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Holistic Validation Pattern Generation for IEEE 1687 and Streaming Scan Networks.

Sebastian Huhn, Matthias Kampmann, Jan Burchard, Reinhard Meier, Kacper Czerniawski, Lori Schramm, Sandipan Sharma, Nikita Naresh, Wilson Pradeep, Prachi Sinha, Mayank Parasrampuria, Jonathan Gaudet, Martin Keim

VenueAITC
Year2025
ProceedingsITC

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