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IEEE European Test Symposium

ETS

B

CORE rank

CORE rank (raw)

B

Fields of research

Computer Systems Engineering

Papers indexed

1,163

1999–2026

Best Computer Systems Engineering conferences

Papers per year

199968 peak2026

Most published authors

ETS papers

1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2025On the Trustworthiness of Spiking Neural Networks and Neuromorphic Systems.Theofilos Spyrou, Haralampos-G. Stratigopoulos, Ihsen Alouani, Said Hamdioui, Anteneh Gebregiorgis
2025SiFFS: A Scalable in-Fault Functional Simulation Framework for Fault Criticality Analysis.Haripriya R. S, Naveen Kollepara, Jaynarayan T. Tudu
2025Structural Testing of a RRAM-based AI Accelerator Core.Emmanouil Anastasios Serlis, Hanzhi Xun, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback
2025On the Fault Sensitivity of Natural Language Embeddings Computation.Sumeet Sapkal, Ussama Zahid, Giulio Gambardella, Haralampos-G. Stratigopoulos, Brian Clerkin
2025Confidence Driven Compact Testing of Compute-in-Memory Based Language Models.Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee
2025Non-Uniform Error Correction for Hyperdimensional Computing Edge Accelerators.Mahboobe Sadeghipour Roodsari, Surendra Hemaram, Mehdi B. Tahoori
2025Holistic Memory DFT Partitioning Using a Convolution-Based Algorithm.Olivier Romain, Wojciech Gierszal, Luc Romain, Artur Pogiel
2025Heterogeneous Integration of Advanced CMOS and Emerging Devices: Challenges and Solutions.Letcia Maria Bolzani Phls, Andr Lucas Chinazzo, Mahdi Benkhelifa, Anirban Kar, Hussam Amrouch, Milos Krstic
2025LLM-aided Test Generation for Custom Neural Network Hardware Accelerators.Federico Nicols Peccia, Tobias Hald, Oliver Bringmann
2025Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance.Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim
2025Identification of Failing Flip-Flops with Triangular Test Response Compaction.Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer
2025Dependable Neuromorphic Computing-in-Memory Architectures.Farhad Merchant, Ankit Bende, Markus Fritscher, Shahar Kvatinsky, Simranjeet Singh, Vikas Rana, Regina Dittmann, Keerthi Dorai Swamy Reddy, Christian Wenger, Fouwad Jamil Mir, Mottaqiallah Taouil, Manil Dev Gomony, Said Hamdioui, Henk Corporaal
2025Modeling and Analysis of Aging Impact on SRAM PUFs for Advanced FinFET Technology Nodes.Shayesteh Masoumian, Roel Maes, Noemie Beringuier-Boher, Karthik Keni Yerriswamy, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil
2025MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory.Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori
2025Synergistic Built-In ECC Repair (BIER) Technique for Enhancing Yield and Reliability of Flash Memory.Shyue-Kung Lu, Chun-Kai Chao, Kohei Miyase
2025Machine Learning-Assisted Side-Channel Analysis for Software Integrity Verification.Niklas Lindskog, Hkan Englund, Jakob Sternby, Elena Dubrova
2025A UCIe Compatible Repair Scheme for the Clustered Faults in the Hexagonal Array of Interconnect Lanes.Zhaohong Lin, Xiaole Cui, Juncheng Pu, Huan Yang
2025Local Trimming Method for Enhancing the Read Reliability of STT-MRAMs.Pei-Yun Lin, Jin-Fu Li
2025MTMS: Age-Aware Multi-Task Multi-Layer Stacking for SSD Failure Prediction.Guo Li, Zijun Jing, Jing Li, Jianli Ding
2025Optimizing RO-PUFs: A Filtering Approach to Reliability and Entropy Trade-offs.Vasilii Kulagin, Giorgio Di Natale, Elena-Ioana Vatajelu
2025Synthesizing 56 Gbps NRZ Test Signals Using FPGAs and SiGe Logie.David C. Keezer, Cao Wang, Shengbo Liu
2025An Integrated Framework for Aging Analysis Based on an Age-Aware Cell Library.Amirmahdi Joudi, Negin Safari, Fatemeh Mohammadzadeh, Katayoon Basharkhah, Fatemeh Sheikhshoaei, Zainalabedin Navabi
2025European Test Symposium Teams: an Anniversary Snapshot.Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025Robust Pattern Generation for Small Delay Faults under the Impact of Variations.Hanieh Jafarzadeh, Sybille Hellebrand, Hans-Joachim Wunderlich
2025Physical Unclonable Functions (PUFs): Foundations, Evaluation, and Testing for Secure Hardware Systems.Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu
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