Ben Kaczer
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
10
Venues
5
Active years
2008–2024
Best venue rank
A
Where they publish
Papers
10 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2024 | ETS | Silent Data Corruption: Test or Reliability Problem? | Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen |
| 2024 | ICANN | Reducing Reservoir Dimensionality with Phase Space Construction for Simplified Hardware Implementation. | Yuanyang Guo, Robin Degraeve, Philippe Roussel, Ben Kaczer, Erik Bury, Ingrid Verbauwhede |
| 2016 | DATE | Analysis of NBTI effects on high frequency digital circuits. | Ahmet Unutulmaz, Domenik Helms, Reef Eilers, Malte Metzdorf, Ben Kaczer, Wolfgang Nebel |
| 2015 | ISCAS | Characterization and modeling of reliability issues in nanoscale devices. | Gerhard Rzepa, Wolfgang Goes, Ben Kaczer, Tibor Grasser |
| 2014 | DATE | Bias Temperature Instability analysis of FinFET based SRAM cells. | Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor |
| 2014 | DSD | NBTI Aging on 32-Bit Adders in the Downscaling Planar FET Technology Nodes. | Halil Kukner, Pieter Weckx, Sebastien Morrison, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken |
| 2012 | DSD | Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model. | Halil Kukner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken |
| 2011 | ISCAS | Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling. | Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jrme Mitard, Liesbeth Witters, Thomas Y. Hoffmann |
| 2010 | ISCAS | Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits. | Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer |
| 2008 | DATE | Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. | Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martn-Martnez, Ben Kaczer, Guido Groeseneken, Rosana Rodrguez, Montserrat Nafra |