Cameron Dryden
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2005–2005
Best venue rank
National
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2005 | VTS | Survey of Design and Process Failure Modes for High-Speed SerDes in Nanometer CMOS. | Cameron Dryden |
| 2005 | VTS | An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling. | Dongwoo Hong, Cameron Dryden, Gordon Saksena |