Alan W. Righter
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
6
Venues
1
Active years
1993–1998
Best venue rank
A
Where they publish
Papers
6 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | ITC | CMOS IC reliability indicators and burn-in economics. | Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell |
| 1997 | ITC | i | J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, C. J. Apodaca |
| 1996 | ITC | High Resolution I | Alan W. Righter, Jerry M. Soden, Richard W. Beegle |
| 1995 | ITC | Solving Known Good Die (and Substrate) Test Issues. | Alan W. Righter |
| 1994 | ITC | Defect Classes - An Overdue Paradigm for CMOS IC. | Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson |
| 1993 | ITC | A General Purpose I | Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins |