Bill Van Dick
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2008–2008
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | ITC | Solving In-Circuit Defect Coverage Holes with a Novel Boundary Scan Application. | Dave F. Dubberke, James J. Grealish, Bill Van Dick |