Chris Nappi
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2001–2015
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2015 | ITC | Developing a modern platform for test engineering - Introducing the origen semiconductor developer's kit. | Stephen McGinty, Daniel Hadad, Chris Nappi, Brian Caquelin |
| 2001 | ITC | Scan vs. functional testing - a comparative effectiveness study on Motorola's MMC2107 | Ken Tumin, Carmen Vargas, Ross Patterson, Chris Nappi |