Edward J. McCluskey

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

116

Venues

Active years

1961–2008

Best venue rank

Where they publish

Papers

116 indexed papers, newest first.

Year	Venue	Title	Authors
2008	ITC	Failing Frequency Signature Analysis.	Jaekwang Lee, Edward J. McCluskey
2008	ITC	Launch-on-Shift-Capture Transition Tests.	Intaik Park, Edward J. McCluskey
2008	VTS	How Many Test Patterns are Useless?	Franois-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh
2008	VTS	Error Sequence Analysis.	Jaekwang Lee, Intaik Park, Edward J. McCluskey
2008	VTS	Inconsistent Fail due to Limited Tester Timing Accuracy.	Intaik Park, Donghwi Lee, Erik Chmelar, Edward J. McCluskey
2007	ITC	California scan architecture for high quality and low power testing.	Kyoung Youn Cho, Subhasish Mitra, Edward J. McCluskey
2007	VTS	Test Set Reordering Using the Gate Exhaustive Test Metric.	Kyoung Youn Cho, Edward J. McCluskey
2006	ITC	Classifying Bad Chips and Ordering Test Sets.	Franois-Fabien Ferhani, Edward J. McCluskey
2006	VTS	Session Abstract.	Erik Chmelar, Edward J. McCluskey
2005	ITC	Gate exhaustive testing.	Kyoung Youn Cho, Subhasish Mitra, Edward J. McCluskey
2005	VTS	Effective TARO Pattern Generation.	Intaik Park, Ahmad A. Al-Yamani, Edward J. McCluskey
2004	ITC	Speed Clustering of Integrated Circuits.	Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra
2004	VTS	ELF-Murphy Data on Defects and Test Sets.	Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, Franois-Fabien Ferhani, Edward Li, Subhasish Mitra
2004	VTS	Delay Defect Screening using Process Monitor Structures.	Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger
2004	VTS	A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs.	Mehdi Baradaran Tahoori, Edward J. McCluskey, Michel Renovell, Philippe Faure
2003	DAC	Seed encoding with LFSRs and cellular automata.	Ahmad A. Al-Yamani, Edward J. McCluskey
2003	VTS	Built-In Reseeding for Serial Bist.	Ahmad A. Al-Yamani, Edward J. McCluskey
2003	VTS	Bist Reseeding with very few Seeds.	Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
2002	ITC	Fault Grading FPGA Interconnect Test Configurations.	Mehdi Baradaran Tahoori, Subhasish Mitra, Shahin Toutounchi, Edward J. McCluskey
2002	VTS	Diagnosis of Sequence-Dependent Chips.	Chien-Mo James Li, Edward J. McCluskey
2002	VTS	Debating the Future of Burn-In.	Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
2002	VTS	Design for Testability and Testing of IEEE 1149.1 Tap Controller.	Subhasish Mitra, Edward J. McCluskey, Samy Makar
2002	VTS	Experimental Results for Slow-Speed Testing.	Chao-Wen Tseng, James Li, Edward J. McCluskey
2001	DSN	Techniques for Estimation of Design Diversity for Combinational Logic Circuits.	Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey
2001	FCCM	Column-Based Precompiled Configuration Techniques for FPGA.	Wei-Je Huang, Edward J. McCluskey
2001	FPGA	A memory coherence technique for online transient error recovery of FPGA configurations.	Wei-Je Huang, Edward J. McCluskey
2001	ITC	Testing for resistive opens and stuck opens.	Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
2001	ITC	Multiple-output propagation transition fault test.	Chao-Wen Tseng, Edward J. McCluskey
2001	ITC	On-line testing and recovery in TMR systems for real-time applications.	Shu-Yi Yu, Edward J. McCluskey
2001	VTS	Diagnosis of Tunneling Opens.	Chien-Mo James Li, Edward J. McCluskey
2001	VTS	Design Diversity for Concurrent Error Detection in Sequential Logic Circuts.	Subhasish Mitra, Edward J. McCluskey
2001	VTS	Design of Redundant Systems Protected Against Common-Mode Failures.	Subhasish Mitra, Edward J. McCluskey
2001	VTS	MINVDD Testing for Weak CMOS ICs.	Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh
2001	VTS	An Evaluation of Pseudo Random Testing for Detecting Real Defects.	Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson
2000	FCCM	A Reliable LZ Data Compressor on Reconfigurable Coprocessors.	Wei-Je Huang, Nirmal R. Saxena, Edward J. McCluskey
2000	FCCM	An ACS Robotic Control Algorithm with Fault Tolerant Capabilities.	Shu-Yi Yu, Nirmal R. Saxena, Edward J. McCluskey
2000	ITC	Testing for tunneling opens.	Chien-Mo James Li, Edward J. McCluskey
2000	ITC	Stuck-fault tests vs. actual defects.	Edward J. McCluskey, Chao-Wen Tseng
2000	ITC	Combinational logic synthesis for diversity in duplex systems.	Subhasish Mitra, Edward J. McCluskey
2000	ITC	Which concurrent error detection scheme to choose ?	Subhasish Mitra, Edward J. McCluskey
2000	PRDC	Transient errors and rollback recovery in LZ compression.	Wei-Je Huang, Edward J. McCluskey
2000	VTS	Word Voter: A New Voter Design for Triple Modular Redundant Systems.	Subhasish Mitra, Edward J. McCluskey
2000	VTS	Fault Escapes in Duplex Systems.	Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey
2000	VTS	Cold Delay Defect Screening.	Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu
1999	ITC	A design diversity metric and reliability analysis for redundant systems.	Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey
1999	ITC	Finite state machine synthesis with concurrent error detection.	Chaohuang Zeng, Nirmal R. Saxena, Edward J. McCluskey
1999	VTS	PADded Cache: A New Fault-Tolerance Technique for Cache Memories.	Philip P. Shirvani, Edward J. McCluskey
1998	ITC	Detecting resistive shorts for CMOS domino circuits.	Jonathan T.-Y. Chang, Edward J. McCluskey
1998	ITC	Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.	Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
1998	SMC	Dependable adaptive computing systems-the ROAR project.	Nirmal R. Saxena, Edward J. McCluskey
1998	VTS	Experimental Results for IDDQ and VLV Testing.	Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey
1997	ICCAD	An output encoding problem and a solution technique.	Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey
1997	ICCD	Pseudo-Random Pattern Testing of Bridging Faults.	Nur A. Touba, Edward J. McCluskey
1997	ITC	Scan Synthesis for One-Hot Signals.	Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey
1997	VTS	SHOrt voltage elevation (SHOVE) test for weak CMOS ICs.	Jonathan T.-Y. Chang, Edward J. McCluskey
1997	VTS	ATPG for scan chain latches and flip-flops.	Samy Makar, Edward J. McCluskey
1997	VTS	High-Level Synthesis for Orthogonal Sca.	Robert B. Norwood, Edward J. McCluskey
1996	ITC	Detecting Delay Flaws by Very-Low-Voltage Testing.	Jonathan T.-Y. Chang, Edward J. McCluskey
1996	ITC	Analysis and Detection of Timing Failures in an Experimental Test Chip.	Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell
1996	ITC	Orthogonal Scan: Low-Overhead Scan for Data Paths.	Robert B. Norwood, Edward J. McCluskey
1996	ITC	Altering a Pseudo-Random Bit Sequence for Scan-Based BIST.	Nur A. Touba, Edward J. McCluskey
1996	VTS	Quantitative analysis of very-low-voltage testing.	Jonathan T.-Y. Chang, Edward J. McCluskey
1996	VTS	Synthesis-for-scan and scan chain ordering.	Robert B. Norwood, Edward J. McCluskey
1996	VTS	Test point insertion based on path tracing.	Nur A. Touba, Edward J. McCluskey
1996	VTS	Applying two-pattern tests using scan-mapping.	Nur A. Touba, Edward J. McCluskey
1995	ITC	An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design.	Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey
1995	ITC	An Experimental Chip to Evaluate Test Techniques: Experiment Results.	Siyad C. Ma, Piero Franco, Edward J. McCluskey
1995	ITC	Functional Tests for Scan Chain Latches.	Samy Makar, Edward J. McCluskey
1995	ITC	Synthesis of Mapping Logic for Generating Transformed Pseudo-Random Patterns for BIST.	Nur A. Touba, Edward J. McCluskey
1995	VTS	Checking experiments to test latches.	Samy Makar, Edward J. McCluskey
1995	VTS	An apparatus for pseudo-deterministic testing.	Shridhar K. Mukund, Edward J. McCluskey, T. R. N. Rao
1995	VTS	Transformed pseudo-random patterns for BIST.	Nur A. Touba, Edward J. McCluskey
1994	ICCAD	Logic synthesis techniques for reduced area implementation of multilevel circuits with concurrent error detection.	Nur A. Touba, Edward J. McCluskey
