| 2026 | VTS | Embedded Tutorial: A Primal-Dual Paradigm for Agentic Test Data Analytics. | Li-C. Wang, Seoyeon Kim |
| 2025 | DAC | LLMs Meet Post-Silicon Test Engineering: A New Era (Invited). | Li-C. Wang |
| 2025 | ITC | IEA-Plugin: An AI Agent Reasoner for Test Data Analytics. | Seoyeon Kim, Yu Su, Li-C. Wang |
| 2024 | ITC | WM-Graph: Graph-Based Approach for Wafermap Analytics. | Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang |
| 2023 | ITC | IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat. | Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang |
| 2023 | ITC | Welcome Message ITC 2023. | Li-C. Wang, Jeff Rearick |
| 2022 | ITC | Language Driven Analytics for Failure Pattern Feedforward and Feedback. | Min Jian Yang, Yueling Zeng, Li-C. Wang |
| 2021 | ITC | MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification. | Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan |
| 2020 | ITC | Learning A Wafer Feature With One Training Sample. | Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa |
| 2019 | ICCAD | Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods: Invited Paper. | Li-C. Wang, Chuanhe Jay Shan, Ahmed Wahba |
| 2019 | ITC | Deploying A Machine Learning Solution As A Surrogate. | Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa |
| 2019 | VTS | Wafer Pattern Recognition Using Tucker Decomposition. | Ahmed Wahba, Li-C. Wang, Zheng Zhang, Nik Sumikawa |
| 2018 | ITC | Concept Recognition in Production Yield Data Analytics. | Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa |
| 2018 | ITC | An Autonomous System View To Apply Machine Learning. | Li-C. Wang |
| 2018 | VTS | Special session on machine learning for test and diagnosis. | Krishnendu Chakrabarty, Li-C. Wang, Gaurav Veda, Yu Huang |
| 2017 | ASPDAC | Feature extraction from design documents to enable rule learning for improving assertion coverage. | Kuo-Kai Hsieh, Sebastian Siatkowski, Li-C. Wang, Wen Chen, Jayanta Bhadra |
| 2017 | DAC | Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery. | Kuo-Kai Hsieh, Li-C. Wang, Wen Chen, Jayanta Bhadra |
| 2017 | ITC | Systematic defect detection methodology for volume diagnosis: A data mining perspective. | Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang |
| 2017 | ITC | Kernel based clustering for quality improvement and excursion detection. | Nik Sumikawa, Matt Nero, Li-C. Wang |
| 2017 | ITC | Some considerations on choosing an outlier method for automotive product lines. | Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg |
| 2017 | VTS | Learning the process for correlation analysis. | Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg |
| 2016 | VTS | Session 4B - Panel data analytics in semiconductor manufacturing. | Suriyaprakash Natarajan, Li-C. Wang |
| 2016 | VTS | Consistency in wafer based outlier screening. | Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli |
| 2015 | ASPDAC | Data mining in functional test content optimization. | Li-C. Wang |
| 2015 | ITC | Generalization of an outlier model into a "global" perspective. | Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch |
| 2014 | DAC | Data Mining In EDA - Basic Principles, Promises, and Constraints. | Li-C. Wang, Magdy S. Abadir |
| 2014 | ICCAD | On application of data mining in functional debug. | Kuo-Kai Hsieh, Wen Chen, Li-C. Wang, Jayanta Bhadra |
| 2014 | IOLTS | Multivariate outlier modeling for capturing customer returns - How simple it can be. | Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2014 | ITC | Yield optimization using advanced statistical correlation methods. | Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2013 | DAC | Simulation knowledge extraction and reuse in constrained random processor verification. | Wen Chen, Li-C. Wang, Jay Bhadra, Magdy S. Abadir |
| 2013 | ITC | A pattern mining framework for inter-wafer abnormality analysis. | Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2012 | ICCAD | Novel test detection to improve simulation efficiency - A commercial experiment. | Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir |
