Ann-Christin Bette
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
3
Active years
2022–2023
Best venue rank
B
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2023 | ETS | Counterfeit Detection by Semiconductor Process Technology Inspection. | Matthias Ludwig, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl |
| 2022 | DATE | Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions. | Bernhard Lippmann, Ann-Christin Bette, Matthias Ludwig, Johannes Mutter, Johanna Baehr, Alexander Hepp, Horst A. Gieser, Nicola Kovac, Tobias Zweifel, Martin Rasche, Oliver Kellermann |
| 2022 | WACV | Automated Defect Inspection in Reverse Engineering of Integrated Circuits. | Ann-Christin Bette, Patrick Brus, Gbor Balzs, Matthias Ludwig, Alois C. Knoll |