1994	ITC	Automated Logic Synthesis of Random-Pattern-Testable Circuits.	Nur A. Touba, Edward J. McCluskey
1994	VTS	On-line delay testing of digital circuits.	Piero Franco, Edward J. McCluskey
1994	VTS	Three-pattern tests for delay faults.	Piero Franco, Edward J. McCluskey
1994	VTS	Open faults in BiCMOS gates.	Siyad C. Ma, Edward J. McCluskey
1993	ITC	Synthesizing for Scan Dependence in Built-In Self-Testable Desings.	LaNae J. Avra, Edward J. McCluskey
1993	ITC	Very-Low-Voltage Testing for Weak CMOS Logic ICs.	Hong Hao, Edward J. McCluskey
1993	ITC	Quality and Single-Stuck Faults.	Edward J. McCluskey
1992	ITC	Non-Conventional Faults in BiCMOS Digital Circuits.	Siyad C. Ma, Edward J. McCluskey
1991	ITC	Delay Testing of Digital Circuits by Output Waveform Analysis.	Piero Franco, Edward J. McCluskey
1991	ITC	Two-Pattern Test Capabilities of Autonomous TPG Circuits.	Kiyoshi Furuya, Edward J. McCluskey
1991	ITC	"Resistive Shorts" Within CMOS Gates.	Hong Hao, Edward J. McCluskey
1991	ITC	Refined Bounds on Signature Analysis Aliasing for Random Testing.	Nirmal R. Saxena, Piero Franco, Edward J. McCluskey
1990	ITC	Diagnosing CMOS bridging faults with stuck-at fault dictionaries.	Steven D. Millman, Edward J. McCluskey, John M. Acken
1989	ICCAD	The critical path for multiple faults.	Samy Makar, Edward J. McCluskey
1989	ICCAD	Arithmetic and galois checksums.	Nirmal R. Saxena, Edward J. McCluskey
1988	ITC	On the Testing of Multiplexers.	Samy Makar, Edward J. McCluskey
1988	ITC	Practice and Theory.	Edward J. McCluskey
1988	ITC	IC Quality and Test Transparency.	Edward J. McCluskey, Fred Buelow
1988	ITC	Detecting Bridging Faults with Stuck-at Test Sets.	Steven D. Millman, Edward J. McCluskey
1988	ITC	On Benchmarking Digital Testing Systems.	Samiha Mourad, Edward J. McCluskey
1988	ITC	Partial Hardware Partitioning: A New Pseudo-Exhaustive Test Implementation.	Jon G. Udeli Jr., Edward J. McCluskey
1987	ICDE	Modeling the Effect of Chip Failures on Cache Memory Systems.	Hassanein H. Amer, Edward J. McCluskey
1986	ITC	An Experiment on Intermittent-Failure Mechanisms.	Mario Lcio Crtes, Edward J. McCluskey
1986	ITC	Two CMOS Metastability Sensors.	Greg G. Freeman, Dick L. Liu, Bruce A. Wooley, Edward J. McCluskey
1986	ITC	Multiple Stuck-At Fault Coverage of Single Stuck-At Fault Test Sets.	Joseph L. A. Hughes, Edward J. McCluskey
1986	ITC	Circuits for Pseudo-Exhaustive Test Pattern Generation.	Laung-Terng Wang, Edward J. McCluskey
1986	ITC	A Hybrid Design of Maximum-Length Sequence Generators.	Laung-Terng Wang, Edward J. McCluskey
1985	ITC	Test Length for Pseudo Random Testing.	Cary K. Chin, Edward J. McCluskey
1985	ITC	Concurrent System-Level Error Detection Using a Watchdog Processor.	Aamer Mahmood, Edward J. McCluskey, Aydin Ersoz
1985	ITC	Test Teaching.	Edward J. McCluskey
1984	ITC	Lower Overhead Design for Testability of Programmable Logic Arrays.	Saied Bozorgui-Nesbat, Edward J. McCluskey
1984	ITC	Pseudo-Exhaustive Testing of Sequential Machines Using Signature Analysis.	Syed Zahoor Hassan, Edward J. McCluskey
1984	ITC	An Analysis of the Multiple Fault Detection Capabilities of Single Stuck-at Fault Test Sets.	Joseph L. A. Hughes, Edward J. McCluskey
1983	ITC	Concurrent Fault Detection Using a Watchdog Processor and Assertions.	Aamer Mahmood, Edward J. McCluskey, David J. Lu
1983	ITC	Teaching Testing.	Edward J. McCluskey
1983	ITC	Recurrent Test Patterns.	Edward J. McCluskey, David J. Lu
1982	DAC	Verification testing.	Edward J. McCluskey
1982	ITC	Built-In Verification Test.	Edward J. McCluskey
1980	RTSS	Summary of Structural integrity Checking.	David J. Lu, Edward J. McCluskey, Masood Namjoo
1964	FOCS	Derivation of optimum test sequences for sequential machines	J. F. Poage, Edward J. McCluskey
1963	FOCS	Logical design theory of NOR gate networks with no complemented inputs	Edward J. McCluskey
1962	FOCS	Reduction of feedback loops in sequential circuits and carry leads in iterative networks	Edward J. McCluskey
1961	FOCS	Minimal sums for Boolean functions having many unspecified fundamental products	Edward J. McCluskey