| 2012 | ITC | Functional test content optimization for peak-power validation - An experimental study. | Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang |
| 2012 | ITC | Screening customer returns with multivariate test analysis. | Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2012 | ITC | An experiment of burn-in time reduction based on parametric test analysis. | Nik Sumikawa, Li-C. Wang, Magdy S. Abadir |
| 2011 | DATE | Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. | Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir |
| 2011 | ITC | Forward prediction based on wafer sort data - A case study. | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2011 | VTS | Understanding customer returns from a test perspective. | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
| 2010 | ASPDAC | Automatic assertion extraction via sequential data mining of simulation traces. | Po-Hsien Chang, Li-C. Wang |
| 2010 | ASPDAC | Correlating system test Fmax with structural test Fmax and process monitoring measurements. | Janine Chen, Jing Zeng, Li-C. Wang, Michael Mateja |
| 2010 | ASPDAC | Data learning based diagnosis. | Li-C. Wang |
| 2010 | DAC | Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch. | Nicholas Callegari, Dragoljub Gagi Drmanac, Li-C. Wang, Magdy S. Abadir |
| 2010 | ICCAD | Online selection of effective functional test programs based on novelty detection. | Po-Hsien Chang, Dragoljub Gagi Drmanac, Li-C. Wang |
| 2010 | ISCAS | A new sampling method for analog behavioral modeling. | Hui Li, Makram Mansour, Sury Maturi, Li-C. Wang |
| 2010 | ITC | A kernel-based approach for functional test program generation. | Po-Hsien Chang, Li-C. Wang, Jayanta Bhadra |
| 2010 | ITC | Mining AC delay measurements for understanding speed-limiting paths. | Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja |
| 2010 | VTS | Selecting the most relevant structural Fmax for system Fmax correlation. | Janine Chen, Jing Zeng, Li-C. Wang, Jeff Rearick, Michael Mateja |
| 2010 | VTS | Impact of multiple input switching on delay test under process variation. | Sean H. Wu, Sreejit Chakravarty, Li-C. Wang |
| 2009 | ASPDAC | Path selection for monitoring unexpected systematic timing effects. | Nicholas Callegari, Pouria Bastani, Li-C. Wang, Sreejit Chakravarty, Alexander Tetelbaum |
| 2009 | DAC | Speedpath analysis based on hypothesis pruning and ranking. | Nicholas Callegari, Li-C. Wang, Pouria Bastani |
| 2009 | DAC | Predicting variability in nanoscale lithography processes. | Dragoljub Gagi Drmanac, Frank Liu, Li-C. Wang |
| 2009 | ITC | Feature based similarity search with application to speedpath analysis. | Nicholas Callegari, Li-C. Wang, Pouria Bastani |
| 2009 | ITC | Data learning techniques and methodology for Fmax prediction. | Janine Chen, Li-C. Wang, Po-Hsien Chang, Jing Zeng, S. Yu, Michael Mateja |
| 2009 | ITC | Minimizing outlier delay test cost in the presence of systematic variability. | Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang, Magdy S. Abadir |
| 2008 | DAC | Statistical diagnosis of unmodeled systematic timing effects. | Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir |
| 2008 | DAC | Speedpath prediction based on learning from a small set of examples. | Pouria Bastani, Kip Killpack, Li-C. Wang, Eli Chiprout |
| 2008 | DAC | Functional test selection based on unsupervised support vector analysis. | Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster |
| 2008 | ITC | Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained. | Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir |
| 2008 | ITC | A Study of Outlier Analysis Techniques for Delay Testing. | Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang |
| 2007 | DAC | Design-Silicon Timing Correlation A Data Mining Perspective. | Li-C. Wang, Pouria Bastani, Magdy S. Abadir |
| 2007 | ICCAD | An incremental learning framework for estimating signal controllability in unit-level verification. | Charles H.-P. Wen, Li-C. Wang, Jayanta Bhadra |
| 2007 | ITC | Analyzing the risk of timing modeling based on path delay tests. | Pouria Bastani, Benjamin N. Lee, Li-C. Wang, Savithri Sundareswaran, Magdy S. Abadir |
