IEEE European Test Symposium
ETS
B
CORE rank
CORE rank (raw)
B
Fields of research
Computer Systems Engineering
Papers indexed
1,163
1999–2026
Papers per year
199968 peak2026
Most published authors
ETS papers
1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2025 | Automatic Test Pattern Generation for Printed Neuromorphic Circuits. | Tara Gheshlaghi, Priyanjana Pal, Alexander Studt, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori |
| 2025 | Multi-Context Execution on a RISC-V Core for Mixed-Criticality Systems. | Leonardo Fazzini, Giacomo Valente, Fabio Federici, Matthew P. Corbett, Tania Di Mascio |
| 2025 | Silent Data Corruption: DRAM Root Causes and Ways of Improving Test Quality Towards 0ppm. | Chenyu Fang, Peter Poechmueller |
| 2025 | Towards Understanding of System-Level Test Unique Fails. | Nourhan Elhamawy, Jens Anders, Ilia Polian, Matthias Sauer |
| 2025 | Pin Electronics for Instrumentation and Automated Test Equipment: Challenges and Solutions. | Sandeep D'Souza, Matthew Getz, Patrick Sullivan, Joseph Peraza, Gerwin Veltink, Paul Van Ulsen |
| 2025 | Reliability Under Stress: The Impact of Localized Aging on RO-PUF Architectures in FPGAs. | Aghiles Douadi, Elena-Ioana Vatajelu, Paolo Maistri, David Hly, Vincent Beroulle, Giorgio Di Natale |
| 2025 | Extendable E | Po-Yao Chuang, Erik Jan Marinissen |
| 2025 | A Novel BIST Method for Multi-Port Register Files. | Andy Chen, Vianney Choserot, Munish Kumar, Khushal Gelda, Shreyas Pramod Dixit, Wei Zou, Jongsin Yun, Harshitha Kodali, Albert Au, Lori Schramm, Martin Keim |
| 2025 | FLARE: Fault Attack Leveraging Address Reconfiguration Exploits in Multi-Tenant FPGAs. | Jayeeta Chaudhuri, Hassan Nassar, Dennis R. E. Gnad, Jrg Henkel, Mehdi B. Tahoori, Krishnendu Chakrabarty |
| 2025 | DFT Techniques For Efficient 3D IC Interconnect Test For Chiplet and Multi-Die Package. | Anshuman Chandra, Chi-Chun Yang, Quoc Phan, Martin Keim |
| 2025 | Testing Functional Interfaces And Complex PADs Within Multi-Die Packages With IEEE P3405. | Anshuman Chandra, Nir Sever, Martin Keim |
| 2025 | Early Result Capture: Racing Conditions in Pipeline due to Clock Glitches. | Roua Boulifa, Paolo Maistri, Giorgio Di Natale |
| 2025 | AI-Assisted Framework for Real-Time Monitoring and Management of Probe Cards in Electrical Wafer Sort Applications. | Mehdi Bejani, Davide Appello, Marco Mauri, Simone Todaro, Stefano Mariani |
| 2025 | BISSEL: Built-In Self Security via Embedded Sensors for Reproducible Side-Channel Leakage Assessment. | Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi |
| 2025 | Pulsed Electromagnetic Fault Injection Attack on Ring Oscillator-based PUFs in FPGAs. | Sami El Amraoui, Aghiles Douadi, Rgis Leveugle, Paolo Maistri |
| 2025 | Security Risks in AI Accelerators: Detecting RTL Vulnerabilities to Model Theft with Formal Verification. | Mohamed Shelkamy Ali, Lucas Deutschmann, Johannes Mller, Anna Lena Duque Antn, Mohammad Rahmani Fadiheh, Dominik Stoffel, Wolfgang Kunz |
| 2025 | Securing Reconfigurable Scan Networks Against Data Sniffing and Data Alteration Attacks. | Joel hlund, Markus Trmnen, Mikael Kerttu, Pamela Svensson, Torbjrn Mnefjord, Christian Johansson, Erik Larsson |
| 2025 | Design-for-Test and Calibration for Silicon Photonics using Ring Resonators and Wavelength Division Multiplexing. | Pratishtha Agnihotri, Lawrence M. Schlitt, Priyank Kalla, Steve Blair |
| 2025 | Self-Aware Silicon: Enhancing Lifecycle Management with Intelligent Testing and Data Insights. | Fabian Vargas, Marko S. Andjelkovic, Milos Krstic, Anirban Kar, Swati Deshwal, Yogesh Singh Chauhan, Hussam Amrouch, Daniel Tille, Sebastian Huhn |
| 2025 | Large Language Models (LLMs) for Verification, Testing, and Design. | Chandan Kumar Jha, Muhammad Hassan, Khushboo Qayyum, Sallar Ahmadi-Pour, Kangwei Xu, Ruidi Qiu, Jason Blocklove, Luca Collini, Andre Nakkab, Ulf Schlichtmann, Grace Li Zhang, Ramesh Karri, Bing Li, Siddharth Garg, Rolf Drechsler |
| 2024 | Formal Resilience Metric Characterization in Complex Digital Systems. | Damiano Zuccal, Jean-Marc Daveau, Philippe Roche, Katell Morin-Allory |
| 2024 | A Concept of Provably Detected Defects for Analog Defect Simulation Campaign Improvement. | Vladimir A. Zivkovic, Inga Abel, Anthony Candage |
| 2024 | MBIST-based weak bit screening method for embedded MRAM. | Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Mnch, Martin Keim |
| 2024 | Design-for-Test for Intermittent Faults in STT-MRAMs. | Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | Semiconductor Application Fail Root Causes And Secure Test Remedy. | Heguo Yin, Peter Poechmueller |
101–125 of 1,163← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- AITCIEEE International Test Conference
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design