Martin Keim
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
56
Venues
8
Active years
1994–2026
Best venue rank
A*
Where they publish
Papers
56 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ETS | Reliability, Test, and Security of Compute-In-Memories. | Soyed Tuhin Ahmed, Krishnendu Chakrabarty, Jin-Fu Li, Mottaqiallah Taouil, Fouwad Jamil Mir, Said Hamdioui, Mehdi B. Tahoori, Martin Keim, Jongsin Yun |
| 2026 | ETS | An Enhanced, Self-Adapting Asynchronous Interface for High-Frequency IJTAG Instruments In Clock Mesh Environments. | Luc Romain, Katarzyna Wojnowska, Roger Mah, Albert Au, Wei Zou, Martin Keim |
| 2026 | ETS | Memory ECC Logic Testing using MBIST. | Wei Zou, Artur Pogiel, Martin Keim, Albert Au, Jongsin Yun, Luc Romain |
| 2026 | VTS | Innovative Practices Session: Recent Developments in IEEE Draft Standards P1687, P1687.2, and P2929. | Adam Cron, Stephen K. Sunter, Sankaran Menon, Jeff Rearick, Ilya Wagner, Tapan Chakraborty, Martin Keim |
| 2025 | ETS | Testing Functional Interfaces And Complex PADs Within Multi-Die Packages With IEEE P3405. | Anshuman Chandra, Nir Sever, Martin Keim |
| 2025 | ETS | DFT Techniques For Efficient 3D IC Interconnect Test For Chiplet and Multi-Die Package. | Anshuman Chandra, Chi-Chun Yang, Quoc Phan, Martin Keim |
| 2025 | ETS | A Novel BIST Method for Multi-Port Register Files. | Andy Chen, Vianney Choserot, Munish Kumar, Khushal Gelda, Shreyas Pramod Dixit, Wei Zou, Jongsin Yun, Harshitha Kodali, Albert Au, Lori Schramm, Martin Keim |
| 2025 | ETS | MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory. | Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori |
| 2025 | ETS | Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. | Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim |
| 2025 | ITC | Persistent High-Bandwidth IJTAG Data Delivery. | Jan Burchard, Matthias Kampmann, Ayush Patel, Marta Stepniewska, Przemyslaw Szymanski, Wojciech Janiszewski, Jean-Franois Ct, Michal Olejarz, Olga Przybysz, Lori Schramm, Jonathan Gaudet, Martin Keim |
| 2025 | ITC | Holistic Validation Pattern Generation for IEEE 1687 and Streaming Scan Networks. | Sebastian Huhn, Matthias Kampmann, Jan Burchard, Reinhard Meier, Kacper Czerniawski, Lori Schramm, Sandipan Sharma, Nikita Naresh, Wilson Pradeep, Prachi Sinha, Mayank Parasrampuria, Jonathan Gaudet, Martin Keim |
| 2025 | VTS | Periodic Non-Destructive Memory BIST for Automotive Applications. | Wei Zou, Artur Pogiel, Albert Au, Martin Keim |
| 2024 | ETS | New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. | Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra |
| 2024 | ETS | What Would Interactive Testing With 1687 Look Like? | Michele Portolan, Martin Keim, J. F. Cot, Hans-Martin Von Staud |
| 2024 | ETS | Combining Built-In Redundancy Analysis with ECC for Memory Testing. | Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim |
| 2024 | ETS | MBIST-based weak bit screening method for embedded MRAM. | Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Mnch, Martin Keim |
| 2024 | ITC | High-Bandwidth IJTAG over SSN. | Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-Franois Ct, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim |
| 2024 | ITC | Physical-Aware Interconnect Test for Multi-Die Systems Using 3Dblox Open Standard. | Sandeep Kumar Goel, Ankita Patidar, Moiz Khan, Frank Lee, Anshuman Chandra, Martin Keim, Naim Lemar, Jonathan Gaudet, Quoc Phan, Vidya Neerkundar |
| 2024 | ITC | Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. | Jaehoon Lee, Hyeonuk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim |
| 2024 | ITC | MBIST-based MRAM defect screening for safety-critical applications. | Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2024 | VTS | Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. | Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2024 | VTS | IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair. | Erik Jan Marinissen, Vineet Pancholi, Po-Yao Chuang, Martin Keim |
| 2023 | DATE | Smart Hammering: A practical method of pinhole detection in MRAM memories. | Sina Bakhtavari Mamaghani, Christopher Mnch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori |
| 2023 | ITC | Transitioning eMRAM from Pilot Project to Volume Production. | Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim |
