe Roche |
| 2024 | ETS | Formal Resilience Metric Characterization in Complex Digital Systems. | Damiano Zuccal, Jean-Marc Daveau, Philippe Roche, Katell Morin-Allory |
| 2024 | MEMOCODE | Formal Fault Injection in Digital Blocks with Mined Assertions. | Damiano Zuccal, Paul Breuil, Jean-Marc Daveau, Philippe Roche, Katell Morin-Allory |
| 2022 | IOLTS | Software Product Reliability Based on Basic Block Metrics Recomposition. | Tiziano Fiorucci, Giorgio Di Natale, Jean-Marc Daveau, Philippe Roche |
| 2021 | IOLTS | Automated Dysfunctional Model Extraction for Model Based Safety Assessment of Digital Systems. | Tiziano Fiorucci, Jean-Marc Daveau, Giorgio Di Natale, Philippe Roche |
| 2018 | ISCAS | Q-Learning-based Adaptive Power Management for IoT System-on-Chips with Embedded Power States. | Yvan Debizet, Gunol Lallement, Fady Abouzeid, Philippe Roche, Jean-Luc Autran |
| 2016 | ISCAS | A 28nm FD-SOI standard cell 0.6-1.2V open-loop frequency multiplier for low power SoC clocking. | Martin Cochet, Sylvain Clerc, Mehdi Naceur, Pierre Schamberger, Damien Croain, Jean-Luc Autran, Philippe Roche |
| 2013 | DATE | Ultra-wide voltage range designs in fully-depleted silicon-on-insulator FETs. | Edith Beign, Alexandre Valentian, Bastien Giraud, Olivier Thomas, Thomas Benoist, Yvain Thonnart, Serge Bernard, Guillaume Moritz, Olivier Billoint, Y. Maneglia, Philippe Flatresse, Jean-Philippe Noel, Fady Abouzeid, Bertrand Pelloux-Prayer, Anuj Grover, Sylvain Clerc, Philippe Roche, Julien Le Coz, Sylvain Engels, Robin Wilson |
| 2011 | IOLTS | An approach to reduce computational cost in combinatorial logic netlist reliability analysis using circuit clustering and conditional probabilities. | Josep Torras Flaquer, Jean-Marc Daveau, Lirida A. B. Naviner, Philippe Roche |
| 2010 | DSN | Verification of soft error detection mechanism through fault injection on hardware emulation platform. | Oscar Bailan, Umberto Rossi, Anne Wantens, Jean-Marc Daveau, Salvatore Nappi, Philippe Roche |
| 2008 | IOLTS | Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS. | Philippe Roche, Mark Lysinger, Gilles Gasiot, Jean-Marc Daveau, Mehdi Zamanian, Pierre Dautriche |
| 2006 | DDECS | A Flexible SoPC-based Fault Injection Environment. | Pierre Vanhauwaert, Rgis Leveugle, Philippe Roche |
| 2006 | IOLTS | Factors That Impact the Critical Charge of Memory Elements. | Tino Heijmen, Damien Giot, Philippe Roche |