Arun Radhakrishnan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2005–2006
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | ITC | Modeling and Testing Process Variation in Nanometer CMOS. | Mehrdad Nourani, Arun Radhakrishnan |
| 2005 | ITC | Power-supply noise in SoCs: ATPG, estimation and control. | Mehrdad Nourani, Arun Radhakrishnan |