Alex Hsieh
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2007–2007
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | ITC | Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip. | Robert F. Molyneaux, Thomas A. Ziaja, Hong Kim, Shahryar Aryani, Sungbae Hwang, Alex Hsieh |