| 2008 | AICCSA | Transistor-level based defect tolerance for reliable nanoelectronics. | Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Melouki |
| 2006 | ISCAS | Finite state machine state assignment for area and power minimization. | Aiman H. El-Maleh, Sadiq M. Sait, F. Nawaz Khan |
| 2003 | ISCAS | On efficient extraction of partially specified test sets for synchronous sequential circuits. | Aiman H. El-Maleh, Khaled Al-Utaibi |
| 2003 | ISCAS | Simulated evolution algorithm for multiobjective VLSI netlist bi-partitioning. | Sadiq M. Sait, Aiman H. El-Maleh, Rush H. Al-Abuji |
| 2003 | ISCAS | General iterative heuristics for VLSI multiobjective partitioning. | Sadiq M. Sait, Aiman H. El-Maleh, Raslan H. Al-Abaji |
| 2003 | VTS | An Efficient Test Relaxation Technique for Synchronous Sequential Circuits. | Aiman H. El-Maleh, Khaled Al-Utaibi |
| 2001 | ICCD | Fuzzified Iterative Algorithms for Performance Driven Low Power VLSI Placement. | Sadiq M. Sait, Habib Youssef, Junaid A. Khan, Aiman H. El-Maleh |
| 2001 | ISCAS | A retiming-based test pattern generator design for built-in self test of data path architectures. | Aiman H. El-Maleh, Yahya E. Osais |
| 1998 | DAC | A Fast Sequential Learning Technique for Real Circuits with Application to Enhancing ATPG Performance. | Aiman H. El-Maleh, Mark Kassab, Janusz Rajski |
| 1995 | DAC | On Test Set Preservation of Retimed Circuits. | Aiman H. El-Maleh, Thomas E. Marchok, Janusz Rajski, Wojciech Maly |