Bong-Hee Park
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1990–1991
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1991 | ITC | Robustly Scan-Testable CMOS Sequential Circuits. | Bong-Hee Park, Premachandran R. Menon |
| 1990 | ITC | Design of scan-testable CMOS sequential circuits. | Bong-Hee Park, Premachandran R. Menon |