| 2007 | ITC | Enhancing signal controllability in functional test-benches through automatic constraint extraction. | Onur Guzey, Li-C. Wang, Jayanta Bhadra |
| 2007 | ITC | Statistical analysis and optimization of parametric delay test. | Sean Hsi Yuan Wu, Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir |
| 2006 | DAC | Refined statistical static timing analysis through. | Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir |
| 2006 | ICCAD | On bounding the delay of a critical path. | Leonard Lee, Li-C. Wang |
| 2006 | ICCD | Simulation-based functional test justification using a decision-digram-based Boolean data miner. | Charles H.-P. Wen, Onur Guzey, Li-C. Wang |
| 2006 | ITC | An Efficient Pruning Method to Guide the Search of Precision Tests in Statistical Timing Space. | Leonard Lee, Li-C. Wang |
| 2006 | ITC | Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective. | Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir |
| 2005 | DATE | An Efficient Sequential SAT Solver With Improved Search Strategies. | Feng Lu, Madhu K. Iyer, Ganapathy Parthasarathy, Li-C. Wang, Kwang-Ting Cheng, Kuang-Chien Chen |
| 2005 | ITC | Hazard-aware statistical timing simulation and its applications in screening frequency-dependent defects. | Benjamin N. Lee, Hui Li, Li-C. Wang, Magdy S. Abadir |
| 2005 | ITC | Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology. | Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Wei-Ting Liu, Ji-Jan Chen |
| 2005 | VTS | Reducing Pattern Delay Variations for Screening Frequency Dependent Defects. | Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir |
| 2005 | VTS | On Silicon-Based Speed Path Identification. | Leonard Lee, Li-C. Wang, Praveen Parvathala, T. M. Mak |
| 2005 | VTS | On A Software-Based Self-Test Methodology and Its Application. | Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Kai Yang, Wei-Ting Liu, Ji-Jan Chen |
| 2004 | ASPDAC | Improved symbolic simulation by functional-space decomposition. | Tao Feng, Li-C. Wang, Kwang-Ting Cheng |
| 2004 | ASPDAC | Jitter spectral extraction for multi-gigahertz signal. | Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang |
| 2004 | ASPDAC | Efficient reachability checking using sequential SAT. | Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang |
| 2004 | ASPDAC | TranGen: a SAT-based ATPG for path-oriented transition faults. | Kai Yang, Kwang-Ting Cheng, Li-C. Wang |
| 2004 | DAC | An efficient finite-domain constraint solver for circuits. | Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang |
| 2004 | DAC | On path-based learning and its applications in delay test and diagnosis. | Li-C. Wang, T. M. Mak, Kwang-Ting Cheng, Magdy S. Abadir |
| 2004 | DATE | Improved Symoblic Simulation by Dynamic Funtional Space Partitioning. | Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin |
| 2004 | DATE | Pattern Selection for Testing of Deep Sub-Micron Timing Defects. | Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng |
| 2004 | DATE | Random Jitter Extraction Technique in a Multi-Gigahertz Signal. | Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang |
| 2004 | DATE | Regression Simulation: Applying Path-Based Learning In Delay Test and Post-Silicon Validation. | Li-C. Wang |
| 2004 | ICCAD | A path-based methodology for post-silicon timing validation. | Leonard Lee, Li-C. Wang, T. M. Mak, Kwang-Ting Cheng |
| 2004 | ICCAD | Static statistical timing analysis for latch-based pipeline designs. | Rob A. Rutenbar, Li-C. Wang, Kwang-Ting Cheng, Sandip Kundu |
| 2004 | ITC | On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design. | Jing Zeng, Magdy S. Abadir, A. Kolhatkar, G. Vandling, Li-C. Wang, Jacob A. Abraham |
| 2004 | VTS | A Scalable On-Chip Jitter Extraction Technique. | Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang |
| 2003 | ASPDAC | Enhanced symbolic simulation for efficient verification of embedded array systems. | Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Manish Pandey, Magdy S. Abadir |
| 2003 | ASPDAC | Experience in critical path selection for deep sub-micron delay test and timing validation. | Jing-Jia Liou, Li-C. Wang, Angela Krstic, Kwang-Ting Cheng |
