New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405.
Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra
Browse the full ETS paper archive.
Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra
Browse the full ETS paper archive.