| 2023 | VTS | Refreshing the JTAG Family. | Michele Portolan, Martin Keim, Jeff Rearick, Heiko Ehrenberg |
| 2022 | ITC | IEEE P1687.1: Extending the Network Boundaries for Test. | Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo |
| 2022 | VTS | MBIST-based Trim-Search Test Time Reduction for STT-MRAM. | Christopher Mnch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2021 | ETS | Convolutional Compaction-Based MRAM Fault Diagnosis. | Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2021 | ETS | MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. | Christopher Mnch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
| 2021 | ETS | Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. | Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim |
| 2020 | ETS | Linking Chip, Board, and System Test via Standards. | Michele Portolan, Jeff Rearick, Martin Keim |
| 2020 | ETS | MBIST Support for Reliable eMRAM Sensing. | Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa |
| 2020 | ITC | IJTAG Through a Two-Pin Chip Interface. | Manu Baby, Bernd Bttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-Franois Ct, Givargis Danialy, Martin Keim, Lori Schramm |
| 2020 | ITC | Modeling Novel Non-JTAG IEEE 1687-Like Architectures. | Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick |
| 2020 | ITC | Fast Bring-Up of an AI SoC through IEEE 1687 Integrating Embedded TAPs and IEEE 1500 Interfaces. | Haiying Ma, Ligang Lu, Haitao Qian, Jing Han, Xin Wen, Fanjin Meng, Rahul Singhal, Martin Keim, Yu Huang, Wu Yang |
| 2020 | ITC | MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. | Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda |
| 2018 | VTS | Innovative practices on memory test practice. | M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla |
| 2015 | ITC | A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. | Tassanee Payakapan, Senwen Kan, Ken Pham, Kathy Yang, Jean-Francois Cote, Martin Keim, Jennifer Dworak |
| 2013 | DSD | Industrial Application of IEEE P1687 for an Automotive Product. | Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath |
| 2012 | ETS | Re-using chip level DFT at board level. | Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson |
| 2008 | ITC | Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. | Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng |
| 2008 | ITC | Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. | Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann |
| 2008 | VTS | Automatic Test Pattern Generation for Interconnect Open Defects. | Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng |
| 2007 | ETS | Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. | Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware |
| 2007 | VTS | Silicon Evaluation of Static Alternative Fault Models. | Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware |
| 2006 | ITC | A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. | Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware |
| 2004 | ITC | Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. | Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski |
| 2002 | IOLTS | Sequential n -Detection Criteria: Keep It Simple. | Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker |
| 2000 | ETS | A parameterizable fault simulator for bridging faults. | Piet Engelke, Bernd Becker, Martin Keim |
| 1999 | ASPDAC | Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. | Martin Keim, Nicole Drechsler, Bernd Becker |
| 1999 | ETS | A scalable BIST architecture for delay faults. | Martin Keim, Ilia Polian, Harry Hengster, Bernd Becker |
| 1997 | VTS | Polynomial Formal Verification of Multipliers. | Martin Keim, Michael Martin, Bernd Becker, Rolf Drechsler, Paul Molitor |
| 1997 | VTS | On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms. | Can kmen, Martin Keim, Rolf Krieger, Bernd Becker |
| 1996 | VTS | On the (non-)resetability of synchronous sequential circuits. | Martin Keim, Bernd Becker, Birgitta Stenner |
| 1995 | DAC | Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy. | Rolf Krieger, Bernd Becker, Martin Keim |
| 1994 | ITC | A Hybrid Fault Simulator for Synchronous Sequential Circuits. | Rolf Krieger, Bernd Becker, Martin Keim |