Alex S. Biewenga
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
6
Venues
1
Active years
1993–2007
Best venue rank
A
Where they publish
Papers
6 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | ITC | SiP-test: Predicting delivery quality. | Alex S. Biewenga, Frans G. M. de Jong |
| 2006 | ITC | SiP-TAP: JTAG for SiP. | Frans G. M. de Jong, Alex S. Biewenga |
| 2001 | ITC | Testing and programming flash memories on assemblies during high volume production. | Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers |
| 1999 | ITC | Static component interconnect test technology (SCITT) a new technology for assembly testing. | Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg |
| 1998 | ITC | Testing a multichip package for a consumer communications application. | Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer |
| 1993 | ITC | Using Boundary Scan Test to Test Random Access Memory Clusters. | Math Muris, Alex S. Biewenga |