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Aswin Sreedhar

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

10

Venues

3

Active years

2007–2011

Best venue rank

A

Where they publish

Papers

10 indexed papers, newest first.

Year	Venue	Title	Authors
2011	DATE	Modeling manufacturing process variation for design and test.	Sandip Kundu, Aswin Sreedhar
2011	DATE	On design of test structures for lithographic process corner identification.	Aswin Sreedhar, Sandip Kundu
2011	DATE	Physically unclonable functions for embeded security based on lithographic variation.	Aswin Sreedhar, Sandip Kundu
2009	DATE	On linewidth-based yield analysis for nanometer lithography.	Aswin Sreedhar, Sandip Kundu
2009	ICCD	Optical lithography simulation using wavelet transform.	Rance Rodrigues, Aswin Sreedhar, Sandip Kundu
2009	ICCD	Statistical timing analysis based on simulation of lithographic process.	Aswin Sreedhar, Sandip Kundu
2008	DATE	On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits.	Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu
2008	ICCD	Modeling and analysis of non-rectangular transistors caused by lithographic distortions.	Aswin Sreedhar, Sandip Kundu
2008	ITC	Statistical Yield Modeling for Sub-wavelength Lithography.	Aswin Sreedhar, Sandip Kundu
2007	ICCD	On modeling impact of sub-wavelength lithography on transistors.	Aswin Sreedhar, Sandip Kundu