Andreas Kux
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2014–2014
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2014 | ITC | Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. | Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase |