C. C. Beh
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1982–1984
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1984 | ITC | Improve Yield and Quality Through Testability Analysis of VLSI Circuits. | David M. Wu, Charles E. Radke, C. C. Beh |
| 1982 | ITC | Do Stuck Fault Models Reflect Manufacturing Defects? | C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku |