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Lori Schramm

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

11

Venues

2

Active years

2020–2025

Best venue rank

A

Where they publish

Papers

11 indexed papers, newest first.

YearVenueTitleAuthors
2025ETSA Novel BIST Method for Multi-Port Register Files.Andy Chen, Vianney Choserot, Munish Kumar, Khushal Gelda, Shreyas Pramod Dixit, Wei Zou, Jongsin Yun, Harshitha Kodali, Albert Au, Lori Schramm, Martin Keim
2025ETSOptimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance.Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim
2025ITCPersistent High-Bandwidth IJTAG Data Delivery.Jan Burchard, Matthias Kampmann, Ayush Patel, Marta Stepniewska, Przemyslaw Szymanski, Wojciech Janiszewski, Jean-Franois Ct, Michal Olejarz, Olga Przybysz, Lori Schramm, Jonathan Gaudet, Martin Keim
2025ITCHolistic Validation Pattern Generation for IEEE 1687 and Streaming Scan Networks.Sebastian Huhn, Matthias Kampmann, Jan Burchard, Reinhard Meier, Kacper Czerniawski, Lori Schramm, Sandipan Sharma, Nikita Naresh, Wilson Pradeep, Prachi Sinha, Mayank Parasrampuria, Jonathan Gaudet, Martin Keim
2025ITCEarly Testing of Memory Redundant Row Elements.Luc Romain, Roger Mah, Katarzyna Wojnowska, Albert Au, Lori Schramm
2024ETSCombining Built-In Redundancy Analysis with ECC for Memory Testing.Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim
2024ITCHigh-Bandwidth IJTAG over SSN.Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-Franois Ct, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim
2024ITCDiagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies.Jaehoon Lee, Hyeonuk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim
2023ITCTransitioning eMRAM from Pilot Project to Volume Production.Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim
2020ITCIJTAG Through a Two-Pin Chip Interface.Manu Baby, Bernd Bttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-Franois Ct, Givargis Danialy, Martin Keim, Lori Schramm
2020ITCMBIST Supported Multi Step Trim for Reliable eMRAM Sensing.Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda