| 2009 | SNPD | A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System. | Lftikhar Khan, Taikyeong T. Jeong, Gyung-Leen Park, Anthony P. Ambler |
| 2006 | ICCSA | Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System. | Taikyeong T. Jeong, Anthony P. Ambler |
| 2006 | ITC | Behavioral Test Economics. | Scott Davidson, Anthony P. Ambler, Helen Davidson |
| 2002 | ITC | Is It Rocket Science? | Anthony P. Ambler |
| 2002 | ITC | System Manufacturing Test Cost Model. | David Williams, Anthony P. Ambler |
| 2001 | DATE | From DFT to systems test - a model based cost optimization tool. | Michael G. Wahl, Anthony P. Ambler, Christoph Maa, Mohammed Rahman |
| 1995 | ITC | Cost-Effective System-Level Test Strategies. | Des Farren, Anthony P. Ambler |
| 1994 | ITC | System Test Cost Modelling Based on Event Rate Analysis. | Des Farren, Anthony P. Ambler |
| 1993 | ICCD | Economics in Design and Test. | Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick |
| 1993 | ITC | Algorithms for Cost Optimised Test Strategy Selection. | Chryssa Dislis, J. H. Dick, Anthony P. Ambler |
| 1993 | ITC | Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. | Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler |
| 1992 | ITC | A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. | Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler |
| 1989 | ITC | Cost Analysis of Test Method Environments. | Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler |
| 1988 | ICCD | Estimation of area and performance overheads for testable VLSI circuits. | J. R. Miles, Anthony P. Ambler, K. A. E. Totton |
| 1986 | ITC | Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. | Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear |
| 1984 | DAC | Ultimate: A hardware logic simulation engine. | M. E. Glazier, Anthony P. Ambler |
| 1984 | ITC | An Analysis of the Economics of Self Test. | Prab Varma, Anthony P. Ambler, Keith Baker |