IEEE European Test Symposium
ETS
B
CORE rank
CORE rank (raw)
B
Fields of research
Computer Systems Engineering
Papers indexed
1,163
1999–2026
Papers per year
199968 peak2026
Most published authors
ETS papers
1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2026 | Use of GitHub Copilot Agent Mode for Automated Development in R&D Data Engineering. | Marco D'Acunzo, Daniele Rossi, Jamal Mohamad Maamoun, Giorgia Cassetta |
| 2026 | Testing of a 12 bit SARA And Cand Analog Scan. | Anthony Coyette, Wim Dobbelaere, Doina Dima, Arlind Billa, Krzysztof Jurga, Vladimir Zivkovic, Stephen Sunter |
| 2026 | Efficient Hash-to-Index via Rejection Sampling for Online Fault Detection with Bloom/Cuckoo Filters. | Elijah Seth Cishugi, Kuan-Hsun Chen, Marco Ottavi |
| 2026 | Robustness Assessment of Edge AI-Based Li-Ion Battery State-Of-Health Prediction. | Alexandru Ciobotaru, Cosmina Corches, Dan Gota, Szilrd Enyedi, Ovidiu Stan, Liviu Miclea |
| 2026 | STA-Based Single Event Transient Propagation in Advanced Technology Nodes. | Nikolaos Chatzivangelis, Marios Karagiannis, Christos Georgakidis, Nikolaos Sketopoulos, Marko S. Andjelkovic, Luigi Dilillo, Christos P. Sotiriou |
| 2026 | A Circular Repair Scheme for 3DIC Die-to-Die Interconnects. | Anshuman Chandra, Moiz Khan, Barbara Dzialowska, Marta Stepniewska |
| 2026 | Soft-Error Sensitivity Analysis of Adder Tree architectures for Compute-In-Memory Accelerators. | Panagiotis Chaidos, Alexis Maras, Georgios Alexandris, Dimitrios Soudris, Sotirios Xydis |
| 2026 | Exploration of Machine Learning-Based Test Methodologies in High-Volume Manufacturing RF Testing. | Hakan Cetin, Alexandre Leon, Manuel J. Barragn, Philippe Ferrari |
| 2026 | Encoded Repair Configuration Chains for Die-to-Die Interconnect Test and Repair Language. | Ashish Reddy Bommana, Anshuman Chandra, Moiz Khan |
| 2026 | Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph. | Paolo Bernardi, Lorenzo Cardone, Stefano Quer |
| 2026 | Exploiting Near-Memory Computing Resources for Native, Adaptive, and Low-Overhead MBIST. | Sabrina Ait Belkacem, Lila Ammoura, Maria Ramirez-Corrales, Marie-Lise Flottes, Patrick Girard, Jean-Philippe Noel, Arnaud Virazel |
| 2026 | Impact and Characterization of Single Event Failures in Hyperdimensional Computing Hardware Accelerator. | Marcello Barbirotta, Marco Angioli, Rocco Martino, Federico Frontera, Antonio Mastrandrea, Mauro Olivieri |
| 2026 | Beyond Fingerprints: Systematic Design of APUFs for Batch Identification. | Lina Baolati, Wenjing Rao, Natasha Devroye |
| 2026 | CODA: Confidence-Driven Adaptive Testing of Analog/Mixed-Signal Circuits Using Gaussian Mixture Models. | Ankush, Ashiqur Rasul, Anurup Saha, Abhijit Chatterjee |
| 2026 | Advances in Testing and Reliability Benchmarks. | Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Gabriele Filipponi, Giusy Iaria, Giacomo Perlo, Irith Pomeranz, Antonio Porsia, Annachiara Ruospo, Ernesto Snchez, Vittorio Turco |
| 2026 | Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis. | Simone Anedda, Paolo Bernardi, Matteo Coppetta, Giorgio Insinga, Tommaso Montedoro, Annachiara Ruospo, Rudolf Ullmann, Felix Tengler |
| 2026 | Reliability, Test, and Security of Compute-In-Memories. | Soyed Tuhin Ahmed, Krishnendu Chakrabarty, Jin-Fu Li, Mottaqiallah Taouil, Fouwad Jamil Mir, Said Hamdioui, Mehdi B. Tahoori, Martin Keim, Jongsin Yun |
| 2026 | Attacks Exploiting On-Chip Instruments and IJTAG Protection. | Joel hlund, Fanny Lundberg, Markus Trmnen, Erik Larsson |
| 2025 | Analysis and Mitigation of Radiation Effects in SRAM-based Register Files. | Zhe Zhang, Surendra Hemaram, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2025 | In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Changhao Wang, Erbing Hua, Hassen Aziza, Leticia Bolzani Poehls, Riccardo Cantoro, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui |
| 2025 | Multi Coefficient CPA on a Black Box Hardware Implementation of CRYSTALS-Kyber. | Tarick Welling, Mal Gay, Ilia Polian |
| 2025 | Automated Test Equipment Drift Characterization Based on Gauge Repeatability and Reproducibility. | Anand Venkatachalam, Ernst Aderholz, Matthias Sauer, Simon Schweizer, Matthias Werner, Ilia Polian |
| 2025 | FastGDBN: A GPU-Accelerated DNN for Identifying Good Dies in Bad Neighborhoods. | Yu-Heng Tsao, Yu-Guang Chen |
| 2025 | Computing with Printed and Flexible Electronics. | Mehdi B. Tahoori, Emre Ozer, Georgios Zervakis, Konstantinos Balaskas, Priyanjana Pal |
| 2025 | FSMlock: Defending against Oracle-based Sequential Logic-Locking Attacks under Output-Corruption Requirements. | Ioannis Stavrinos, Christos Chalagiannis, Emmanouil Kalligeros |
51–75 of 1,163← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- AITCIEEE International Test Conference
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design