| 2026 | EXACT: Edge-eXplainable Autonomous Causal Telemetry for Silicon Lifecycle Management. | Hsiao-Ping Ni, Eduardo Ortega, Krishnendu Chakrabarty |
| 2026 | Shooting Neutrons at Neurons: Radiation Testing of a Spiking Neural Network on Flash-Based FPGAs. | Wim Nijsink, Bruno Endres Forlin, Amirreza Yousefzadeh, Marco Ottavi |
| 2026 | How Testing must change in the age of AI processors, Silent Data Corruption Failures and 100s of Chiplets. | Phil Nigh |
| 2026 | Hardware Trojans Horses: Two Decades Later, What We Really Know. | Giorgio Di Natale, Emanuele Valea |
| 2026 | SWEET-DREAM: Side-Channel Weakness Evaluation and Enhanced Mitigation for DREAM-CIM. | Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | A CIM-based Gaussian Random Number Generator for Edge Devices as Security Primitive. | Fouwad Jamil Mir, Asmae El Arrassi, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | Oscillation-Based Test for mm-Wave Reflection-Type Phase Shifters. | Marc Margalef-Rovira, Loc Vincent, Emmanuel Pistono, Sylvain Bourdel, Manuel J. Barragn, Philippe Ferrari |
| 2026 | A Holistic Framework to Assess Reliability Issues in Emerging Technologies due to Ageing, Voltage and Temperature Variation. | Sara Mannaa, Grgory Loubet, Salvatore Pappalardo, Cdric Marchand, Damien Deleruyelle, Alberto Bosio, Christoph Lenz, Oskar Baumgartner, Yifan Wang, Franois Marc, Chhandak Mukherjee, Marina Deng, Cristell Maneux, Ian O'Connor |
| 2026 | Design-for-Testability and Built-In Self-Test Techniques for SRAM-Based Compute-In-Memory Systems. | Shyue-Kung Lu, Chin-Jung Lee |
| 2026 | Re-sequencing ECC and Built-In Self-Repair with In-Page Fault Scrambling for Enhancing Yield and Reliability of Flash Memory. | Shyue-Kung Lu, Qian-Rui Dong |
| 2026 | Exploration of Reference Trimming Schemes for STT-MRAMs. | Pei-Yun Lin, Jin-Fu Li |
| 2026 | A real opportunity or still a promise? The current status of the RISC-V ecosystem. | Elia Lazzeri, Gianluca Furano, Luca Cassano |
| 2026 | Auto-Generating Ageing Self-Tests with Hardware in the Loop for Commercial Microcontrollers. | Leandro Lanzieri, Grschwin Fey, Holger Schlarb, Thomas C. Schmidt |
| 2026 | Introduction to Post Quantum Cryptography for Resource Constrained Systems. | Leonidas Kosmidis, Sergi Alcaide, Matina Maria Trompouki, Antonio Escobar-Molero, Adam Anglart, Daniel Van Geest, Martin Zuber, Jean-Paul Truong, Andrej Grebenc, Detlef Houdeau |
| 2026 | ARMOR: Architectural Reliability via Multi-Objective Optimization for Early-Exit Neural Networks. | Michalis Kontos, Georgios Konstantinidis, Theocharis Theocharides, Maria K. Michael |
| 2026 | Extending FPGA-based NRZ Test Signals Beyond 100 Gbps. | David C. Keezer, Cao Wang, Shengbo Liu, Xiaochun Li, Yindong Xiao |
| 2026 | Bridging the Speed-Accuracy Gap: Layout-Aware Pre-Silicon Side-Channel Analysis. | Asmaa Kassimi, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2026 | Leading-Edge Test Technology and Strategies for Automotive Products. | Kazuyuki Iwaguro |
| 2026 | SOLDER: State-Space Oriented Learning with Denoising-Enhanced Representations for PCB Defect Analysis. | Md Fahim Ul Islam, Krishnendu Chakrabarty |
| 2026 | TDsReCAM: Time-Domain sensing for reliable ReRAM-based Content Addressable Memory. | Haneen G. Hezayyin, Mahta Mayahinia, Mehdi B. Tahoori, Sule Ozev |
| 2026 | Discovering Unknown Wafermap Patterns Using Cluster-Graph-Based Analytics. | Qiang Guo, Zixin Shen, Hongliang L, Liangliang Yu, Chunlin Ren, Junlin Huang |
| 2026 | Actuarial Voltage Scaling (AVS+): A Statistical Reliability Framework for Reducing Guardbands in Systolic Arrays. | Larisa Goffman-Vinopal |
| 2026 | Shaping the Future of Multi-Die Stacking: Overcoming Challenges through Collaboration and Standards. | Sandeep Kumar Goel |
| 2026 | Test Sample Ranking for Fault Detection in Decision Tree-based Inference Model. | Antonio Emmanuele, Mario Barbareschi, Alberto Bosio |
| 2026 | Distributed Delay-Based BIST for Mixed-Signal Circuits in Flexible Electronics. | Paula Carolina Lozano Duarte, Sule Ozev, Mehdi B. Tahoori |