Chin-Jung Lee
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2026–2026
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | ETS | Design-for-Testability and Built-In Self-Test Techniques for SRAM-Based Compute-In-Memory Systems. | Shyue-Kung Lu, Chin-Jung Lee |