Charles E. Radke
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
2
Active years
1969–1991
Best venue rank
A*
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1991 | DAC | Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. | David M. Wu, Charles E. Radke |
| 1986 | ITC | Performance Assurance of Memories Embedded in VLSI Chips. | E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke |
| 1986 | ITC | Statistical AC Test Coverage. | David M. Wu, Charles E. Radke, J. Paul Roth |
| 1984 | ITC | Improve Yield and Quality Through Testability Analysis of VLSI Circuits. | David M. Wu, Charles E. Radke, C. C. Beh |
| 1983 | DAC | Quality level and fault coverage for multichip modules. | E. Kofi Vida-Torku, Charles E. Radke |
| 1982 | ITC | Do Stuck Fault Models Reflect Manufacturing Defects? | C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku |
| 1969 | DAC | A justification of, and an improvement on, a useful rule for predicting circuit-to-pin ratios. | Charles E. Radke |