Beau R. Wilson Jr.
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
1
Active years
1981–1984
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1984 | ITC | Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). | Beau R. Wilson Jr., Eugene R. Hnatek |
| 1982 | ITC | An Evaluation of the 2816 EEPROM. | Eugene R. Hnatek, Beau R. Wilson Jr. |
| 1981 | ITC | A Method for Testing Subnanosecond ECL. | Beau R. Wilson Jr. |