Chi W. Yau
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
1
Active years
1986–1992
Best venue rank
A
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1992 | ITC | A Framework for Boundary-Scan Based System Test Diagnosis. | Najmi T. Jarwala, Paul Stiling, Enn Tammaru, Chi W. Yau |
| 1991 | ITC | Achieving Board-Level BIST Using the Boundary-Scan Master. | Najmi T. Jarwala, Chi W. Yau |
| 1990 | ITC | The boundary-scan master: target applications and functional requirements. | Chi W. Yau, Najmi T. Jarwala |
| 1989 | ITC | An Optimal Test Sequence for the JTAG/IEEE P1149.1 Test Access Port Controller. | Anton T. Dahbura, M. mit Uyar, Chi W. Yau |
| 1989 | ITC | A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects. | Najmi T. Jarwala, Chi W. Yau |
| 1989 | ITC | A Unified Theory for Designing Optimal Test Generation and Diagnosis Algorithms for Board Interconnects. | Najmi T. Jarwala, Chi W. Yau |
| 1988 | ITC | Trouble-Shooting: A Key to Process Improvement. | Chi W. Yau, Song-Lin Chang, Bruce F. Jordan, Joe J. Schwermann, Joan A. Wellman |
| 1986 | ITC | Concurrent Test Generation Using AI Techniques. | Chi W. Yau |