Adam W. Ley
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
1
Active years
1999–2009
Best venue rank
A
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | ITC | Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture. | Adam W. Ley |
| 2009 | ITC | Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes? | Adam W. Ley |
| 2007 | ITC | JTAG system test in a MicroTCA world. | Bradford G. Van Treuren, Adam W. Ley |
| 2006 | ITC | Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. | Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg |
| 1999 | ITC | The integration of boundary-scan test methods to a mixed-signal environment. | Adam W. Ley |