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Arkan Abdulrahman

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2009–2009

Best venue rank

National

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2009VTSScalable Compact Test Pattern Generation for Path Delay Faults Based on Functions.Edward Flanigan, Spyros Tragoudas, Arkan Abdulrahman