Akira Taketani
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2010–2010
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | ETS | Test pattern selection to optimize delay test quality with a limited size of test set. | Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hiroshi Iwata, Hideo Fujiwara |