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Aaron C.-W. Liang

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

8

Venues

4

Active years

2019–2026

Best venue rank

A

Where they publish

Papers

8 indexed papers, newest first.

YearVenueTitleAuthors
2026ASPDACSOFA-H: Post-Synthesis Area Optimization via Functionally Encoded, Net-Driven Subgraph Mining and SAT-Based Hypercell Remapping.Jimmy Y.-C. Lee, Yen-Ju Su, Jiun-Cheng Tsai, Aaron C.-W. Liang, Charles H.-P. Wen, Hsuan-Ming Huang
2025ICCADCoP&R: Co-Optimizing Place-and-Route for Standard Cell Layout via MCTS and AllSAT.Yen-Ju Su, Jiun-Cheng Tsai, Hsuan-Ming Huang, Aaron C.-W. Liang, Han-Ya Tsai, Wei-Min Hsu, Jen-Hang Yang, Charles H.-P. Wen
2025ITCEnhancing Timing Predictability in Automotive Electronics: Addressing Aging and Temperature Distributions.Jeffery Y.-C. Chen, Jason W.-Y. Cheng, Aaron C.-W. Liang, Charles H.-P. Wen, Gung-Yu Pan, Hen-Ming Lin
2024ICCADMAXCell: PPA-Directed Multi-Height Cell Layout Routing Optimization using Anytime MaXSAT with Constraint Learning.Jiun-Cheng Tsai, Wei-Min Hsu, Yun-Ting Hsieh, Yu-Ju Li, Wei Huang, C. N. Ho, Hsuan-Ming Huang, Jen-Hang Yang, Heng-Liang Huang, Aaron C.-W. Liang, Charles H.-P. Wen
2023ITCPreventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs.Sam M.-H. Hsiao, Amy H.-Y. Tsai, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen, Herming Chiueh
2022ITCExistence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies.Sam M.-H. Hsiao, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen
2021DATEGenerating Layouts of Standard Cells by Implicit Learning on Design Rules for Advanced Processes.Aaron C.-W. Liang, Hsuan-Ming Huang, Charles H.-P. Wen
2019ITCFAE: Autoencoder-Based Failure Binning of RTL Designs for Verification and Debugging.Cheng-Hsien Shen, Aaron C.-W. Liang, Charles C.-H. Hsu, Charles H.-P. Wen