IEEE European Test Symposium
ETS
B
CORE rank
CORE rank (raw)
B
Fields of research
Computer Systems Engineering
Papers indexed
1,163
1999–2026
Papers per year
199968 peak2026
Most published authors
ETS papers
1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2024 | A Fully Pipelined High-Performance Elliptic Curve Cryptography Processor for NIST P-256. | Han Yan, Shuai Chen, Junying Huang, Jing Ye, Huawei Li, Xiaowei Li |
| 2024 | Online Detection of Unique Faults in RRAMs. | Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
| 2024 | Keynote 2 - Sustainability and the Outlook of Semiconductor Industry. | Cheng-Wen Wu, Shi-Yu Huang |
| 2024 | Test and Repair Improvements for UCIe. | Tsung-Hsuan Wang, Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen |
| 2024 | Cross-Layer Reliability Analysis of NVDLA Accelerators: Exploring the Configuration Space. | Alessandro Veronesi, Alessandro Nazzari, Dario Passarello, Milos Krstic, Michele Favalli, Luca Cassano, Antonio Miele, Davide Bertozzi, Cristiana Bolchini |
| 2024 | A SystemC-AMS Development Framework for High Power IC Test-Hardware. | Davide Turossi, Andrea Baschirotto |
| 2024 | Approximate Fault-Tolerant Neural Network Systems. | Marcello Traiola, Salvatore Pappalardo, Ali Piri, Annachiara Ruospo, Bastien Deveautour, Ernesto Snchez, Alberto Bosio, Sepide Saeedi, Alessio Carpegna, Anil Bayram Gogebakan, Enrico Magliano, Alessandro Savino |
| 2024 | AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators. | Mahdi Taheri, Natalia Cherezova, Samira Nazari, Ahsan Rafiq, Ali Azarpeyvand, Tara Ghasempouri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin |
| 2024 | IEEE 1838 compliant scan encryption and integrity for 2.5/3D ICs. | Juan Suzano, Antoine Chastand, Emanuele Valea, Giorgio Di Natale, Anthony Philippe, Fady Abouzeid, Philippe Roche |
| 2024 | On-chip Built-In Self-Calibration of Thermal Variations for Mixed-Signal In-Memory Computing. | Gaurav Singh, Omar Numan, Dipesh C. Monga, Martin Andraud, Kari Halonen |
| 2024 | Silent Data Corruption from Timing Marginalities Due to Process Variations. | Adit D. Singh |
| 2024 | Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties. | Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflger, Ilia Polian |
| 2024 | Optimizing System-Level Test Program Generation via Genetic Programming. | Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian |
| 2024 | Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery. | Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee |
| 2024 | Combining Built-In Redundancy Analysis with ECC for Memory Testing. | Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim |
| 2024 | Power Analysis Attack Against post-SAT Logic Locking schemes. | Nassim Riadi, Florent Bruguier, Pascal Benoit, Sophie Dupuis, Marie-Lise Flottes |
| 2024 | What Would Interactive Testing With 1687 Look Like? | Michele Portolan, Martin Keim, J. F. Cot, Hans-Martin Von Staud |
| 2024 | Error Detection and Correction Codes for Safe In-Memory Computations. | Luca Parrini, Taha Soliman, Benjamin Hettwer, Jan Micha Borrmann, Simranjeet Singh, Ankit Bende, Vikas Rana, Farhad Merchant, Norbert Wehn |
| 2024 | Fault Sensitivity Analysis of Printed Bespoke Multilayer Perceptron Classifiers. | Priyanjana Pal, Florentia Afentaki, Haibin Zhao, Gurol Saglam, Michael Hefenbrock, Georgios Zervakis, Michael Beigl, Mehdi B. Tahoori |
| 2024 | Faulty Function Extraction for Defective Circuits. | Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. Shawn Blanton |
| 2024 | Polynomial Formal Verification of Approximate Adders with Constant Cutwidth. | Mohamed A. Nadeem, Chandan Kumar Jha, Rolf Drechsler |
| 2024 | Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees. | Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil |
| 2024 | New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. | Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra |
| 2024 | Silent Data Corruption: Test or Reliability Problem? | Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen |
| 2024 | Counteracting Rowhammer by Data Alternation. | Stefan A. Lung, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil |
126–150 of 1,163← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- AITCIEEE International Test Conference
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design