| 2003 | ASPDAC | Delta-sigma modulator based mixed-signal BIST architecture for SoC. | Chee-Kian Ong, Kwang-Ting (Tim) Cheng, Li-C. Wang |
| 2003 | DAC | Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models. | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak |
| 2003 | DAC | A signal correlation guided ATPG solver and its applications for solving difficult industrial cases. | Feng Lu, Li-C. Wang, Kwang-Ting Cheng, John Moondanos, Ziyad Hanna |
| 2003 | DATE | Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step. | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir |
| 2003 | DATE | A Circuit SAT Solver With Signal Correlation Guided Learning. | Feng Lu, Li-C. Wang, Kwang-Ting Cheng, Ric C.-Y. Huang |
| 2003 | ITC | Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies. | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak |
| 2003 | ITC | Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. | Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir |
| 2003 | VTS | Diagnosis of Delay Defects Using Statistical Timing Models. | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou |
| 2002 | DAC | False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation. | Jing-Jia Liou, Angela Krstic, Li-C. Wang, Kwang-Ting Cheng |
| 2002 | DAC | Enhancing test efficiency for delay fault testing using multiple-clocked schemes. | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams |
| 2002 | ICCAD | On theoretical and practical considerations of path selection for delay fault testing. | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng |
| 2002 | ITC | Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams |
| 2002 | ITC | Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems. | Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Magdy S. Abadir |
| 2002 | ITC | On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults. | Li-C. Wang, Magdy S. Abadir, Juhong Zhu |
| 2001 | ASPDAC | Module placement with boundary constraints using the sequence-pair representation. | Jianbang Lai, Ming-Shiun Lin, Ting-Chi Wang, Li-C. Wang |
| 2001 | VTS | Analysis of Testing Methodologies for Custom Designs in PowerPCTM Microprocessor. | Magdy S. Abadir, Juhong Zhu, Li-C. Wang |
| 2000 | ITC | Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. | Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer |
| 1999 | ITC | Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. | Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer |
| 1999 | ITC | Tradeoff analysis for producing high quality tests for custom circuits in PowerPC microprocessors. | Li-C. Wang, Magdy S. Abadir |
| 1999 | VTS | REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. | Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer |
| 1998 | DAC | Automatic Generation of Assertions for Formal Verification of PowerPC Microprocessor Arrays Using Symbolic Trajectory Evaluation. | Li-C. Wang, Magdy S. Abadir, Nari Krishnamurthy |
| 1998 | DATE | Measuring the Effectiveness of Various Design Validation Approaches For PowerPC(TM) Microprocessor Arrays. | Li-C. Wang, Magdy S. Abadir, Jing Zeng |
| 1998 | VTS | On Logic and Transistor Level Design Error Detection of Various Validation Approaches for PowerPC(tm) Microprocessor Arrays. | Li-C. Wang, Magdy S. Abadir, Jing Zeng |
| 1997 | ITC | A New Validation Methodology Combining Test and Formal Verification for PowerPC | Li-C. Wang, Magdy S. Abadir |
| 1996 | ICCD | A Better ATPG Algorithm and Its Design Principles. | Li-C. Wang, M. Ray Mercer, Thomas W. Williams |
| 1996 | ITC | Using Target Faults To Detect Non-Tartget Defects. | Li-C. Wang, M. Ray Mercer, Thomas W. Williams |
| 1995 | DATE | Enhanced testing performance via unbiased test sets. | Li-C. Wang, M. Ray Mercer, Thomas W. Williams |
| 1995 | ITC | On Efficiently and Reliably Achieving Low Defective Part Levels. | Li-C. Wang, M. Ray Mercer, Thomas W. Williams |
| 1995 | VTS | On the decline of testing efficiency as fault coverage approaches 100%. | Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams |
| 1993 | SPAA | Experience in Massively Parallel Discrete Event Simulation. | Albert G. Greenberg, Boris D. Lubachevsky, Li-C. Wang |