Baruch Schnarch
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2005–2005
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2005 | ITC | Drive only at speed functional testing; one of the techniques Intel is using to control test costs. | Mike Tripp, Silvio Picano, Baruch Schnarch |